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The top documents tagged [sematech slide]
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sematech slide
Metrology Roadmap 2000 Update EuropeAlec Reader (Philips) Wilfried Vandervorst (IMEC) Rudolf Laubmeier (Infineon) Rudolf Laubmeier (Infineon) JapanFumio.
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Metrology Roadmap 2001 Update EuropeAlain Deleporte (ST) Ulrich Mantz (Infineon) Vincent Vachellerie (ST) Vincent Vachellerie (ST)JapanKorea Taiwan Henry.
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International Technology Roadmap for Semiconductors Metrology Roadmap 2001 Update EuropeAlain Deleporte (ST)4/01 Alec Reader (Philips Analytical) Vincent.
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24 July 2002 Work In Progress – Not for Publication Metrology Roadmap 2002 Update EuropeUlrich Mantz (Infineon) Alec Reader (Philips Analytical) Mauro.
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Moores Law Dynamics of a Technological Revolution Thomas J. Misa Charles Babbage Institute .
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Electrical Characterization and Reliability Group Evaluation of Charge Trapping Measurements and Their Application to High- Gate Stack Evaluation IEEE.
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AMD Decision to Locate in Luther Forest Technology Park Quarterly Management Meeting September 13, 2006.
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CANDE Panel on EDA R&D Rajesh Gupta UC San Diego.
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Hybrid Pipeline Structure for Self-Organizing Learning Array Yinyin Liu 1, Ding Mingwei 2, Janusz A. Starzyk 1, 1 School of Electrical Engineering & Computer.
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AVS 2002 Nov 3 - Nov 8, 2002 Denver, Colorado INTEGRATED MODELING OF ETCHING, CLEANING AND BARRIER COATING PVD FOR POROUS AND CONVENTIONAL SIO 2 IN FLUOROCARBON.
215 views
NUMERICAL TECHNOLOGIES, INC. Sub-wavelength Lithography: An Impact of Photo Mask Errors on Circuit Performance L. Karklin, S. Mazor, D.Joshi 1, A. Balasinski.
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