1

ICP-MS-1April 1994

the selected ions reach the detector.

The ICP-MS provides information for each atomicmass unit (amu or Daltons; more accurately, theratio of the mass of the ion to its charge isdisplayed, and labelled m/z), in the mass region3-250 amu. The isotope information can be used inseveral ways; these include isotope ratiomeasurements, often used for Pb and U which donot have a constant natural abundance, andanalysis of samples having unnatural isotopeabundances.

Isotope dilution is a method of spiking the sampleswith a known concentration of a pure isotope toobtain a very accurate determination of theconcentration of the element. A pre-requisite of thistechnique is that the element of interest must havemore than one isotope.

Detection LimitsICP-MS detection limits are very impressive. Mostdetection limits are in the 1-10 parts per trillion (ppt)range for solutions. These are as good as, or betterthan, GFAAS detection limits for most elements inpure water. ICP-MS can also detect many elementsthat have very poor GFAAS detection limits.ICP-MS has typically two to three orders ofmagnitude better detection limits than ICP-AES,which has detection limits for most elements in the1-10 parts per billion (ppb) range. Recently, someICP-AES spectrometers have shown impressivedetection limits in the sub ppb region for selectedelements in an optimized part of the spectrum forclean samples.

It should be noted, however, that the commentabove about ICP-MS detection limits is for simplesolutions having low levels of other dissolvedmaterial. For detection limits related toconcentrations in the solid, the advantage forICP-MS can be degraded by up to 50 times,because of the poorer dissolved solids capability.Some common lighter elements, (e.g. S, Ca, Fe, K,Se) have serious interferences in ICP-MS whichdegrade the detection limits considerably.

ICP-MS, or ICP-AES and AAS?—a comparison

Geoffrey TylerVarian Australia Pty LtdMulgrave, Victoria, 3170, Australia

IntroductionThe attractiveness of the inductively coupled plasmaatomic emission spectrometer (ICP-AES) has ledmany analysts to ask whether it is wiser to buy anICP-AES or to stay with their trusted atomicabsorption technique (AAS)1. More recently, a newtechnique, inductively coupled plasma massspectrometry (ICP-MS), has been introduced2.

The ICP-MS offers at first sight, albeit at highercost, the advantages of ICP-AES and the detectionlimits of graphite furnace atomic absorptionspectrometry (GFAAS).

This article will briefly describe these threetechniques, and point out the important criteria bywhich to judge their applicability to your ownanalytical problems.

For many people with an ICP-AES background, ICP-MS is a plasma, with a mass spectrometer as adetector. Mass spectroscopists would prefer todescribe ICP-MS as mass spectrometry with aplasma source. Either way, the technique is capableof giving isotope information. This information canhelp to overcome many of the “spectral”interference problems that can occur in the massspectrometer.

Basically, the sample compartments and plasma ofICP-AES and ICP-MS look similar. In ICP-AES, theoptical spectrum (approximate range 165-800 nm),is viewed and measured, either sequentially orsimultaneously. The simultaneous ICP-AES isfaster, but more expensive, than sequentialICP-AES.

The ICP-MS extracts the ions produced in theplasma into an interface consisting of a samplercone followed by a skimmer cone. This configurationenables the pressure to be reduced differentiallyfrom atmospheric pressure down to a final pressureof between 10-5-10-7 Torr. The ions pass through theinterface into ion optics, which optimize the ionpaths. Neutral species are removed from the beamat this stage, either by the vacuum pumps or bycollision with a photon stop. The ions then passthrough a mass filter, usually a quadrupole, before

2

InterferencesThe three techniques present different types andcomplexities of interference problems. For thisreason, we will look at each technique separately.

ICP-MS interferences

1. Spectral

The spectral interferences in ICP-MS arepredictable and number less than 300.Polyatomic and isobaric interferences are foundwhere a species has a similar mass to theanalyte, whereby the resolution of thespectrometer (generally around 0.8 amu) willnot resolve it, e.g. 58Ni on 58Fe, 40Ar on40Ca,40Ar16O on 56Fe, or 40Ar-Ar on 80Se.

