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Using Signals in TestDescription & Capability

and a TestResults Example

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Signal Capture

Generating 1641 Signals from a Product Acceptance Specification (PAS)

Translation from the PAS to 1641 signals is reasonably straightforward

– This is because PAS is written in terms of UUT– Extraction is a manual process

E.g.:

‘Monitor SK2-F with respect to 0V at SK2-s and verify that the voltage is +5.0V +/-0.2V’

Translates into:

PAS

1641 Signals

<TwoWire name="TW1" hi="SK2_F" lo="SK2_s" /> <Instantaneous name="Inst1" In="TW1" type="Voltage" samples="1" nominal="5.0V" LL="4.8V" UL="5.2V" />

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In older ATPs, this is often all that is available.

Code, style & structure may be unfamiliar

Contain ATE specific information.

Extracting any large amounts of information manually is very laborious and, thus, prone to error.

Irregular structure and ATE specifics mean that automatic extraction of signals is not possible

– Without standardised extraction, the test program is being virtually re-written and must go through acceptance.

Signal Capture

Generating 1641 Signals from Existing Source Code

Test Program

1641 Signals

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Test Description

<?xml version="1.0" encoding="UTF-8" ?> <!-- edited with XMLSPY v2004 rel. 4 U (http://www.xmlspy.com) by Racal  --> <TestDescription xmlns="http://www.atml.org/DRAFT/TestDescription" xmlns:c="http://www.atml.org/CANDIDATE/Common" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"

xsi:schemaLocation="http://www.atml.org/DRAFT/TestDescription Draft_3_TD.DiagTestDescription.xsd"> <DetailedTestInformation> <Diag_Test_Description> <TestGroup name="3.2.2.1"> <Precondition> <!-- The one that says turn it on and remove it after when it goes out of scope   --> <!-- PowerOn 45.5V hi BatteryPos lo BatteryNeg  --> <Signal Out="TW1" xmlns="STDBSC" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="STDBSC STDBSC.xsd">  <PSU name="PSU5" ampl="45.5V errlmt ±0.5V" current_limit="550mA errlmt ±30mA" xmlns="TSFLEUATP" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"

xsi:schemaLocation="TSFLEUATP TSFLEUATP.xsd" />   <TwoWire name="TW1" In="PSU5" hi="BatteryPos" lo="BatteryNeg" />   </Signal>  </Precondition> <Test name="test1"> <!-- Test1 measure 5V+-200mV hi SK2_F lo SK2_s  --> <Output> <Response> <Value> <Signal Out="Inst1" xmlns="STDBSC" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="STDBSC STDBSC.xsd">  <TwoWire name="TW1" hi="SK2_F" lo="SK2_s" />   <TimedEvent name="TE1" delay="1s" repetition="1" />   <Instantaneous name="Inst1" In="TW1" Gate="TE1" type="Voltage" samples="1" nominal="5.0V" LL="4.8V" UL="5.2V" />   </Signal>  </Value>  </Response>  </Output> <Limits> <LimtsPair> <Limit xsi:type="std:Voltage" value="4.8" units="V" />   <Limit xsi:type="std:Voltage" value="5.2" units="V" />   <Nominal xsi:type="std:Voltage" value="5.0" units="V" />   </LimtsPair>  </Limits>  </Test> . . .

<Signal Out="TW1" - - - > <PSU name="PSU5" ampl=“23.5V errlmt ±0.5V" current_limit="550mA errlmt ±30mA" - - - />   <TwoWire name="TW1" In="PSU5" hi="BatteryPos" lo="BatteryNeg" /> </Signal>

<Test name="test1">

<Precondition>

<Signal Out="Inst1" - - - > <TwoWire name="TW1" hi="SK2_F" lo="SK2_s" />   <TimedEvent name="TE1" delay="1s" repetition="1" />   <Instantaneous name="Inst1" In="TW1" Gate="TE1" type="Voltage" samples="1" nominal="5.0V" LL="4.8V" UL="5.2V" /></Signal>

<Test name="test2">

< Signal … . .

