Active and Passive Elec. Comp., 1993, Vol. 16, pp. 65-68Reprints available directly from the publisherPhotocopying permitted by license only
1993 Gordon and Breach Science Publishers S.A.Printed in Malaysia
SOME NEW RESULTS ON VIBRATIONALPROPERTIES OF AMORPHOUS GROUP IV
SEMICONDUCTORS
M. A. GRADO CAFFAROConsultant, Madrid (SPAIN)
M. GRADO CAFFAROCSIC, Madrid (SPAIN)
(Received April 2, 1993; in final form May 5, 1993)
For neutron scattering, an interesting formula is derived from the coherent one-phonon dynamic struc-ture factor. In this derivation, phonon density of states is involved; this density is related to spectradue to structural disorder, which is investigated. Our considerations refer to amorphous Group IVsemiconductors.
1. INTRODUCTION
Inelastic neutron scattering has been employed extensively in order to analyzevibrational spectra of a large number of amorphous semiconductors. In the fol-lowing, we shall study one-phonon dynamic structure factor and phonon densityof states. Calculations related to this density are relevant in the context of inelasticneutron scattering for amorphous Ge and Si.We shall consider a density of states corresponding to the inelastic scattering
spectrum of a one-component amorphous quasi-harmonic solid. On the other hand,we can claim that reliable measurements of phonon density of states for Group IVsemiconductors were performed by various workers [1, 2].
2. THEORY
Following Alben [3], the coherent one-phonon dynamic structure factor for a modelstructure is given by [4]"
S(, E)= (h/mto)(v + ) { . [fi., exp(i.,)] (E- En)
exp( 2W) (i V’-L--i) (1)
where rn is the mass, which is the same for all sites; h is the modified Planckconstant; to is the angular frequency; v is the vibrational quantum number; q is
65
66 M.A. G. CAFFARO AND M. G. CAFFARO
transferred momentum; . is the normalized eigenvector corresponding to dis-placement of the ath atom and referred to nth mode; the vectors f are the equilibriumpositions; 6 means Dirac function; E is energy; E. is the energy of the nth mode;and W is here the site-independent Debye-Waller factor.Now we introduce [3]"
where q is the modulus of .From (1) and (2) it is deduced"
N N
Is’(, E)I S’(, E) < 3 8(E E.) (3)
On the other hand, it is well-known that S’(, E) g(E) in the incoherent limitof q (large q) [3]; g(E) is the phonon density of states. Therefore we can establish:
N N
g(E) 3 6(E E.) IOnl (4)
We also can write [5]"
1 N
g(0) q2N- exp( 2W) (o On) (5)
By changing E with to in (4) (h 1 in atomic units), we have:
N
g(to)dto 3 10l (6)n,a
by taking into account [6, 7]:
(o On) do 1
where ll is the to-domain and ton is the vibrational eigenfrequency of the nth normalmode of the solid.
From (5) we obtain"
g(to) dto (q2/3) exp(-2W) (7)
N
sincen=l
I=N
AMORPHOUS GROUP IV SEMICONDUCTORS 67
Finally from expressions (6) and (7) we get:
N
Inl (q/3) exp(-2W)n,ot
(8)
Formula (8) involves vibrational eigenvectors and refers to large q. Next weshall consider structural disorder in amorphous Group IV semiconductors; in thecontext of tetrahedrally coordinated amorphous semiconductors, the first-orderinfrared spectrum due to structural disorder can be expressed as follows [8, 9, 10]:
47S )( o) o-21 ( o)12g( o) (9)
where ix(to) is the dipole-moment matrix element in the frequency domain.Now it is interesting to evaluate the important quantity fa to:)(to) dto; we
have:
N N
(see eq. (4))We get as final result (see refs. [6, 7]):
N N
to_)(to) dto 3 tofi-ll/(ton)12 I,l (11)
3. DISCUSSION
At large q, coherent processes are not relevant. In fact, eqs. (4) and (11) refer tothis situation. It is well-known that inelastic neutron scattering at fixed and largeq makes possible the direct measurement of the phonon density of states. Thisdensity can be obtained theoretically by means of eq. (5) or by using the expressiong(to) 3 EnN (to tO,) EN I ool (see eq. (4)). In addition, eq. (8) represents aresult derived from the conjunction of the previous expression and eq. (5). Equation(8) can be expressed as: (EnN, I oo1=) q x exp(-w); this expression is inter-esting from the point-of-view of mathematical physics since its left-hand side rep-resents a norm associated with a certain Hilbert space equipped with the scalarproduct (fin, qCn) E,N, (fina’/na), where the dot means usual scalar product.Moreover, we recall the physical sense of S’(?q, E); this quantity represents energyloss spectra.