Element correction equations (similar inprinciple to inter-element correction inICP-AES) can be used. In many casesalternative isotopes with lower naturalabundances may be employed. The use ofmixed gases (small percentages of other gasessuch as nitrogen, added to the main argon gas)can sometimes be effective in reducinginterferences.

2. Matrix acids

It should be especially noted that HCl, HClO4,

H3PO

4 and H

2SO

4 can cause considerable

spectral problems. Polyatomic interferences arecaused by Cl+, P+, S+ ions in conjunction withother matrix elements like Ar+, O+, H+.Examples are, 35Cl40Ar on 75As and 35Cl16O on51V.

The avoidance of HCl, HClO4, H

3PO

4 and

H2SO

4 in ICP-MS is paramount for most

analyses. Where this is not possible, separationchromatography (microcolumns) may be usedbefore the sample is introduced into theplasma. This is a method many favour to get ridof the unwanted species, and it also creates anopportunity to preconcentrate at the same time.Other techniques used to overcome theseproblems are: electrothermal vaporization(ETV), and mixed gases. Another veryexpensive alternative is a high resolutionmagnetic sector ICP-MS which can resolvemasses less than 0.01 amu apart. This enablesmany of the spectral interferences to beeliminated.

Solutions for ICP-MS analysis are normallyprepared in nitric acid.

3. Doubly charged ions

A doubly charged ion will cause a spectralinterference at half the m/z of the singlycharged ion, e.g.138Ba++ on 69Ga+ or 208Pb++ on104Ru+. These interferences are few and can beconsiderably minimized, or effectivelyeliminated, by optimizing the system beforeproceeding with the analysis.

4. Matrix effects

Transport effects include spray chamber effectsand differences in viscosity between samplesolutions and calibration standards. This willchange the efficiency of aerosol productionfrom one solution to another. Matrix matching isusually required, although internalstandardization can be used as an alternativemethod. The rapid scanning speed of ICP-MSdoes give superior results when using aninternal standard.

5. Ionization

Ionization effects can be caused by samplescontaining high concentrations of group I andgroup II elements. Matrix matching, sampledilution, standard addition, isotope dilution,extraction or separation by chromatographymay be necessary.

6. Space charge effects

Space charge effects occur mainly behind theskimmer cone, where the net charge densitybecomes significantly different from zero. Thehigh ion density leads to interaction betweenions present in the ion beam causingpreferential loss of the light ions in the presenceof heavy ions, e.g. Pb+ on Li+ 3. Matrixmatching, or careful choice of internalstandards across the mass range of analytes,will help to compensate for these effects,although this may prove difficult in practice.Isotope dilution will be effective thoughexpensive, but the simplest and most effectivemethod is to dilute the sample.

ICP-AES interferences

1. Spectral

ICP-AES spectral interferences are morenumerous and are more difficult to solve. Thereare more than 50,000 ICP-AES spectral linesdocumented, and the matrix can causeconsiderable problems, which makes a highresolution spectrometer mandatory for theanalysis of samples such as steels, chemicalsand rocks. Inter-element correction, usedextensively in simultaneous ICP-AES, can haveonly limited success.

The background in ICP-AES may be elevatedor structured, requiring an off line backgroundcorrection. Sophisticated dynamic backgroundcorrection, if available, is very useful to improveaccuracy. Different molecular species such asOH give peaks or bands which can causeanalytical problems at low analyteconcentrations, degrading the detection limits inreal samples.

The background in ICP-MS is so low, typically<20 counts/second, that it doesn’t pose aproblem. This is a major reason for the superiordetection limits of ICP-MS.