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Test Program

' Create EU Power Supply SignalSet psu = ate.Require("PSU")psu.Name = "PSU1"psu.ampl = "23.5 errlmt ±0.5V"psu.current_limit = "550mA"

Set tw = ate.Require("TwoWire")tw.Name = "TW1"tw.In = "PSU1"tw.hi = "BatteryPos"tw.lo = "BatterNeg"

psu.Out.Run

' Create MeasuremntSet monitor = ate.Require("<Signal name='T030-0060' Out='Inst1' - - - >" & _ "<TwoWire name='TW1' hi='SK2_F' lo='SK2_s'/>" & _ "<TimedEvent name='TE1' delay='1s' repetition='1'/>" & _ "<Instantaneous name='Inst1' In='TW1' Gate='TE1' type='Voltage' samples='1' nominal='5.0V' LL='4.8V' UL='5.2V'/>" & _ "</Signal>")

monitor.Out.Run 5000monitor.Out.StopSet monitor = Nothing

.NET (e.g. TestBase)

TestStand

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Capability

<Resource name="Racal4152A" uuid="{C37301A3-C41C-4025-9FC2-1F7237859D16}"> <interface> <xs:schema xmlns:xs="http://www.w3.org/2001/XMLSchema" elementFormDefault="qualified"> <xs:element name="Racal4152A"> <xs:annotation> <xs:documentation> The resource description of a Racal4152A DMM and associated connection to the UUT. </xs:documentation> </xs:annotation> <xs:complexType> <xs:complexContent> <xs:extension base="SignalFunctionType"> <xs:attribute name="uut_pin_hi" type="xs:string"/> <xs:attribute name="uut_pin_lo" type="xs:string"/> </xs:extension> </xs:complexContent> </xs:complexType> </xs:element> </xs:schema> </interface> <model> <Signal Out="Racal4152A" … > <TwoWire name="TW1" hi="uut_pin_hi" lo="uut_pin_lo"/> <OneOf> <Instantaneous name="Racal4152A" type="Voltage" nominal="range-300Vto300V errlmt±0.0019%" UL="300V"/> <Instantaneous name="Racal4152A" type="Current" nominal="range-3Ato3A errlmt±0.015%"/> <Instantaneous name="Racal4152A" type="Voltage" nominal="range0to100MR errlmt±0.0025%"/> </OneOf> </Signal> </model></Resource>

<Resource name="Racal4152A" uuid="{C37301A3-C41C-4025-9FC2-1F7237859D16}">

<Interface>

: <xs:attribute name="uut_pin_hi" type="xs:string"/> <xs:attribute name="uut_pin_lo" type="xs:string"/>

:

<model> <Signal Out="Racal4152A" … > <TwoWire name="TW1" hi="uut_pin_hi" lo="uut_pin_lo"/> <OneOf> <Instantaneous name="RI4152A" type="Voltage" nominal="range-300Vto300V errlmt±0.0019%"/> <Instantaneous name="RI4152A" type="Current" nominal="range-3Ato3A errlmt±0.015%"/> <Instantaneous name="RI4152A" type=“Resistance" nominal="range0to100MR errlmt±0.0025%"/> </OneOf> </Signal></model>

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Architecture

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Test SignalTest Signal

Run-Time System

Sig

nal In

terface (RA

I?)

Test Requirement

TestProgram

Sinusoid

amplitude = 1Vfrequency = 1kHz

phase = 0

Exponential

dampingFactor = 1000.0

In

Clock

clockRate = 100Hz

Sync

ProbabilityBasedEvent

prob = 50%

Gate

In

Out

Sinusoid

amplitude = 1Vfrequency = 1kHz

phase = 0

Exponential

dampingFactor = 1000.0

In

Clock

clockRate = 100Hz

Sync

ProbabilityBasedEvent

prob = 50%

Gate

In

Out

ATE

TestResults Logger

UUT

Native Driver

Native Driver

Sw

itch

RFSynth

Signal Interface

Sinusoid

amplitude = 1Vfrequency = 1kHz

phase = 0

Exponential

dampingFactor = 1000.0

In

Clock

clockRate = 100Hz

Sync

ProbabilityBasedEvent

prob = 50%

Gate

In

Out

Native Driver DMM

General Architecture Using a Signal Interface

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TestResultsSample

====================   PROGRAM NUMBER    M75375-000-01    ISSUE 2MY TEST PROGRAMMEUUT SERIAL NUMBER :-  DATE :- 2005-03-16T12:24:28OPERATOR NAME :- MCORNISH====================

