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Environmental Resistance and Reliability
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Page 1: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

Environmental Resistance and Reliability

Page 2: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Outline

� Introduction� Environment and reliability� Components

� Component radiation damage and reliability testing � lasers� fibres� connectors

� Conclusions

Page 3: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Reliability

� Probability of components surviving for the required lifetime in the given operating environment

� For our ‘unusual’ environment separate reliability issues

� effects and tests specific to CMS Tracker environment� usual known degradation mechanisms and reliability tests

� but check for influence of irradiation

Page 4: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Tracker environment

� 10 years minimum operational lifetime at� T ~ -10°C� B = 4T� exposed to high radiation field

� radiation damage the most important issue� can exclude magnetic components� -10°C within typical telecoms operating specs

Page 5: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Charged hadron fluence (/cm2 over ~10yrs)

high collision ratehigh energylarge number of tracks

cause of radiation damage

Tracker radiation environment

Page 6: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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PLL Delay

MUX2:1

Timing

APVamplifierspipelines128:1 MUX

Detector Hybridprocessingbuffering

TTCRx

ADC

Rx HybridFED

DCU

96

Front-End Back-End

DAQ12

Tx Hybrid

124

Optical link parts under test for radiation

damage

CMS Tracker optical links

Page 7: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Components under review

� Transmitter � edge-emitting 1310nm InGaAsP/InP MQW lasers

� most sensitive component...

� Fibres� SM standard telecom fibre� 1-way fibre pigtails, 12-way fibre ribbon cables, 8x12-way cables

� Connectors� 1-way (e.g. MU), multi-way (e.g. MT)

� All either COTS or based on COTS components

Page 8: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Testing during development phase

� Environmental tests � Irradiation (all components)� B-field (lasers and connectors)� also Temperature (lasers)

� Reliability (irrad+un-irrad)� Thermally accelerated ageing (lasers)� Strength (fibres, cables)� Mating cycles (connectors)

Page 9: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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γγγγ irradiationp,π,π,π,π irradiation

annealing ageing

(in-system) lab tests

(in-system) lab tests

B-field

n irradiation

Sample test overview

� e.g. lasers

Page 10: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Testing aims

� Validate candidate components � suitability for use in Tracker

� Detailed investigation of radiation effects� Measure effects for Tracker doses/fluences� Understand the damage mechanisms� Extrapolate to full experiment lifetime

� Feedback effects into definition of specs

Page 11: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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single fibreand 1.25mm connector

ferrule

1-way InGaAsP edge-emitting laserson Si-submount with ceramic lid

12-way optical ribbon and MT-connector

96-way cable

Examples of components

� tested for rad-hardness

Page 12: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Laser testing

� Radiation damage� ionization� displacement� annealing

� Accelerated ageing� B-field

Page 13: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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� in-situ data better for extrapolation

MUX + DMM

I/O register

DAC

I generator

set V

Vout

Vin

photodetector

laserundertest

Mac + Labviewoptical fibre

current

Iout

signal

DataloggerUnit

Control roomIrradiationsource

Irradiation test system

� in-situ measurement setup (lasers)

Page 14: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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1999 Market Surveyunderwater source

Co-60 gammasdose rate 2kGy/hr

Gamma irradiation at SCK-CEN

Page 15: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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� No significant effects for ionization damage� Same conclusion for all laser diodes tested

1200

1000

800

600

400

200

0

pow

er, P

(µW

)

403530252015105current, I (mA)

type Xpre-irr

A B C

100kGy A B C

� Before/after 100kGy

Gamma irradiation

� Laser L-I characteristics

Page 16: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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deute

rons

neutrons

Recent validation tests of laser diodes

~20MeV neutronsflux ~ 5x1010n/cm2/s

fluence ~ 5x1014n/cm2

Samples stackedinside cold box (-10°C)

neutrons

Neutron irradiation at UCL

Page 17: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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� ~20MeV neutrons (UCL)

� Temp -10°C

2000

1600

1200

800

400

0

pow

er, P

(µW

)

403530252015105

current, I (mA)

Type Ypre-irr post-irr

LD1-4 LD5-8 LD9-12

� Laser threshold Ithr ↑ , efficiency E ↓� effects similar (to factor ≤2) in all devices

Neutron irradiation

� Laser L-I before/after 3x1014n/cm2

Page 18: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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� ~20MeV neutrons (UCL)� Temp 20°C

� Damage always ~linear with fluence� NIEL dependence..?