3

2. Matrix effects

Like ICP-MS, ICP-AES can use internalstandards to overcome matrix effects such asspray chamber effects and viscosity differencesbetween samples and calibration standards4.

3. Ionization

Interference from easily ionizable elements canbe minimized by careful choice of individualelement conditions6 or by adding an ionizationbuffer, i.e. by adding an excess of a group Ielement.

GFAAS interferences

The interferences in GFAAS have many sources.They include:

1. Spectral

There are a few spectral interferences inGFAAS when deuterium background correctionis used, but these can be eliminated by use ofZeeman GFAAS.

2. Background

For many matrices careful programming of theash stage is required to minimize thebackground signal during the atomization. Theuse of chemical modifiers can be helpful inincreasing the allowable ash temperature. Forexample, a Ni chemical modifier for Sedeterminations allows ash temperatures of upto 1000 °C before Se loss. The use of Zeemanbackground correction can give animprovement in accuracy compared with D

2 arc

background correction in many GFAASapplications.

3. Vapor phase interferences

These can be caused by the atomization of theanalyte into a cooler gas environment. Theseinterferences have been minimized in recentyears by isothermal tube design and use ofplatforms so that the sample is atomized into ahot inert gas environment.

4. Matrix effects

Matrix effects are caused by variable retentionof the analyte on the graphite tube, dependingon the sample type. The dry and ash stagescan have a dramatic effect on the shape of thetransient peak. The use of matrix modifers(e.g. PdCl

2) and hot injection can be quite

effective in minimizing these effects; also theuse of peak area measurement can beadvantageous in some cases5.

Ease of useFor routine analyses, ICP-AES has matured inautomation to the point where relatively unskilledpersonnel can use methods created by the ICP-AESspecialist. Until recently, ICP-MS was still thedomain of the specialist chemist making fineadjustments before performing routine analysis.

The trend to simplicity has been evident since 1993and will continue in the future. One of the reasonsfor this is full computer control of parameters storedwithin a method. Another reason is the use of amultitasking graphical user interface, to show theoperator several indicators of data integrity on thesame screen. The use of such software also has avery positive effect on method development time.Before this software became available, ICP-MSmethod development was a highly complex andtime-consuming task. GFAAS, although relativelysimple for routine analysis, requires considerableskill in setting up the methods.

Total Dissolved Solids (TDS)

Recent ICP-AES spectrometers have been able toanalyze routinely up to 10% TDS and even up to30% for simple salt solutions. Although the analysisof 0.5% TDS for ICP-MS may be possible for alimited timescale, most chemists are happier with0.2% maximum TDS. This should be borne in mindwhen the original sample is a solid. The ultimatedetection limit for some elements in ICP-MS maynot be so impressive when expressed in the solid,compared with ICP-AES. GFAAS can cope withextremely high levels of dissolved solids.

Linear Dynamic Range (LDR)

ICP-MS can have a LDR in excess of 105. Variousmethods for extending the linear range up to 107

include de-sensitizing one of the ion lenses, use ofdetector analog mode, or use of a separate Faradaycup as a second detector. These should be usedwith caution, however, as high matrix componentconcentrations may cause problems best solved bydilution. For this reason, and because of theproblems with high levels of dissolved solids,ICP-MS should be mainly the domain of trace/ultratrace analysis. The exception to this is whenusing isotope dilution. With this technique very goodresults have been obtained with high concentrations.

GFAAS has a limited LDR of 102-103. It can be usedfor higher concentrations if a less sensitive line isselected.

Trace to major element analysis may be performedby ICP-AES because of its 105 LDR. ICP-AES isideal for analysis up to and including percentagelevels. For this reason ICP-AES, in addition toICP-MS or GFAAS, is often needed to fulfillaboratory requirements.

Precision

The short-term precision of ICP-MS is generally1-3%. This is improved routinely by use of multipleinternal standards. The longer term precision (over aperiod of hours) is still <5% RSD. The use of isotopedilution can give results of very high precision andaccuracy, although the cost can be prohibitive forroutine analysis.

