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An Overview of Soft-Lithographies for Materials Patterning and Device Fabrication Will Childs, Keon Lee, Svetlana Mitrovski, Lindsay Elliott, John Rogers, and Ralph Nuzzo University of Illinois at Urbana-Champaign Frederick Seitz Materials Research Laboratory Department of Chemistry Department of Materials Science and Engineering
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Page 1: An Overview of Soft-Lithographies for Materials Patterning ...dispoptic/An_Overview_of_Soft-Lithographies_for... · BR AW BW AR High Voltage A High Voltage B 1. 100 W Hg Arc Lamp

An Overview of Soft-Lithographies for Materials Patterning and Device

Fabrication

Will Childs, Keon Lee, Svetlana Mitrovski, Lindsay Elliott, John Rogers, and Ralph Nuzzo

University of Illinois at Urbana-ChampaignFrederick Seitz Materials Research Laboratory

Department of ChemistryDepartment of Materials Science and Engineering

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http://www-306.ibm.com/chips/gallery/www.just2good.co.uk/ cpuSilicon.htm

The “Si Standard” for Materials Patterning: Photolithography

WaferWith Photoresist

Pattern Copied

Lens

Photomask

Light

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p M O S n a n o - t r a n s i s t o rp M O S n a n o - t r a n s i s t o r

Intel: 30 nm

Nanoelectronics: Materials and Manufacturing Challenges

Bell past and future(?)

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Photolithography: It always wins!

Immersion Lithography: 65 nm using 193 nm ArF(limit ~35 nm)

{Resolution ~ (Wavelength/NA); NA = n x sinθ}

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Photoresists: As Good as Organic Chemistry Gets!There are so many choices (some of my favorites).

Amplified Resists SU-8: the Monster of MEMS(many variants)

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Nanofabrication: Molecular Imprints

Step and Flash

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Soft Lithography: Materials Patterning via Physical Contact/Mass Transfer

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-[Si(CH3)2-O]-n

The Core Material of Soft Lithography

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Near Field Phase-shift Photolithography

Rogers, J. A.; Paul, K. E.; Jackman, R. J., Whitesides, G. M. Appl. Phys. Lett. 1997, 70, 2658.

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head group

carbon chainsulfur

2-3

nm

The “Au Standard” for Materials Assembly: Self-Assembled Monolayers (SAMs)

1 cm

Image of Gold Surface Patterned withHydrophobic and Hydrophilic SAMs

XX X

X

xx

xx

SSS

SS

S

S

S

STM Image of a SAM

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1 cm

Image of Gold Surface Patterned withHydrophobic and Hydrophilic SAMs

1 cm1 cm

Image of Gold Surface Patterned withHydrophobic and Hydrophilic SAMs

Self-Assembled Monolayers (SAMs): Organic Materials Surface Chemistry

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Self-Assembling Monolayers (SAMs)

Laibinis, Paul E.; Whitesides,G. M.; et al. J. Am. Chem. Soc. 1991, 113, 152.

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Self-Assembled Monolayers (SAMs): an Ink

Xia, Y.; Whitesides, G. M. Angew. Chem., Int. Ed. 1998, 37, 550. Michel, B.; Bernard, A., et al. IBM J. Res. & Dev. 2001, 45, 697.

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Soft Lithography: Masters

Patterning TechniquesE-Beam FIB (Focused Ion Beam)

Photolithography Micromachining

Holography SPM lithography

Master

Cast/MoldPDMS

Stamp

Pattern

Transparent

Low Thermal Expansion

Chemically Inert

Reusable for patterning

Best Resolution: 2-10 nm

Poly(dimethylsiloxane)

Environmentally Safe

Silanized

Rapid Prototyping

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Microcontact Printing

a-c: Silver; e: Gold; f: copper

a+b: rolling stamp

g+h: metal as etch mask for silicon

Xia, Y.; Whitesides, G. M. Ann. Rev. Mater. Sci 1998, 28, 153.

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Microcontact Printing: Patterned SAMs are Used to Define Fabrication Level in Au via Wet Etching

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Rogers, J. A. et. al. Proc. Nat. Acad. Sci. USA 2001, 98, 4835-4840.

Dodabalapur, A.et.al. Appl. Phys. Lett. 1998, 73, 142-144.

