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J. Prasad SPara 1 High Frequency Characterization of Transistors J. Prasad [email protected]
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Page 1: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 1

High Frequency Characterization of Transistors

J. Prasad

[email protected]

Page 2: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 2

This process

change should

have improved

Ft and Fmax !

I didn’t see any change.

Actually Fmax was lower!

Microwave

Test Engineer

Process

Engineer

VP

Technology

VP

Engineering

Page 3: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 3

1.1THz Test System from Cascade Microtech/Keysight

International Microwave Symposium, San Francisco, May 22-27, 2016

Page 4: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 4

What is High Frequency Characterization?

Small Signal

Characterization

Large Signal

Characterization

fT

fmax

NFmin

Rn

Zs opt

GA

Re

Rb

Rs

Rd

Pin vs Pout

PAE

P1dB

OIP3

IIP3

Load Pull

Source Pull

Linear Measurements Non-Linear Measurements

This talk

Page 5: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 5

OUTLINE

• Introduction

• S-parameters

• Smith Chart

• Vector Network Analyzer

• Calibration

• De-embedding

• Examples of measured data

• Gain and Stability

• Ft and Fmax from S-parameters

• Mason’s Gain

• Transistor Specmanship

• Parameter extraction/wafer maps

• Conclusion

Page 6: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 6

2

mT

gf

C C

max

'8

T

bb

ff

r C

21

2 2 2 2

---------------- ------------ ------

DCAB Ee jE e ee c jC

T DE n n m sat

e b c

WN W W W Wr C r r r C

f N D D v v

6

7

thermionic emission velocity

5 10 cm/sec for Si.2 *

saturation velocity

10 cm/sec for Si.

m

sat

kTv

m

v

max

'8

T

bb

ff

r C

2

2jE m

n

WC C g

D

jCC C

BIPOLAR FIGURES OF MERIT

Approximate Exact

Page 7: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 7

h21 (BJT)

0

10

20

30

40

50

0.01 0.1 1 10 100

Freq (GHz)

h2

1 B

JT

(d

B)

h21 BJT angle

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

0.01 0.1 1 10 100

Freq (GHz)

h2

1 B

JT

an

gle

(d

eg

)

21( )

1

100

50 GHz

BJT

T

DC

T

hf

jf

f

50

Ft VARIATION WITH FREQUENCY (Bipolar)

Microwave Engineers

find Ft by plotting

h21 vs frequency!

20log(h21)

20dB/dec

Page 8: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 8

2 ( ) 1 ( )

mT

D Sgs gd gd m D S p

o

gf

R RC C C g R R C

r

max8

T

G gd

ff

R C

2

mT

gs gb gd

gf

C C C

max2 ( ) 2

T

ds G S T G gd

ff

g R R f R C

MOS FIGURES OF MERIT

: parasitic cappC 2

mT

gs

gf

C

& are small in satgd gbC C

Approximate Exact

Page 9: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 9

h21 MOS

0

10

20

30

40

50

60

70

80

0.01 0.1 1 10 100

Freq (GHz)

h2

1 M

OS

(d

B)

h21 MOS angle

-100

-80

-60

-40

-20

0

0.01 0.1 1 10 100

Freq (GHz)

H2

1 M

OS

an

gle

21( )

1

50 GHz

MOS

T

T

hf

jf

f

Note that this

goes to infinity!

Ft VARIATION WITH FREQUENCY (MOS)

Phase is

constant

-90

Page 10: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 10

S- PARAMETERS

Page 11: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 11

• At HF, difficult to measure currents and voltages

• Difficult to create open and shorts

• Everything behaves like Transmission lines with reflections

• S-parameters are very easy to understand and use

• S-parameters exist for any network

• Can easily relate to gain, loss, reflection and power

• Can predict the performance of cascaded networks

• From S-parameters, one can convert to Z, Y or H parameters

• Needed for SPICE model parameter extraction

• Some CAD programs need S-parameters for circuit design

Why S-Parameters?