ICP-AES has generally precisions of 0.3-2% RSD inthe short term and again less than 5 % RSD overseveral hours.

4

GFAAS, however, will generally have short termprecisions of 0.5-5% RSD. Longer term precision isa function of the number of graphite tube firings,rather than time.

Sample throughput

‘The ICP-MS has an incredible capacity to analyze avast number of samples for trace elements. Typicalanalysis time is less than 5 minutes/sample, for thewhole suite of required trace elements. For someapplications this may only take a couple of minutes.Consulting laboratories find the sample throughput amajor advantage.

While the speed of ICP-AES analyses will depend onwhether simultaneous or sequential instruments areused, generally this can vary from 2 to 6 minutesper sample. Simultaneous ICP-AES can be faster,typically 2 minutes/sample, but sometimes itsaccuracy can be compromised by spectralinterferences present with some types of samples(e.g. rocks).

The speed of GFAAS is typically 3-4 minutes perelement per sample (assuming 2 replicates).Automated overnight runs can be performed, andthis will improve throughput of samples.

Total sample throughput can be a major factorfavouring ICP-MS in the busy laboratory. Thefollowing examples (expressed as solutionconcentrations), will give a guide:

1. One to three elements/sample, at sub/low ppbconcentration will generally be better byGFAAS, assuming the elements of interest canbe determined by this technique.

2. 5-20 elements/sample at sub ppm-% levels willgenerally be better by ICP-AES.

3. 4 or more elements/sample at sub ppb and ppbconcentrations will generally be better byICP-MS, if the number of samples to beanalyzed is high.

Unattended operation

ICP-MS, ICP-AES and GFAAS can all operateunattended overnight, because of the modernautomated designs and the safety inherent in theuse of inert argon gas in these techniques. Forhighest productivity, overnight operation ismandatory.

Cost of ownership

The running cost of ICP-MS is more than ICP-AESbecause several components have a limited lifetimeand have to be replaced. These include theturbomolecular pumps, the sampler and skimmercones and the detector. The torch and nebulizerhave similar lifetimes for both ICP-AES and ICP-MStechniques. If ICP-AES is chosen instead of ICP-MSthe laboratory will probably require GFAAS as well.

Hence, the cost of graphite tubes for the latter hasto be taken into account. In all three techniques thecost of argon is a significant budget item, with theICP techniques requiring more than GFAAS.

Capital cost

This is always a difficult subject to quantify becauseit will depend on the amount of automation, theaccessories and the supplier. In very approximateterms, you can estimate that an ICP-AES will costtwice as much as a GFAAS and 2-3 times less thanICP-MS. It should be noted, however, that theaccessories can distort these figures considerably.

Another cost that needs to be taken into account isthat ultra trace analysis requires a clean laboratoryand ultra pure chemicals. These are not cheap.

AccessoriesBeing a very rapid sequential method, ICP-MS canutilize transient signals in multi-element mode. Thisopens the way for a host of accessories.Electrothermal vaporization, laser ablation, glowdischarge and spark ablation can obviate the needto dissolve the sample. Some accessories providethe means of separating the matrix from the sampleand/or to pre-concentrate. These include hydridegeneration, and various forms of chromatography(e.g. HPLC, ion chromatography, microcolumns).

The advantage of separation by chromatography forspeciation work has only been fully realized inICP-MS. This is due to the low concentration levelsof interest in environmental, toxicological, medicaland food samples.

Although ICP-AES can use some of the aboveaccessories, their cost and their marginaladvantages have meant that we have rarely seenmany of them routinely used.

SummaryTo advise anyone what to buy is always difficult.Look at your present and future needs, and answerthe check-list questions in table 1. This should helpyou to decide.

It should always be remembered that no techniquewill satisfy all your requirements. The techniques arecomplementary. There will always be samples whereone technique is better suited for the analysis thananother.