Electronic Paper

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20µm

spherical curvature

PZT Fresnel Lens Patterned using Microcontact Printing, a Soft-Lithographic Patterning Method

PDMS Stamp

Patterned OTS SAM on Quartz: Lift-off Patterning on Si and Glass

• Sol-gel Ceramics•Evaporated Metals

(poor as an etch resist)

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Microcontact Printing

a: polyurethane (PU)b: CuSO4c: Cu CVD on Sid: LiNbO3 CVDon Si/SiO2

Xia, Y.; Whitesides, G. M. Ann. Rev. Mater. Sci 1998, 28, 153.

≤ 50 nm Resolutionof Etched Gold

Michel, B.; Bernard, A., et al. IBM J. Res. & Dev. 2001, 45, 697.

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MicroMolding in Capillaries (MiMIC)

a: PU on Sib: polyanilinec: ZrO2

d; polystryene colloidse+f: free standing PU

Xia, Y.; Whitesides, G. M. Ann. Rev. Mater. Sci 1998, 28, 153.

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Jeon, N. L.; Hu, J.; Whitesides, G.M.; Erhardt, M.K.; Nuzzo, R.G. Adv. Mater. 1998, 10, 1466.

200 µm

Challenges: Registration, Resists

Ex: MOSFETs

Vd

-16 -14 -12 -10 -8 -6 -4 -2 0

Id

-0.0008

-0.0007

-0.0006

-0.0005

-0.0004

-0.0003

-0.0002

-0.0001

Vg= -4 VoltsVg= -5 VoltsVg= -6 VoltsVg= -7 Volts

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Solvent Assisted MicroMolding (SAMiM)

photoresist ona: SiO2b: polystrenec: ABS

Xia, Y.; Whitesides, G. M. Ann. Rev. Mater. Sci 1998, 28, 153.

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Duffy, D. C.; Jackman, R. J., et al. Adv. Mater. 1999, 11, 546.

Continuous MembranePattern

Add or Remove Layer

Dry Lift-Off

Spin-Cast PDMS Membrane

Jackman, et al.; Langmuir 1999, 15, 2973.

Elastic Membrane Patterning

electroluminescent materials

plasma etch resist

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Replica Molding (ReM)

PDMS master

PU mold

Xia, Y.; Whitesides, G. M. Ann. Rev. Mater. Sci 1998, 28, 153.

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Cohesive Transfer Lithography

PDMS molding

UVO treatment

Heat or UV curing (Closed)

Physical removal (Open)

• UVO bonded PDMS features can be torn from stamp• Works best for small feature sizes ( < 5 µm)• PDMS resists transferred from a non-composite stamp are thin ( < 100 nM)• Effective RIE/Liftoff resists—aSi, metals, etc.• Limit: composite stamps embedding a release level are exceptionally hard to master for feature sizes below 1 µm—segments detach from transfer pad during molding process.

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MicroTransfer Molding (µTM)

a+b: PU c+d: epoxy e+f: solgelXia, Y.; Whitesides, G. M. Ann. Rev. Mater. Sci 1998, 28, 153.

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Quake, S.R., et al. Science 2002, 298, 580.

Integrated Microfludics

Integrated Microfluidcs

Loading Separation

Mixing Purging

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BR

AW

BWAR

High Voltage A

High Voltage B

1. 100 W Hg Arc Lamp2. Aperture Stop3. Field Stop4. Dichroic Cube Assembly5. PDMS Device6. 80:20 Beam Splitter7. Tube Camera8. R-376 PMT

S-20

(R-3

76)

Olympus AX-70

1

23

4

5

67

8

Fabrication and Detection using PDMS

place desired pattern onphotoresist & irradiatewith UV light (365nm)

spin coat STR 1075photoresist on Si wafer

wash off exposed resistwith basic developer

cure PDMS elastomer onSi/photoresist master

peel off PDMS

seal with second PDMSplanar substrate

Typical dimensions from channel intersection to reservoir are (BR) 8 mm, (AR) 8 mm, (AW) 8 mm, (BW) 60 mm. Channel cross sections ~15 µm (height) x 90 µm (width).

Schematic representation of experimental setup

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30 40 50 60 70 80 90 100 110 120

-3.8

-3.6

-3.4

-3.2

Migration Time (sec)

PMT

Sign

al (A

.U.)

0.0008 0.0006 0.0004

Mobility (cm2 / V sec)

S G F

System peak

Sugar Separation in PDMS Device at pH = 12.3

System peak

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30 40 50 60 70 80 90 100 110 120

pH = 12.6

pH = 12.3

pH = 12.0

pH = 11.5

PMT

Sign

al (A

.U.)

