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The top documents tagged [vlsi test symposium]
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vlsi test symposium
Design and Implementation of Repair-aware Test Flow for Multi-Memory
285 views
Robust Low Power VLSI ECE 7502 S2015 Memory Built-in-Self Test (MBIST): Analysis of Resistive-Bridging Defects in SRAM Core-Cells: a Comparative Study.
215 views
Robust Low Power VLSI ECE 7502 S2015 SmartScan - Hierarchical Test Compression for Pin-limited Low Power Designs ECE 7502 Class Discussion Arijit Banerjee.
217 views
High-Level Test Generation
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