Page 12: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 12

Two Port Parameters

1 11 1 12 2

2 21 1 22 2

1 11 1 12 2

2 21 1 22 2

V z I z I

V z I z I

I y V y V

I y V y V

1 11 1 12 2

2 21 1 22 2

1 11 1 12 2

2 21 1 22 2

1 2 2

1 2 2

V h I h V

I h I h V

I g V g I

V g V g I

V AV BI

I CV DI

Device

I1 I2

V1 V2

+ + _ _

1 2

Page 13: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 13

Device

1 2

a1

b1

a2

b2

1 11 1 12 2

2 21 1 22 2

b S a S a

b S a S a

2

2

1

1

111

1 0

221

1 0

112

2 0

222

2 0

a

a

a

a

bS

a

bS

a

bS

a

bS

a

Input reflection coefficient with output terminated in Zo

Output reflection coefficient with input terminated in Zo

Forward transmission coefficient with output terminated in Zo

Reverse transmission coefficient with input terminated in Zo

S-Parameters Defined

Page 14: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 14

Device

1 2 ZO

ZO

Z1 Z2

+ +

_ _ V1 V2

VS

+

_

S-Parameters in terms of impedances and voltages

ZO : Characteristic

impedance (50W)

1 011

1 0

2 022

2 0

221

112

2

2

S

S

Z ZS

Z Z

Z ZS

Z Z

VS

V

VS

V

G.Gonzalez, Microwave Transistor Amplifiers,

Prentice Hall 1984

Page 15: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 15

6dB Pad

1 2 ZO

ZO

Z1 Z2

+ +

_ _ V1 V2

VS

+

_

S-Parameters for a 6dB pad

S =

0

0

0.5

0.5

1 011

1 0

2 022

2 0

221

112

2

2

S

S

Z ZS

Z Z

Z ZS

Z Z

VS

V

VS

V

Page 16: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 16

1 2 ZO

ZO

Z1 Z2

+ +

_ _ V1 V2

VS

+

_

6 dB pad

16.6 16.6

66.9

Z = 83.5 66.9

66.9 83.5

S =

0 0.5

0.5 0

Looking at Z - parameters

one can not quickly infer

this is a 6dB Pad!

50

50

Z-Parameters for a 6dB pad

Page 17: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 17

1 11 1 12 2

2 21 1 22 2

b S a S a

b S a S a

12 2111

221

Lin

L

S SS

S

SIGNAL FLOW GRAPHS

a1 b2

b1 a2

S11

S12

S22

S21 a1 b2

b1 a2

S11

S12

S22

S21

L

in

a1 b2

b1 a2

S11

S12

S22

S21

out

S

12 2122

111

Sout

S

S SS

S

Page 18: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 18

INTRODUCTION TO SMITH CHART

Smith Chart Story

Page 19: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 19

0

0

0

0

LL

L

SS

S

Z Z

Z Z

Z Z

Z Z

Mapping of resistances – Smith Chart-1

0 50W o o

0 +1 -1

25 100 200

ZO = 50W

Pure resistances map along the

x-axis between -1 and + 1

Convert all impedances to

reflection coefficient and plot it.

That is Smith Chart!

0 ∞

𝑗∞

−𝑗∞

Page 20: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 20

Radius=1 0

0

0

0

LL

L

SS

S

Z Z

Z Z

Z Z

Z Z

Mapping of reactances – Smith Chart-2

Inductive

Capacitive

Note that magnitude is always 1 but angle varies. Pure reactance maps along the circumference of a unit circle.

ZO = 50W

o

o

o

o

o

o

o

( )

0 1180

j10 1157.4

j25 1126.9

j50 1 90

j100 1 53.1

j200 1 28.1

j

1 0

L LZ W

y

-j200

x 0 50

j50

-j50

o o

j10

j25 j100

j200

-j10

-j25 -j100

Page 21: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 21

R=const

circle

X=const

circle

Unit circle:

Radius=1

y 0

0

0

0

LL

L

SS

S

Z Z

Z Z

Z Z

Z Z

Mapping of impedances – Smith Chart-3

Inductive

Capacitive

All impedances (R+jX) with R>0 will map inside a unit circle.

If R is negative (R< 0), it will map outside the unit circle.

ZO = 50W

o

o

( )

50+j50 0.45 63.4

50 50 0.45 -63.4

L LZ

j

W

x

0

50

j50

-j50

o o 63.4o

50+j50

0.45

Page 22: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 22

The Glorious Smith Chart

Page 23: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 23

How to measure S-parameters?

- The Vector Network Analyzer

Page 24: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 24

E 8361C PNA Series NETWORK ANALYZER 10MHz – 67GHz

You will also need a 4155 Semiconductor Parameter Analyzer for biasing.

Page 25: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 25

VECTOR NETWORK ANALYZER BLOCK DIAGRAM

Page 26: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 26

What is Calibration?

Page 27: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 27

Short the leads and adjust the ZERO OHMS pot

so that the meter reads zero. We have zeroed out

resistance of the test leads.

CALIBRATION

Page 28: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 28

Short the leads and write down the reading R1.