Migration Time (sec)

0.0008 0.0006 0.0004

Mobility (cm2 / V sec)

S G F

G

S/G/F

S/G/F

SPS F

Effect of pH on Carbohydrate Separations

SP

SP

SP

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Self Referencing Chip Design-EOF Instability

• Capillary Electrophoresis Microchips– From J. Monahan thesis:

• High pH stability• Electroosmotic flow in native PDMS

channels• Retention times have poor

reproducibility• Dye/EOF marker partitioning

• Design chip geometry to account for drift due to changes in EOF, PDMS surface, pH, temp.

• Split analyte plug down two paths of differing lengths

• Recombine for detectionBuffer Waste

Analyte ReservoirAnalyte Waste

Buffer reservoir

Pat

h 1

Pat

h 2

Detection Area

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100 150 200 250 300 350

1.0 V

Time /sec

PM

T S

igna

l /V

FITC1 FITC2

FL1 FL2

-50 0 50 100 150 200Adj. Time /sec

(a) (b)

Drifting Migration Times in Split Channel

Aligned to 1st peakFL-FITC separations

4 sequential runs

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Split Channel for CE Standardization

• Split analyte plug down two paths of differing lengths

• Recombine for detection

Buffer Waste

Analyte ReservoirAnalyte Waste

Buffer reservoir

Path

1

Path

2

Detection Area

Standardizationj

obsy

obsystd

obsxj

obsx

obsxjx )()()()( 12112

"' µµµµµµ −−+−=FITC2

jobsx

obsxstd

obszj

obsz

obszjz )()()()( 12112

"' µµµµµµ −−+−=FA2

jobsx

obsxstd

obsyj

obsy

obsyjy )()()()( 12112

"' µµµµµµ −−+−=FL2

jobsy

obsystd

obsxj

obsx

obsxjx )()()()( 12112

"' µµµµµµ −−+−=FITC2 jobsy

obsystd

obsxj

obsx

obsxjx )()()()( 12112

"' µµµµµµ −−+−=FITC2

jobsx

obsxstd

obszj

obsz

obszjz )()()()( 12112

"' µµµµµµ −−+−=FA2 jobsx

obsxstd

obszj

obsz

obszjz )()()()( 12112

"' µµµµµµ −−+−=FA2

jobsx

obsxstd

obsyj

obsy

obsyjy )()()()( 12112

"' µµµµµµ −−+−=FL2 jobsx

obsxstd

obsyj

obsy

obsyjy )()()()( 12112

"' µµµµµµ −−+−=FL2

Adjusted µa

Observed µa2 Path 2

Set µa1 of Path 1 as reference

Standardize µa1of all devices

Compensate for EOF

within runs

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FITC1 FL1 FA1 FITC2 FL2 FA2 FA2Average 96.2 105.7 135.4 179.7 197.4 254.2

Migration Time STD DEV 13.8 15.6 21.9 26.7 30.2 42.4%RSD 14.4 14.8 16.1 14.9 15.3 16.7Average 2.64E-04 2.41E-04 1.88E-04 2.05E-04 1.87E-04 1.46E-04

Mobility STD DEV 1.4E-05 1.4E-05 1.4E-05 1.1E-05 1.2E-05 1.1E-05%RSD 5.3 5.8 7.4 5.7 6.4 7.5Average 2.69E-04 2.56E-04 2.14E-04 2.09E-04

Adjusted Mobility STD DEV 9.8E-07 9.8E-07 2.4E-06 1.8E-06%RSD 0.4 0.5 1.1 0.9

( )j

eofy )12( −∆µ ( )

j

eofy )12( −∆µ( )

j

eofx )12( −∆µ ( )

j

eofx )12( −∆µ

50 100 150 200

Time /sec

PMT

Sign

al /a

.u.

0.4 V

FITC1

FITC2

FL2

FA2

FA1

FL1

Summary data for 15 separations

3 component separations

FL=fluoresceinFITC=fluorescein-isothiocyanateFA=fluorescein-amine

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Monolithic Valves and Pumps

• Multilayer structures are constructed by binding layers of PDMS

• Useful for fluidic manipulation for lab-on-a-chip

Unger, M., et.al., Science 2000, 288, 113.

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3D Microfluidics

Patterns of Cells and Proteins

Whitesides, G. M., et al., Proc. Nat. Acad. Sci. USA 2000, 97, 2409.

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Laminar

Takayama, S., et al. Proc. Natl. Acad. Sci. U.S.A. 1999, 96, 5545.

Laminar Flow Patterning

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Depletion Gradients

Fosser, K. A.; Nuzzo, R. G. Anal. Chem. 2003, 75, 5779.

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Charge Patterning

Whitesides, G. M. MRS Bull. 2002, 27, 56-65.