Table 2 shows a simplified comparison of the threetechniques. Table 3 compares detection limits.

5

References1 G.Tyler, AA or ICP - which do you choose?

Chemistry in Australia, Vol 59, No 4,pp 150-152, April 1992.

2 A.R. Date and A.L. Gray, Applications of ICP-MS, Blackie, Glasgow, UK, 1989.

3 K.E. Jarvis, A.L. Gray, and R.S. Houk,Handbook of ICP-MS, Blackie, Glasgow, UK,1992.

4 M.Thompson, J.N. Walsh, Handbook ofInductively Coupled Plasma Spectroscopy,Blackie, Glasgow, UK, 1983.

5 J.E. Cantle, Atomic Absorption Spectroscopy,Elsevier, 1982.

6 Analytical Methods for Liberty ICPSpectrometer, Varian publication 85 100938 00,Chapter 5, pp 81-82.

7 J.Olesik, Elemental Analysis Using ICP-OESand ICP-MS, Anal. Chem. Vol 63 No 1, Jan 11991 pp 12A-21A.

Table 1. Checklist of analytical requirements

1. How many samples/week?

2. What are the sample types? (steels, rocks,effluents, soils, etc)

3. What method of dissolution may be employed?

4. How many and what elements need to bedetermined?

5. What are the concentration ranges?

6. What sample volume is typically available?

7. What other options/accessories are beingconsidered? Why?

8. How important is isotope information to you?

9. How much money is available to purchase orlease costs/month?

10. What is the cost of ownership and runningcosts for the techniques to fulfil therequirements?

11. What skilled operators are available to you?

6

Table 2. Simplified comparison of ICP-MS, ICP-AES, GFAAS

ICP-MS ICP-AES Flame AAS GFAAS

Detection Excellent for Very good for Very good Excellent forlimits most elements most elements for some some elements

elements

Sample all elements 5-30 elements 15 seconds/ 4 mins/elementthroughput 2-6 min/sample /min/sample element/sample /sample

Linear dynamic 105 105 103 102

range (108 with range ext'n)

PrecisionShort term 1-3% 0.3-2% 0.1-1% 1-5%Long term (4hrs) <5%* <5%*

* precision improves with use of internal standards

InterferencesSpectral few common almost none fewChemical (matrix) moderate almost none many manyIonization minimal minimal some minimalMass effects high on low NA NA NAIsotopes yes no no no

Dissolved solids(maximum tolerable 0.1-0.4% 2-25% 0.5-3% >20%concentration)

No. of elements >75 >73 >68 >50

Sample useage low high very high very low

Semi-quantitative yes yes no noanalysis

Isotope analysis yes no no no

Routine operation easy easy easy easy

Method skill skill easy skilldevelopment required required required

Unattended yes yes no yesoperation

Combustiblegases no no yes no

Operating cost high high low medium

Capital cost very high high low medium/high

7

Table 3. Detection limit comparison (µg/L)

Element ICP-MS ICP-AES Flame AAS GFAAS

As <0.050 <20 <500 <1Al <0.010 <3 <50 <0.5Ba <0.005 <0.2 <50 <1.5Be <0.050 <0.5 <5 <0.05Bi <0.005 <20 <100 <1Cd <0.010 <3 <5 <0.03Ce <0.005 <15 <200000 NDCo <0.005 <10 <10 <0.5Cr <0.005 <10 <10 <0.15Cu <0.010 <5 <5 <0.5Gd <0.005 <5 <4000 NDHo <0.005 <1 <80 NDIn <0.010 <30 <80 <0.5La <0.005 <0.05 <4000 NDLi <0.020 <1 <5 <0.5Mn <0.005 <0.5 <5 <0.06Ni <0.005 <10 <20 <0.5Pb <0.005 <20 <20 <0.5Se <0.10 <50 <1000 <1.0Tl <0.010 <30 <40 <1.5U <0.010 <30 <100000 NDY <0.005 <0.5 <500 NDZn <0.02 <1.0 <2 <0.01