Connect the resistor Rx and take the reading R2.

Unknown resistor Rx = R2 – R1

CALIBRATION

Page 29: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 29

4155/4156

Parameter

Analyzer

I-V curves Measure & gen

I-V curves Output file

Multimeter Measure

0.1W resistor Calibrate Output data Measure

1 term error

correction: short

Capacitance

Meter 4980

Capacitance

Measurement Calibrate Output data Measure

2 term error

correction: short and open

Page 30: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 30

CALIBRATION

4980A CAPACITANCE METER (20Hz – 2MHz)

Short the leads and write down the series resistance Rs.

Open the leads and write down the stray capacitance Cp.

The instrument does the correction for the series resistance.

Then it subtracts the stray capacitance from the measured data.

Page 31: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 31

8361C

Network Analyzer Calibrate Measure

3 term error correction:

short, open and load

1-port

S-parameter S-parameter

data

One-Port Measurement using Network Analyzer

Page 32: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 32

One-Port Error Correction

Page 33: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 33

8361C

Network Analyzer Calibrate Measure

3 term error correction:

short, open and load

8361C

Network Analyzer

2-port [S]

package Calibrate Measure

12 term error correction:

short , open, load and thru

1-port

S-parameter

S-parameter

data

S-parameter

data

One / Two-Port Measurement using Network Analyzer

Page 34: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 34

TWO PORT CALIBRATION

Page 35: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 35

Page 36: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 36

Page 37: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 37

w

f

Phase

(rad)

o

Group delay

1

360

gt

f

f

w

RFin RFout

S S

S S

G D

THRU CALIBRATION FOR GROUP DELAY

delayed

signal

Page 38: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 38

Page 39: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 39

THRU

REFLECT

LINE

TRL CALIBRATION

At low frequencies, the lines become long. So, we need different TRL structures for different frequency bands for wide band characterization. Use SOLT for lower freq.

Glenn Engen, Cletus Hoer, MTT-27 (12), Dec 1979

Page 40: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 40

RF MICROWAVE PROBES (CASCADE MICROTECH)

Page 41: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 41

CALIBRATION USING IMPEDANCE STANDARD SUBSTRATES

The purpose of Cal

is to bring the reference

plane to the probe tips

Page 42: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 42

0

50

j50

-j50

o o

BEFORE CALIBRATION AFTER CALIBRATION

0

50

j50

-j50

o o

Page 43: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 43

DE- EMBEDDING

Page 44: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 44

8361C

Network Analyzer Calibrate Measure

3 term error correction:

short, open and load

8361C

Network Analyzer

2-port [S]

Package Calibrate Measure

12 term error correction:

short , open, load and thru

1-port

S-parameter

S-parameter

data

S-parameter

data

8361C

Network Analyzer

On-wafer

2-port [S] Calibrate Measure

12 term error correction:

short , open, load and thru

[S] data

of device De-embed

Page 45: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 45

S S

S S

G D

Cpad

100-600 fF

S S

S S

G D

Cdevice

1- 6 fF

Pad capacitance far exceeds

Single device capacitance

A device array alleviates

this problem to some extent

100

devices

DUT

Y3

Y1 Y2

G D

S S

Device

Page 46: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 46

DUT

Y3

Y1 Y2

G D

S S

Device

Y3

Y1 Y2

G D

S S

OPEN

1-Step De-Embedding

open open

device device

DUT device open

DUT DUT

S y

S y

y y y

y S

Measure on- wafer OPEN

Measure DEVICE

Use the equations on the left

DE- EMBEDS PAD CAPACITANCE ONLY !

Page 47: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 47

S S

S S

G D DUT

Y3

Y1 Y2

Z2 Z1

Z3

G D

S S

Device

2- Step De - Embedding

DE- EMBEDS

• Pad Capacitance

• Series Impedance

Page 48: High Frequency Characterization of Transistors - IEEEsites.ieee.org/scv-eds/files/2016/07/J-Prasad_SPara_Talk5.pdf · High Frequency Characterization of Transistors J. Prasad jprasad@ieee.org

J. Prasad SPara 48

DUT

Y3

Y1 Y2

Z2 Z1

Z3

G D

S S

Device

Y3

Y1 Y2

Z2 Z1

Z3

G D

S S

OPEN

Y3

Y1 Y2

Z2 Z1

Z3

G D

S S

THRU

Y3

Y1 Y2

Z2 Z1

Z3

G D

S S

SHORT

2- Step De - Embedding

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J. Prasad SPara 49

_ _

_ _ _ _

_ _

open open

short short

device device

dev no pad device open

dev no pad dev no pad

DUT dev no pad short

DUT DUT

S y

S z

S y

y y y

y z

z z z

z S

DUT with Pad capacitance

and series elements

DUT

Y3

Y1 Y2

Z2 Z1

Z3

G D

S S

Device

Whoa!