Finally, we recall also the importance of eq. (11). The left-hand side of this isthe structural-disorder contribution to the sum rule fa o:2(o) dto.
APPENDIX
In fig. A1 we can compare the energy loss spectrum S’(, E) with g(E) for q17.0 A- and amorphous Ge, by using a periodic network model (see ref. [3]). In
68 M.A.G. CAFFARO AND M. G. CAFFARO
o 300 O 300
FIGURE A1 Plots of S’ and g for amorphous Ge with respect to a periodic network model.
addition, it is interesting to note the comparison between the plot of g(E) and eq.(4).
REFERENCES
1. G. Nilsson and G. Nelin, Phys. Rev. B 3 (1971), 364.2. R.J. Temkin, W. Paul, and G.A.N. Connell, Advan. Phys. 22 (1973), 531.3. R. Alben, AlP Conf. Proc. no. 20 (1974), 249-259.4. W. Marshall and S.W. Lovesey; Thermal Neutron Scattering, (Oxford, 1971).5. J.D. Axe, D.T. Keating, G.S. Cargill III, and R. Alben, AIP Conf. Proc. no. (20) (1974), 280.6. I.B. Gel’fand and G.E. Shilov; Generalized Functions, vol. 1, (Academic Press, 1964).7. I.B. Gel’fand and N. Ya. Vilenkin; Generalized Functions, vol. 4 (Academic Press, 1964).8. S.S. Mitra, D.K. Paul, and Y.E Tsay, AlP Conf. Proc. no. 20 (1974), 287.9. S.S. Mitra, Y.F. Tsay, D.K. Paul, and B. Bendow, Phys. Rev. B 15 (1977), 4007.10. M.A. Grado and M. Gtado, Phys. Lett. A 169, no. 5 (1992), 400.
International Journal of
AerospaceEngineeringHindawi Publishing Corporationhttp://www.hindawi.com Volume 2010
RoboticsJournal of
Hindawi Publishing Corporationhttp://www.hindawi.com Volume 2014
Hindawi Publishing Corporationhttp://www.hindawi.com Volume 2014
Active and Passive Electronic Components
Control Scienceand Engineering
Journal of
Hindawi Publishing Corporationhttp://www.hindawi.com Volume 2014
International Journal of
RotatingMachinery
Hindawi Publishing Corporationhttp://www.hindawi.com Volume 2014
Hindawi Publishing Corporation http://www.hindawi.com
Journal ofEngineeringVolume 2014
Submit your manuscripts athttp://www.hindawi.com
VLSI Design
Hindawi Publishing Corporationhttp://www.hindawi.com Volume 2014
Hindawi Publishing Corporationhttp://www.hindawi.com Volume 2014
Shock and Vibration
Hindawi Publishing Corporationhttp://www.hindawi.com Volume 2014
Civil EngineeringAdvances in
Acoustics and VibrationAdvances in
Hindawi Publishing Corporationhttp://www.hindawi.com Volume 2014
Hindawi Publishing Corporationhttp://www.hindawi.com Volume 2014
Electrical and Computer Engineering
Journal of
Advances inOptoElectronics
Hindawi Publishing Corporation http://www.hindawi.com
Volume 2014
The Scientific World JournalHindawi Publishing Corporation http://www.hindawi.com Volume 2014
SensorsJournal of
Hindawi Publishing Corporationhttp://www.hindawi.com Volume 2014
Modelling & Simulation in EngineeringHindawi Publishing Corporation http://www.hindawi.com Volume 2014
Hindawi Publishing Corporationhttp://www.hindawi.com Volume 2014
Chemical EngineeringInternational Journal of Antennas and
Propagation
International Journal of
Hindawi Publishing Corporationhttp://www.hindawi.com Volume 2014
Hindawi Publishing Corporationhttp://www.hindawi.com Volume 2014
Navigation and Observation
International Journal of
Hindawi Publishing Corporationhttp://www.hindawi.com Volume 2014
DistributedSensor Networks
International Journal of