====================   TEST PASSHIGH SOURCETEST T020-0030HL = 5.200000MV = 5.057660LL = 4.800000====================   TEST PASSHIGH SOURCETEST T020-0040HL = 15.100000MV = 15.001900LL = 14.500000

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Results Data Vs. Modelled Data

No significant differences found between the native and 1641 r.f. test results (Aeroflex)

-70

-60

-50

-40

-30

-20

-10

0

10

20

Frequency

dBm

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Synthetic Instruments

0.0

0.00574553

0.0225363

0.0490603

0.0832186

0.122247

0.162886

0.20157

0.234652

0.258628

0.27036

0.267287

0.247606

0.210415

0.155813

0.0849475

-1.51036e-007

-0.0958763

-0.19868

-0.303734

-0.405897

-0.499816

-0.580187

-0.642036

-0.680986

-0.693509

-0.677141

-0.630658

-0.554193

-0.449294

-0.318911

-0.167325

5.74574e-007

0.176622

0.355376

0.528675

0.688844

0.828459

0.940695

1.01966

1.06066

1.0605

1.01764

0.932295

0.806531

0.644192

0.45079

0.233323

-1.18625e-006

-0.240079

-0.477285

-0.701867

-0.904362

-1.07601

-1.20912

-1.29746

-1.33651

-1.32369

-1.25852

-1.14267

-0.979921

-0.776031

-0.538544

-0.276483

1.85936e-006

0.280037

0.552474

0.806355

1.03136

1.21823

1.35919

1.44827

1.48153

1.4573

1.37621

1.2412

1.05739

0.831908

0.573581

0.292576

-2.44381e-006

-0.292581

-0.573582

-0.831913

-1.05739

-1.2412

-1.37621

-1.4573

-1.48153

-1.44827

-1.35919

-1.21823

-1.03135

-0.806354

-0.162885

-0.122247

-0.0832179

-0.0490596

-0.55247

-0.280033

2.78904e-006

0.276485

0.538547

0.776035

0.979923

1.14267

1.25852

1.32369

1.33651

1.29746

1.20912

1.076

0.904361

0.701864

0.477282

0.240075

-1.61061e-006

-0.233327

-0.450794

-0.644193

-0.806534

-0.932297

-1.01764

-1.0605

-1.06066

-1.01965

-0.940694

-0.828458

-0.688842

-0.528674

-0.355374

-0.17662

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Comparison of Effort

Typical Effort to Generate Parametric Tests in the Power/Frequency Domain (Aeroflex)

Port IVI Test to 1641 (TestStand)

1 month

1 week

time

Generate Native Test from General Documentation

Port Native Test to IVI (TestStand)

(given the presence of the 1641 elements)

1 Day

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Where We’re Up To

IEEE Std. 1641-2004 Signal & Test Definition– Signal-based test definition standard.– Requirement of MoD ATS Procurement Policy.– Utilised in areas of IEEE P1671 ATML.

IEEE 1641 implementation studies:– Phase 1 - Analogue signals/3 test platforms - Racal

Instruments.– Phase 2 - Complex RF and a Synthetic Test Platform –

Aeroflex.– Phase 3 - Digital signals/ test platforms - under

negotiation.– Phase 4 – Parallel development; comparison of

traditional vs. 1641.

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Conclusions

IEEE Std. 1641 has been shown to be capable of defining:– Portable analogue signals,– Typical RF parametric tests.

Significant effort required to extract the information required to define a 1641 (platform independent) test, from an existing, non-standard or proprietary, test architecture.

Though not a unique approach, 1641 represents a departure from many existing test methodologies.

– Training would address many issues.

No significant differences observed (existing vs. 1641) for:– Test results.– Speed of execution.