50

40

30

20

10

thre

shol

d cu

rrent

(mA

)

3.02.01.00.0

irradiation time (hrs)

4.03.02.01.00.0neutron fluence (1014n/cm2)

1.0

0.9

0.8

0.7

0.6

relative effiency, E/E(0)

Type Z Ithr LD1 EffLD1 Ithr LD2 EffLD2

Damage vs fluence

� Laser threshold Ithr and efficiency E

Page 19: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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� after 4.7x1014n/cm2

� ~20MeV neutrons (UCL)� Temp 20°C

� Beneficial annealing only� recovery of damage during/after irradiation

� Same basic mechanism for Ithr and E

1.0

0.9

0.8

0.7

0.6

0.5fract

ion

rem

ainin

g da

mag

e

0.1 1 10annealing time (hrs)

Type Z I

thr LD1

Ithr

LD2 eff LD1 eff LD2

Annealing

� Laser threshold Ithr and efficiency E

Page 20: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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� Type Z� 1015n/cm2 ~0.75MeV n� Annealed at 20,40,60,80°C

� Fit data with activation energy spectrum � uniform range 0.66<Ea<1.76 eV works well

0.8

0.7

0.6

0.5

0.4

0.3unan

neal

ed fr

actio

n of

def

ects

1 10 100annealing time (hrs)

A=1e-12, Ea = 0.66 to 1.76 eV

20°C 40°C 60°C 80°C fit

Annealing vs Temperature

� Measure at different T

Page 21: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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� non-radiative recombination � defects in and around active volume reduce carrier lifetime

� (ref: SPIE 2000)

� competes with radiative recombination

undoped InGaAsP MQW structure

τstτsp

τnrdefect levels

n-type InP

p-type InP

Ev

Ec

Damage model

Page 22: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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� Relative damage factors� 0.75MeV n (=1)� ~6MeV n (=3.1)� ~20MeV n (=4.9)� 200MeV π (=11.5)� 24GeV p (=9.4)� 1MeV γ (~0)

40

30

20

10

0thre

shol

d in

crea

se, ∆

I thr (

mA

)

543210fluence, Φ (a.u.)

Valduc (0.8MeV n) SARA (~6MeV n) PSI (200MeV π) PS (24GeV p) UCL (~20MeV n)

Type Z lasersDamage normalized for 96hr irradiation

� Coverage of CMS particle energy spectrum� Similar factors for different InGaAsP/InP lasers

Damage comparison

� Laser threshold Ithr with different sources

Page 23: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

80

60

40

20

0

dam

age

(% 1

0yrs

full

lum

inos

ity)

1086420

LHC operating time (years)

LHC luminosity profile:

year 1: 10%year 2, 33%year 3, 66%

years 4-10, 100%

total damage annual components � Important damage dominated

by pions

� Type Z lasers� ∆Ithr~14mA � first 10yrs at radius=22cm

ref: Proc. SPIE 2000

Damage prediction

� Knowing damage factors and Ea spectrum � Predict damage evolution in 10yr CMS lifetime

Page 24: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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γγγγ irradiation

n irradiation

ππππ irradiation

annealing ageing

(in-system) lab tests

(in-system) lab tests

B-field

Laser test procedures (revisited)

� Focus now on in-system lab tests

Page 25: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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� Static tests� measure threshold, gain, noise, linearity,

� Dynamic tests� rise-time (bandwidth)

AWGPulse GEN.Tracking GEN.

SCOPESpectrum ANAL.I2C ADC

COMPUTERGPIB

VME

GPIB

Lab testing pre/post irrad

� In-system test-bed

Page 26: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Table 2: I2C pre-bias settings for laser A-E

LaserA B C D E

I2C-bias setting before irradiation 8 8 9 9 8I2C-bias setting after irradiation 14 15 1A 19 8 (not irrad)

−0.2 0 0.2 0.4 0.6 0.80

0.5

1

1.5

Input voltage (V)

Out

put v

olta

ge in

to 5

0 O

hms

(V)

A pre−irrad A post−irrad

−0.2 0 0.2 0.4 0.6 0.80

0.5

1

1.5

Input voltage (V)

Out

put v

olta

ge in

to 5

0 O

hms

(V)

B pre−irrad B post−irrad

−0.2 0 0.2 0.4 0.6 0.80

0.5

1

1.5

Input voltage (V)

Out

put v

olta

ge in

to 5

0 O

hms

(V)

C pre−irrad C post−irrad

−0.2 0 0.2 0.4 0.6 0.80

0.5

1

1.5

Input voltage (V)

Out

put v

olta

ge in

to 5

0 O

hms

(V)

D pre−irrad D post−irradE pre E post

Transfer characteristics

� Transfer characteristics before and after irradiation

� Need to increase in d.c. bias-point

� due to threshold increase

� gain decrease� due to efficiency loss

Page 27: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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−0.2 0 0.2 0.4 0.6 0.80

0.1

0.2

0.3

0.4

0.5

Input voltage (V)

