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CChapter 3 hapter 3 Atomic Emission SpectroscopyAtomic Emission Spectroscopy
3.1. Fundamentals of AES
3.2. Instrumentation
3.3. Analytical Methods of AES
3.4. Control of Analytical Interferences
3.1. Fundamentals of AES
Atomic Emission Processes
3.2. Instrumentation
1. Light source 2. Spectrometer3. Detector 4. Readout
1. Light Source
Type Eva.Temp. Exci. Temp. stability Application.
DC Arc high low poor Qualitative Analysis
AC Arc mid mid good Qualitative Analysis
Spark low highest good Quantitative Analysis
ICP highest high best Quantitative Analysis
Light Source Progresses
2. Spectrometer
⑴Monochromater Optical-direct Read Spectrometor
⑵Polychromater Optical-direct Read Spectrometor
3. Detector
⑴Spectrograph
⑵Photomultiplier Tube
⑶Segmented-array Charge-Coupled
Detector(SCD)
4. ICP-AES Instrumentation System
Two-dimensional array produced by the echelle mount
Fig 3-16 Scheme of SCD Detector
3.3 Analytical Methods of AES
1. Qualitative Analysis
⑴Standard Iron Spectra Comparison
⑵Indicate Element Spectra Comparison
⑶Determination of Line Wavelength
2. Quantitative Analysis
Quantitative Formula
⑴theoretical Formula of AES
ne
gI i
kTuululul
E
x
x
ZhvA
u
11
1
neg
vhAI ikTul
ululul
E
x
x
Z
u
11
bi can
(3.1)
(3.2)
(3.3)
⑵Lomakin Formula
Internal Standard Methods⑶
Standard Calibration Methods⑷
bACI
bx
bxb
ss
x
s
x KCCCA
A
I
IR
KCbR lglglg
(3.4)
(3.5)
(3.6)
3.4. Analytical Interferences
1. Spectrum Interference
2. Background Interference
3. Matrix Interference
1. Spectrum Interference
2. Background Interference
3. Matrix Interference
3.5 Sensitivity and Detection Limit
1. Detection limit
ss
CR
LD3
.. (3.7)