2- Step De - Embedding

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J. Prasad SPara 50

RF Characteristics of 0.18-m CMOS Transistors: Kwangseok Han, Jeong-hu Han, Minkyu

Je and Hyungcheol Shin Department of Electrical Engineering and Computer Science,

Korea Advanced Institute of Science and Technology, Taejon 305-701

High Frequency Performance of 0.18um CMOS

Measurement: 0.5-50GHz

Ft=50GHz, Fmax=45GHz

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J. Prasad SPara 51

IMPERFECT on-wafer SHORT

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J. Prasad SPara 52

E E

E E

B C

Layout with minimum inductance and reflections

Small octagonal pads

to reduce capacitance

and reflections

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J. Prasad SPara 53

Definitions of Gain and Stability

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J. Prasad SPara 54

DEFINITIONS OF GAIN

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J. Prasad SPara 55

Limiting Factors of RF Performance Improvement as Down-scaling to 65-nm Node MOSFETs

H. L. Kaoa*, B. S. Lina, C. C. Liaob, M. H. Chenc, C. H. Wuc, and Albert Chinb

a Dept. of Electronic Engineering, Chang Gung Univ., Tao-Yuan, Taiwan, ROC

b Nano-Sci. Tech. Ctr, EE. Dept., Nat’l Chiao-Tung Univ., UST, Hsinchu, Taiwan, ROC

c Dept. of MicroElectronics Engineering, Chung Hua Univ., Hsinchu, Taiwan, ROC

Ft and Fmax of 65nm CMOS

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J. Prasad SPara 56

Device

1 2 ZS

ZL

in

+ +

_ _ V1 V

2

VS

+

_

out

CIRCUIT FOR MEASURING MAXIMUM AVAILABLE GAIN & Fmax

We vary ZS and ZL so as to provide a simultaneous conjugate match.

This maximizes the input power and delivers maximum output power to the load.

This will give us MAG.

If we do this at each frequency, we can generate a plot of MAG vs frequency.

From this plot, we can determine the frequency at which the power gain will

become unity. This is Fmax.

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J. Prasad SPara 57

11

12

21

22

0.65 95

0.04 40

5.00 115

0.80 35

S

S

S

S

12 2111

221

Lin

L

S SS

S

IN = 1 circle

53o

j50

-j50

50 0

unstable

THE EFFECT OF LOAD IMPEDANCE

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J. Prasad SPara 58

11

12

21

22

0.65 95

0.04 40

5.00 115

0.80 35

S

S

S

S

OUT = 1 circle

127o

j50

-j50

50 0

unstable

12 2122

111

Sout

S

S SS

S

THE EFFECT OF SOURCE IMPEDANCE

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J. Prasad SPara 59

j50

-j50

50 0

IN >1 j50

-j50

50 0

unstable

IN >1

𝐾 > 1 𝑎𝑛𝑑 ∆ < 1

For unconditional stability

conditionally stable

unconditionally stable

K<1 MAG undefined Simultaneous conjugate

match not possible

K>1 MAG defined Simultaneous

conjugate match possible

J.M.Rolett, IRE Trans CT, CT-9(1), pp 29-32, Mar 1962, W.Ku, Proc IEEE 54(11), pp 1617-1618, Nov 1966

OUTPUT STABILITY CIRCLE & UNCONDITIONAL STABILITY

= Stability factor

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J. Prasad SPara 60

GAIN EQUATIONS in S- Domain

h21

Use only for K>1

Use only for K<1

Use for all K

Does not depend on K Mason’s Gain

Maximum Available Gain

Maximum Stable Gain

Current Gain

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J. Prasad SPara 61

Determining Ft and Fmax from

Measured S-parameter Data

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J. Prasad SPara 62

[S]DUT over

frequency

[S] g [h]

Plot 20 log (h21)

vs frequency

extrapolate

h21 g 0dB

fT

[S]DUT over

frequency

K > 1 and

D <1 ?

