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The top documents tagged [number of scan chains]
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number of scan chains
BIST vs. ATPG. Introduction ATPG – Automatic Test Pattern Generation BIST – Built-In Self Test.
333 views
SoC TAM Design to Minimize Test Application Time Advisor Dr. Vishwani D. Agrawal Committee Members Dr. Victor P. Nelson, Dr. Adit D. Singh Apr 9, 2015.
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ATPG Methodology Flow
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