×
+ All Categories
Log in
English
Français
Español
Deutsch
The top documents tagged [scan shift]
Home >
scan shift
Copyright 2001, Agrawal & BushnellLecture 12: DFT and Scan1 VLSI Testing Lecture 10: DFT and Scan n Definitions n Ad-hoc methods n Scan design Design.
251 views
Dec 21, 2007DfT@IITK1 Design for Testability Virendra Singh Indian Institute of Science Bangalore virendra@ {computer, ieee}.org IEP on Digital System.
217 views
1 Lecture 23 Design for Testability (DFT): Full-Scan n Definition n Ad-hoc methods n Scan design Design rules Scan register Scan flip-flops Scan test sequences.
230 views
Priyadharshini Shanmugasundaram
[email protected]
Vishwani D. Agrawal
[email protected]
DYNAMIC SCAN CLOCK CONTROL FOR TEST TIME REDUCTION MAINTAINING.
217 views
Spring 08, Apr 15 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Design for Testability (DFT): Scan Vishwani D.
218 views
PRAVEEN VENKATARAMANI
[email protected]
VISHWANI D. AGRAWAL
[email protected]
Auburn University, Dept. of ECE Auburn, AL 36849, USA 26 th International.
217 views
VLSI Testing Lecture 10: DFT and Scan
74 views
Reducing Test Time of Power Constrained Test by Optimal Selection of Supply Voltage
25 views
Finding Best Voltage and Frequency to Shorten Power Constrained Test Time
24 views
Priyadharshini Shanmugasundaram
[email protected]
Vishwani D. Agrawal
[email protected]
56 views