MSG

Plot 10 log (MSG)

vs frequency

MAG

Plot 10 log (MAG)

vs frequency

extrapolate

MAG g 0dB

fmax

Yes No

Determining Fmax when the device is stable

K>1 over some frequency range

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J. Prasad SPara 63

[S]DUT over

frequency

MSG

Plot 10 log (MSG)

vs frequency

MAG

Plot 10 log (MAG)

vs frequency

extrapolate

MAG g 0dB

fmax

Yes No K > 1 and

D <1 ?

[S]DUT over

frequency

Calculate U

Plot 10 log (U) vs

frequency

extrapolate

U g 0dB

fmax

K > 1 &

D< 1 for

all f ?

No

Stable Unstable Unstable

Determining Fmax when

the device is unstable K<1

throughout all frequencies

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J. Prasad SPara 64

HF performance of 3x10 HBT Ic=10mA Vce=2V

0

5

10

15

20

25

30

35

40

0.1 1.0 10.0 100.0

Frequency (GHz)

Ga

in (

dB

)

h21(dB)

MSG/MAG

U(dB)

MAG

MSG

h21

U

Ft = 54GHz

Fmax= 50GHz

Fu= 72GHz

slope:

20dB/decade

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J. Prasad SPara 65

Mason’s Gain Explained

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J. Prasad SPara 66

If Fmax is a Figure of Merit, is it Unique?

How can I find out whether a device is Active or Passive?

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J. Prasad SPara 67

Method of unilateralizing a Two Port Network

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J. Prasad SPara 68

POWER GAIN CALCULATIONS IN DIFFERENT CONFIGURATIONS

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J. Prasad SPara 69

MASON’S INVARIANT or UNILATERAL GAIN U

S.J.Mason, IRE Tran CT, CT-1 (2), pp 20-25, June 1954

M.S.Gupta, T-MTT, 40(5), pp 864-879, 1992

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J. Prasad SPara 70

Transistor Specmanship!

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J. Prasad SPara 71

HF performance of 3x10 HBT Ic=10mA Vce=2V

0

5

10

15

20

25

30

35

40

0.1 1.0 10.0 100.0

Frequency (GHz)

Ga

in (

dB

)

h21(dB)

MSG/MAG

U(dB)

MAG

MSG

h21

U

Ft = 54GHz

Fmax= 50GHz

Fu= 72GHz

slope:

20dB/decade

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J. Prasad SPara 72

70GHz Fmax Silicon Bipolar Transistor

Mamoru Ugajin, Jun-ichi Kodate, Yoshiji Kobay ashi, Shinsuke

Konaka, and Tetsushi Sakai NTT LSI Laboratories 3-1,

Morinosato Wakamiya, Atsugi-Shi, Kanagawa, 243-01 Japan

IEDM95

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J. Prasad SPara 73

450GHz Ft and Fmax InP/InGaAs HBT

N. Kashio et al., TED 61(10), Oct 2014 p 3423

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J. Prasad SPara 74

High Frequency Performance of 0.12um SiGe HBT

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J. Prasad SPara 75

Other uses of S-parameter Measurements:

Parameter Extraction for SPICE

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J. Prasad SPara 76

H11 vs Frequency

0

50

100

150

200

250

300

350

400

0.1 1.0 10.0 100.0

Frequency (GHz)

Re

(h

11

) o

hm

s

E

B’

C +

_

r C

CB

bi ' bb r

'm b eg v

Base resistance extraction from h11

h11

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J. Prasad SPara 77

Wafer Map of Base Resistance and Fmax

S.J. Prasad, BCTM 1992, pp 204-207

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J. Prasad SPara 78

Wafer Map of Emitter resistance and Ft

S.J. Prasad, BCTM 1992, pp 204-207

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J. Prasad SPara 79

Wafer Map of Collector Capacitance

S.J. Prasad, GaAs IC Symposium 1992, pp 271- 274

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J. Prasad SPara 80

ENGINEERING

It is a great profession.

There is the fascination of watching a figment of imagination

emerge through the aid of science to a plan on paper.

Then it moves to realization in stone or metal or energy.

Then it brings jobs and homes to men.

Then it elevates the standards of living and adds comforts to life.

That is the engineer’s high privilege.

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J. Prasad SPara 81

ENGINEERING - II

The great ability of the engineer compared to men of other professions

Is that his works are out in the open where all can see them.

His acts, step by step are in hard substances.

He cannot bury his mistakes in the grave like doctors;

He cannot argue them into thin air like the lawyers;

He cannot cover his failures with trees and wines like the architects;

He cannot screen his shortcomings by blaming the opponents

like the politicians ;

The engineer simply cannot deny he did it.

If his works does not work he is damned.

-- Herbert Hoover


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