ICP-MS, ICP-AES, Flame AAS: Detection limits (defined on the basis of 3 standard deviations of theblank)

GFAAS: Sensitivity (0.0044 absorbance) measured with 20 µL of sampleND: Not determined

Varian Vista-PRO CCD Simultaneous ICP-OES

ICP-OES

Vista_PRO_Bro_12pp.qxd 8/2/02 12:48 PM Page 1

Varian ICP-MS ICP-MS

With greater ease-of-use and the highest sensitivity, Varian sets a new direction in ICP-MS.

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* Patent pending

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In high sensitivity mode,oxides such as CeOremain at <3% and can be further reducedunder normal modeconditions to <1%.

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Isotope/Species Typical Hot Plasma Performance

9Be > 50 Million cps/ppm115In > 1000 Million cps/ppm232Th > 500 Million cps/ppm

CeO+/Ce+ < 3%

Isotope/Species Typical Cool Plasma Performance

7Li > 2000 Million cps/ppm23Na > 1000 Million cps/ppm24Mg > 500 Million cps/ppm40Ca > 100 Million cps/ppm56Fe > 100 Million cps/ppm

100010010

ppm

Nor

mal

mod

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%

10010

ppb

10010ppt

10010

ppq

High

sen

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ICP-Expert switchesautomatically betweenmultiple methodcondition sets within a single sample, givingoptimum performancefor specific elementsuites, without havingto rerun samples.

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Ensuring the quality of your data is simple.Whether you’reanalyzing a checkstandard with eachbatch or a range ofblanks, quality controls,spikes and duplicates,ICP-Expert’s QualityControl Protocols canbe customized to yourneeds. The softwareincludes compatiblemethods for US EPA6020, 200.8 and 1638.

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Varian, Inc. serving worldwide markets in:AgricultureBasic ChemicalBiotechnologyClinicalElectronicsEnvironmentalPhotonicsToxicologyPharmaceuticalFood and BeverageMetals and MiningPetroleum and Petrochemical

C E R T I F I E D

Q U A L I T Y S Y S T E M

All trademarks are the property of their respective owners.

Specifications subject to changewithout notice.

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Vista-PRO ICP-OES

Varian’s patented VistaChip™ CCD ensuresVista-PRO™ is the world’s fastest ICP-OES,measuring 73 elements in just 35 seconds.When combined with a high efficiency RF generator and powerful, easy to usesoftware the Vista-PRO is quite simply theworld’s best ICP-OES.

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From tubings andnebulizers tospectrometers,applications andtechnical support,Varian offers acomplete elementalsolution for yourlaboratory.

Save time and argoncosts with simple ‘one step’ analysis from one plasma view. Unlike dual-viewsystems, with Vista-PRO, you don’t have to measure the sample twice.

Vista-PRO improvesproductivity andprecision by providingtrue simultaneousmeasurement of allelements from parts per billion topercent levels.

Cutting-edge technology for today, and tomorrowThe custom designed VistaChip CCD detector provides unparalleled advances inperformance. Combined with a compact,thermally stabilized echelle polychromator,the Varian Vista-PRO gives completeflexibility in wavelength selection to avoidspectral interferences, and increase lineardynamic range.

A built-in wavelength library features32,000 lines but you can choose any lineyou like ensuring that you meet your needsnow, and in the future.

Measure any sample type Varian’s highly efficient free-running 40 MHz RF generator with Direct SerialCoupling (DISC™), produces a robust plasmathat gives you the confidence to analyze anysample type—from brines and fusions to themost volatile organic solvents. The reliableRF generator has no moving parts and isproven in over 1000 instruments worldwide.With fast analysis and short warm-up times,Vista-PRO delivers reliability, low operatingcosts and greater uptime.