Nor

mal

ised

RM

S−

nois

e (%

) A pre−irrad A post−irrad

−0.2 0 0.2 0.4 0.6 0.80

0.1

0.2

0.3

0.4

0.5

Input voltage (V)

Nor

mal

ised

RM

S−

nois

e (%

) B pre−irrad B post−irrad

−0.2 0 0.2 0.4 0.6 0.80

0.1

0.2

0.3

0.4

0.5

Input voltage (V)

Nor

mal

ised

RM

S−

nois

e (%

) C pre−irrad C post−irrad

−0.2 0 0.2 0.4 0.6 0.80

0.1

0.2

0.3

0.4

0.5

Input voltage (V)

Nor

mal

ised

RM

S−

nois

e (%

)

D pre−irrad D post−irradE pre E post

� Noise normalized to peak-signal before and after irradiation

� Decrease in signal/noise� gain loss� more noise at

higher currents� Laser driver

related

Noise

Page 28: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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−0.2 0 0.2 0.4 0.6 0.80

0.5

1

1.5

2

2.5

Input voltage (V)

Inte

gral

non

linea

rity

(%) A pre−irrad

A post−irrad

−0.2 0 0.2 0.4 0.6 0.80

0.5

1

1.5

2

2.5

Input voltage (V)

Inte

gral

non

linea

rity

(%) B pre−irrad

B post−irrad

−0.2 0 0.2 0.4 0.6 0.80

0.5

1

1.5

2

2.5

Input voltage (V)

Inte

gral

non

linea

rity

(%) C pre−irrad

C post−irrad

−0.2 0 0.2 0.4 0.6 0.80

0.5

1

1.5

2

2.5

Input voltage (V)

Inte

gral

non

linea

rity

(%) D pre−irrad

D post−irradE pre E post

Linearity

� Linearity before and after irradiation

� no significant change

Page 29: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Other studies on lasers

� Accelerated ageing

� B-field

Page 30: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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� 40 devices (Type Z)� 30 devices irradiated to

>1014n/cm2

� 4000 hrs ageing

� No additional degradation in irradiated lasers

� acc. Factor ~400 relative to -10°C operation, for Ea=0.4eV

� lifetime >>10years

60

50

40

30

20

10lase

r th

resh

old

curr

ent,

I thr (

mA

)

40003000200010000time in oven - 1st batch (hrs)

40003000200010000

time in oven - 2nd batch (hrs)

unirrad (batch 1) (10LD) neutron irrad (batch 1) (10 LD) neutron irrad (batch 2) (20 LD)

ref: Proc. RADECS 1999

Laser reliability

� Ageing test at 80°C

Page 31: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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B-field: functionality

� Spectral and static characterization� in-system functionality test� up to 2.4T� various angles

� No effect on spectrum� No effect on L-I, noise, linearity

� ref: CMS Note 2000/40

� recent Vienna data (now up to ~10T)

Page 32: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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B-field: packaging

� Exclude magnetic materials in laser package

Page 33: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Laser summary

� Radiation damage and annealing� threshold increase, efficiency decrease, beneficial annealing

� add compensation into laser driver specs

� Ageing� lifetime >>10yrs� no additional degradation in irradiated lasers

� B-field� no effect up to 10T� non-magnetic package

Page 34: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Fibre radiation damage testing

� 1-way fibre� attenuation� strip force

� 12-way cable� insertion loss� bending loss

� 96-way cable� strength tests

Page 35: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Co-60Gamma

Radiationzone

reference channel(patch cord loss)reference channel

(laser power)

sample spool

opticalsplitter

temperature-controlled

1310nm laserdiode

photodiodes

FC/PCpatch-panel

photodiode

Ref: Market Survey, 2000 (SCK-CEN Co-60 source)

Radiation test system - fibre att’n

� in-situ measurement of fibre attenuation

Page 36: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

������������ ��������������� �����������������������������������

courtesy A.Gusarov (SCK-CEN)

‘Colour centres’

� Attenuation in irradiated glass due to radiation induced “colour centres”

� e.g. lenses irradiated in collimated beam

� impurities affect degree of damage

Page 37: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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� COTS single-mode fibres� 1310nm

� for ~10m length inside CMS Tracker expect no more than ~0.6dB (not including annealing)

ref: Proc. SPIE 1998

Gamma damage

� Fibre attenuation up to 100kGy

Page 38: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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� Damage most likely due to γ background

Neutron damage

� ~6MeV neutrons to ~5x1014n/cm2

Page 39: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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� Significant annealing after irradiation

� Damage therefore dose-ratedependent

� expect more annealing over CMS Tracker lifetime

� i.e. less damage than measured here

Fibre annealing

� damage recovers after irradiation (e.g. γ data)

