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Biased Reflectometry (International Zurich Congress On Emc September 2007)

Date post: 22-May-2015
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A method for building up signal/power integrity models of active devices is presented in this papaper. The method is based on TDR measures taken at varying operating points of the device.
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Page 1: Biased Reflectometry (International Zurich Congress On Emc September 2007)
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