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1
Organization of hydrogen energy technologies Organization of hydrogen energy technologies
trainingtraining
No. ESF/2004/2.5.0-K01-045No. ESF/2004/2.5.0-K01-045
Main organization - Lithuanian Energy Institute
Partner - Vytautas Magnus University
Ramunė Kazlauskaitė
2
Report on surface profilometry measurements technique and analysis of
the experimental results
2005.2005.1010..0303 - 2005. - 2005.1010..2323Training at Poitiers UniversityTraining at Poitiers University Metallurgic Physics LaboratoryMetallurgic Physics Laboratory
FranceFrance
3
Grinding with machine
Polishing with machine and
by hand
Surface profile
measurements
The purposeThe purposess of this work: of this work:
1. Specimens preparation:
• Grinding;
• Polishing;
2. Surface profile measurements:
• Used The Dektak IIA profilometer.
4
Such films are not useful for further analysis because:
• its are scratching;
• have some defects;
• its are crumbled.
Fig.1 The surface of thin film
5
For specimen preparation we used grinding and polishing machine, called RotoForce-1 on RotoPol-11 (Fig.2).
The main RotoForce-1 components:A – control keys and display(5-50N in 5N steps);B – lupo drip lubricator; C – release handle; D – support column; E – pressure feet; F – fastening screws and support hole.
Fig. 2 The scheme of RotoForce-1 on RotoPol-11
6
Fig.3 Silicon carbide waterproof abrasive papers
Silicon carbide papers features:
• silicon carbide abrasive;
• exellent grain adhesion;
• waterproof papers backing;
• strength and resistance to deterioration when used wet;
• ideal for finish sanding
• exellent for machine and hand rubbing;
• the grit size represents the number of holes per linear inch in a sieve screen.
7
Resultants of grinding process:
Figures 4. The specimens after different grinding steps
A
D
B
C
Alloy600 specimens after different grinding step:
A - grit size P600, F=10N, t=10min;
B - grit size P800, F=10N, t=10min;
C - grit size P1200, F=10N, t=10min;
C – grit size P1200, F=10N, t=15min;
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Figure 5. Black key felt disk
Felt disk features:
• They are die cut from the finest grade of felt, woven from 100% wool.
• Felt discs have magnobase - magnetic disc, self adhesive for attachment to polishing platens (magnoplate) for use with our polishing specimens.
After grinding with silicon carbide disk we begin to polish with felt disks and diamond polishing abrasives .
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Products features:
• Diamonds products fasters way to obtain a perfect surface due to the polycrystalline properties;
• Non-setting stable suspensions with thixiotropric characteristics are ideally suited for automated systems;
• DP products are environmentally safe;
•All suspensions are non-toxic, non-combustible and water-based.
Figure 6. Implements for polishing
Implements for polishing:• DP-Lubricant red (lubricating liquid for diamond polishing);• Diamond polishing abrasives, grain size 6, 3, 1 micron;
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Resultants of polishing process:A Alloy600 specimens
after different polishing steps:A - grain size 6 µm, F=5N, t=5min;B - grain size 3 µm, F=5N, t=10min;C - grain size 1 µm, by hand F~5N, t=10min; C – grain size 1 µm, by hand F~5N, t=15 min;Figures 7. The specimens after polishing steps
C D
B
11
Surface profilometry measurementsThe Dektak IIA profilometer is an instrument for measuring:
• the thickness of thin films (from 20nm to 65000 nm);
• the vertical surface profile of a sample (from 50 microns to 30mm);
The Dektak decompounds of two parts: the Dektak itself, and the computer to its left that is used to control the machine.
Figures 8. The Dektak IIA profilometer
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Fig. 9 The scheme of the Dektak IIA profilometer
Rotory stage
Focusing knob
Camera
The illuminator
Slylus
Fig. 9 The scheme of the Dektak IIA profilometer
13Fig 11.Surface profile measurement
Fig 10. Tracking forse and linearity
• Tracking force and linearity are closely connected. The linearity determines the tension with which the stylus is held.
•Dektak IIA works by gently dragging a mechanical diamond tipped stylus across a surface.
•Vertical movements of the stylus are sensed to computer, digitalized, and stored in the instruments memory.
14
Surface profile after grinding with grit size P600 silicon carbid paper
-500
0
500
1000
1500
2000
2500
0
112.
2
228.
4
344.
6
460.
9
577.
1
693.
3
809.
6
925.
8
1042
1158
.3
1274
.5
1390
.7
1507
1623
.2
1739
.4
1855
.7
1971
.9
Scan length [micron]
Ro
ug
hn
ess
[An
gst
rom
]
Surface profile
Ra=330-430 Å
15
Surface profile after grinding with grit size P800 silicon carbid paper
-1000
0
1000
2000
0
120.
2
240.
4
360.
7
480.
9
601.
2
721.
4
841.
6
961.
9
1082
.1
1202
.4
1322
.6
1442
.8
1563
.1
1683
.3
1803
.6
1923
.8
Scan lenght [micton]
Rou
ghne
ss
[ang
stro
m]
Surface profile
Ra=250-330 Å
16
Surface profile after grinding size P1200 silicon carbid paper
-1000
-500
0
500
1000
0
120.
2
240.
4
360.
7
480.
9
601.
2
721.
4
841.
6
961.
9
1082
.1
1202
.4
1322
.6
1442
.8
1563
.1
1683
.3
1803
.6
1923
.8
Scan lenght [micron]
Rau
gh
nes
s [A
ng
stro
m]
Surface profile
Ra=180-250 Å
17
Surface profile after polishing with grain size 6 micron
-400-300-200-100
0100200300400500600700800900
100011001200
0
11
2.2
22
4.4
33
6.6
44
8.8
56
1.1
67
3.3
78
5.5
89
7.7
10
10
11
22
.2
12
34
.4
13
46
.6
14
58
.9
15
71
.1
16
83
.3
17
95
.5
19
07
.8
Scan lenght [micron]
Ro
ug
hn
es
s[A
ng
str
om
]]
Surface profile
Ra=130-180 Å
18
Surface profile after polishing with grain size 3 micron
-1000-800-600-400-200
0200400600800
100012001400160018002000
335
435
535.1
635.1
735.2
835.3
935.3
1035.4
1135.4
1235.5
1335.6
1435.6
1535.7
1635.7
1735.8
1835.9
1935.9
Scan lenght [micron]
Ro
ug
hn
ess [
An
gstr
om
]
Surface profile
Ra=90-130 Å
19
Surface profile after polishing with grain size 1 micron
-600-500-400-300-200-100
0100200300400500
0
110.
5
221.
1
331.
6
442.
2
552.
7
663.
3
773.
8
884.
4
994.
9
1105
.5
1216
1326
.6
1437
.1
1547
.7
1658
.2
1768
.8
1879
.3
Scan lenght [micron]
Rou
ghne
ss[A
ngst
rom
]
Ra=50-90 Å
20
Ra dependence on grinding and polishing steps
04080
120160200240280320360400
Abrasives grit size
Ra
[ang
stro
m]
Ra dependence ongrinding and polishingsteps
21
Conclusions:
• In this work I polished substrate of Alloy 600 with grinding and polishing machine and saw that it is impossible to get more than 50Å roughness quality surface with it.
• I got structure of Alloy 600 and saw that there are homogenous grains over all surface.
• Surface profilometry measurements show, that surface roughness depend on abrasives grain sizes: it variable from 430Å to 180Å during grinding and from 180Å to 50Å during polishing.