Exposed Area

Exposed Area

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Catalytic Patterning

Michel, B.; Bernard, A., et al. IBM J. Res. & Dev. 2001, 45, 697.

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Catalytic Amplification

Harada, Y.; Girolami, G. S.; Nuzzo, R. G. Langmuir 2003, 19, 5114.

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Phase-Shift Lithography

Schmid, H., et al. J. Vac. Sci. Technol. B. 1998, 16, 3422. Michel, B.; Bernard, A., et al. IBM J. Res. & Dev. 2001, 45, 697-717.

patterned gold lines

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Microlens Patterning

Wu, M.; Whitesides, G. M.; J. Micromech. Microeng. 2002, 12, 747-758.

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NanoTransfer Printing (nTP)

Zaumseil, J., et al. Nano Lett. 2003, 3, 1223.

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Decal Transfer Lithography

Master and PDMS

UVO TreatmentOf PDMS

Heat or UV exposure

Adhesive PatternTransfer

10 µm

2 µm

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Layer-By-Layer Printing (LBL)

Park, J.; Hammond, P. T. Adv. Mater. 2004, 16, 520.

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Rogers et al., Proc. Nat. Acad. Sci. USA 2001, 98, 4837.

Flexible and Non-Planar Substrates

Whitesides, G. M., et al. Adv. Mater. 1999, 11, 7.

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Problem and Solution?

d≥20h(h/l) range is 2.0-0.2

d (.2-20 µm); h (.5-200 µm); l (0.5-200 µm)

Sylgard 184

h-PDMSMichel, B.; Bernard, A., et al. IBM J. Res. & Dev. 2001, 45, 697. Xia, Y.; Whitesides, G. M. Ann. Rev. Mater. Sci 1998, 28, 153.

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Improved Materials

Odom, T. W., et al. Langmuir 2002, 18, 5314.

Lat

eral

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Hybrid Stamps

Michel, B.; Bernard, A., et al. IBM J. Res. & Dev. 2001, 45, 697.

2 layer stamp w/ glass backing

trilayer 2 layer w/ polymer backing

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Fabrication of High Performance Ceramic Microgear

• Free-standing mm-sized gear of borosilicon carbonitride (SiBNC)

• Can withstand harsh thermal and oxidative environments

Yang, H., et.al., Adv. Mater. 2001, 13, 54.

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Metal-oxide-semiconductor field effect transistor (MOSFET)

Jeon, H., et.al., Adv. Mater. 1998, 10, 1466.

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Half-Wave Rectifier

Deng, T., et.al., Sens. and Act. 1999, 75, 60.

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Magnetic Microfiltration

• Magnetic filtration allows for removal of paramagnetic and ferri(o)magneticparticles from diamagnetic fluids

• Arrays of micron-scale nickel posts were fabricated by soft lithography and electrodepostion

• Magnetic filters integrated into microfluidic systems reduces the size of the system

Deng, T., et.al., Appl. Phys. Lett., 2002,80, 461.

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Light-emitting Diodes

• Soft contact lamination provides a means for establishing electrical contacts at room temperature in ambient conditions

• Applications: – Conformable light sources – Nanoscale optoelectronics

Lee, T., et.al.,PNAS 2004, 101, 429.

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Patterning Spherical Surfaces

• Uses in optical and sensing devices with wide fields of view (>60º)

• Limits of lithography– Depth of focus limits

topography to ±λ/2– Planar mask only comes

into contact a single point – only a small area will be in

focus

Paul, K., et.al., Adv. Funct. Mater. 2003, 13(4), 259.

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Thin-Film Transistors

• TFTs are used to address pixels in flat panel displays

• Eye focuses images on a spherically curved retina

Erhardt, M., et.al.,Chem. Mater. 2000, 12, 3306.

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Microcontact Printing DNA

S.A. Lange, V. Benes, D.P. Kern, J.K.H. Horber, A. Bernard, Anal. Chem. 2004, 76, 1641.

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Microcontact Printing Proteins

H. Wolf et al. IBM Journal of Research & Development. 2001, 45, 697.

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Affinity Contact Printing of Proteins

J.P. Renault, A. Bernard, D. Juncker, B. Michel, H.R. Bosshard, E. Delamarche, Angew. Chem. Int.Ed. 2002, 41, 2320.

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Separation of Biomolecules

Tryptic digest of FITC-BSA

S. Sia, G.M. Whitesides, Electrophoresis. 2003, 24, 3563.

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Immunoassays

A. Bernard, B. Michel, E. Delamarche, Anal. Chem. 2001, 73, 8.


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