Page 40: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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� No significant degradation after irradiation� No bending loss seen down to 1.5cm bend-radius (spec=3cm)

Reference cable

Fan-IN

Cable UNDER TEST

FC-APC

IN

END

IL / RL Test SetCW/pulsed Large areaLaser Source Receiver

0

0.2

0.4

0.6

0.8

1

1.2

1.4

1 2 3 4 5 6 7 8 9 10 11 12

Channel

IL [d

B]

ReferenceNON_IRRIRR

insertion loss

12-way ribbon cable test

� 12-way ribbon cable bef/after 100kGy

Page 41: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Cable strength

� 4x10m 96-way cable samples � 1x 100kGy gamma� 1x 1014n/cm2 0.75MeV neutrons� 1x 100kGy gamma + 1014n/cm2 0.75MeV neutrons� 1x unirradiated

� Tested by Ericsson Cables� Impact� Repeated bending� Tensile load

� no significant degradation due to radiation damage

Page 42: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Fibre summary

� Radiation damage (to attenuation)� losses <<1dB expected in Tracker

� cable insertion and bending losses� no difference before/after irradiation

� strength tests� no difference before/after irradiation

Page 43: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Connector testing

� B-field� exclude magnetic components

� Radiation damage� irradiate non-magnetic components� insertion-loss and return-loss bef/after 100kGy

� single-way� multi-way

Page 44: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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B-field

� e.g. MU connector test

Page 45: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Company

Amphenol oCompel XComputer Crafts 13 o XDiamond 4 6 oFITEL (Furukawa) o 2Fujikura X 24 X X XLEMO XNTT o oRadiall XInfineon (Siemens) oSumitomo o 43 2 11 11 o

SC-A

PC <

-> F

C-AP

C

LC <

-> F

C-AP

C

MU

<->

FC-A

PC

Regl

ette

<->

MPO

SC2

<->

FC-A

PC

sMU

<->

FC-A

PC

12M

FS A

/B <

-> M

PO

12M

PO <

-> M

PO

4MPO

<->

MPO

12M

PO <

-> F

C-AP

C

MD

<->

MD

4min

iMPO

<->

MPO

12SM

C <-

> M

PO

Rede

l-D <

-> F

C-AP

C

4MFS

A/B

<->

MPO

12FC

-APC

<->

FC-

APC

2MT-

RJ <

-> F

C-AP

C

12M

T <-

> M

PO

4MT

<->

MPO

= test passedn = # of connectors that failedX = B-field test failedo = B-field test passed (weak effect)

B-field + functionality summary

B-fie

ld c

onne

ctor

B-fie

ld a

dapt

or

Inse

rtio

n lo

ss

retu

rn lo

ss

Page 46: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

������������ ��������������� �����������������������������������

IL RL IL RL IL RLBefore irr: 0 45 0.15 49 0.58 53After irr: 0.02 43 0.23 47 0.4 52

TOT maxTOT min TOT avg

0

2

4

6

8

10

12

14

16

0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 1.1 1.2 1.3 1.4 1.5 1.6 1.7 1.8 1.9 2

Insertion Loss [dB]

Coun

ts

0

2

4

6

8

10

12

40 42 44 46 48 50 52 54 56 58 60 62 64 66 68 70

Return Loss [dB]

Coun

ts

MU-connector irradiation

� After 100kGy� no damage effects

Page 47: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

������������ ��������������� �����������������������������������

0

2

4

6

8

10

12

14

16

0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 1.1 1.2 1.3 1.4 1.5 1.6 1.7 1.8 1.9 2

Insertion Loss [dB]

Cou

nts

0

2

4

6

8

1 0

1 2

1 4

1 6

1 8

40 42 44 46 48 50 52 54 56 58 60 62 64 66 68 70

Return Loss [dB]

Cou

nts

MT-connector irradiation

� After 100kGy� no damage effects

Page 48: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

������������ ��������������� �����������������������������������

MT-connector reliability

� Repetitive connection cycles� 40 before irradiation� 100 after irradiation

� 200kGy and 1014n/cm2

� No radiation damage effects

� Ref: RADECS 1997 Data Workshop

Page 49: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

������������ ��������������� �����������������������������������

Connector summary

� magnetic components excluded

� insertion loss, return loss and reliability (repetitive cycles) unaffected by radiation damage

Page 50: Environmental Resistance and Reliability · Testing during development phase Environmental tests Irradiation (all components) B-field (lasers and connectors) also Temperature (lasers)

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Conclusions

� Extensive series of environmental and reliability tests� significant number of devices tested over 5 years

� Enabled selection of components suitable for use in CMS Tracker

� Feedback of test results into system spec’s� compensation of important radiation damage effects built in system� final failure rate unlikely to be dominated by radiation damage


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