You are the ExpertVista-PRO’s ICP Expert™ software takes the guesswork out of analysis. Manual optimization is eliminated withAutoMax™, providing fast, automated,method optimization. New worksheetfeatures allow you to mathematicallycombine results for total compositionanalysis, purity calculations and extendlinear dynamic range. Add in SmartRinse™for faster sample washout, FACT™ on-linespectral deconvolution and StabilityReference Standardization for geochemicaland high salt applications, and you are the ICP Expert.

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Varian’s patented VistaChip CCD detectorfeatures unique image mapping (I-MAP™)technology. I-MAP ensures completecoverage of the echelle spectrum byarranging 70,000 pixels in uninterruptedarrays that exactly match the two-dimensional optical image. This provides full wavelength coverage from 167-785 nm.

The VistaChip CCD also features anti-blooming protection on every pixel,ensuring trace analytes can be accuratelymeasured in the presence of highconcentrations of other elements.

The unparalleled detection limits and lineardynamic range of the Vista-PRO allow one step analysis from a single plasma view.

Only Vista-PRO offers superior dynamicrange and detection limits using:

• Adaptive Integration Technology™ (AIT), an intelligent algorithm that preventsoverrange signals by adjusting themeasurement time simultaneously for each wavelength to achieve the optimumsignal-to-noise ratio.

• Triple stage Peltier cooling that providesthe ultimate in low noise performance.

• True simultaneous measurement ofbackground signals and internal standards.The VistaChip CCD improves analyticalprecision by eliminating plasma flicker noise,further lowering detection limits.

Simultaneous high resolution ICP using CCD detection

Principles of Adaptive Integration

For a replicate time of 10 seconds, AIT willaverage lots of shortreadings for a highintensity line and fewer,longer readings for lowintensity lines, providingthe optimum signal-to-noise ratio in bothcases, simultaneously.(Bottom)

The high resolutionprovided by the opticalsystem does notcompromise sensitivityas the separation of P 213.618 nm from Cu 213.598 nm shows.(Top)

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The computer optimizedechelle optical designuses fewer components,ensuring high lightthroughput and bettersignal-to-noise,detection limits andspectral resolution.

The Vista-PRO echellepolychromator isthermostatted toprovide excellent long-term stability andreduce start-up time.

Computer controlledmirrors enable theplasma viewing positionto be optimized.

The CaF2 prism cross-disperser provides excellent UV performance.

Vista-PRO provides the productivity ofsimultaneous ICP-OES.All wavelengths arecaptured in one reading without timeconsuming scanning.

The fast operationalspeed of the VistaChipreduces runningexpenses, by saving on maintenance andargon costs, as well asproviding moreaccurate sampleanalyses each day.

The patented VistaChipprovides anti-bloomingprotection on everypixel. A 1 megahertzpixel processing speedensures signalprocessing is 80 timesfaster than competitiveinstruments.

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Robust and reliable RF systems

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Varian’s ICP systems have always providedstable and accurate analytical results, even for the most challenging samples.Utilizing our established high performanceRF generator, Vista-PRO continues thistradition of excellence, offering:

• Superior plasma performance from over75% RF coupling efficiency. Directly analyzeorganic solvents and samples containinghigh levels of dissolved salts.

• Excellent long-term stability through theelimination of inefficient secondarymatching networks, and reduced waste heat.

• Higher uptime, better reliability and lowerservice costs, as there are no moving parts.

• The flexibility to easily analyze your fullrange of sample types. Varian’s compact 40 MHz free running design respondsquickly to any changes in plasma sample loading.

• Maximized reliability and serviceability, as water-cooling is eliminated.

Difficult samples made easyNo matter what the sample, the Vista-PROprovides excellent long-term stability. To achieve this, Varian created the DirectSerial Coupling (DISC) system that improvesthe transfer efficiency of RF energy into the plasma by eliminating inefficientsecondary matching networks. As a result,the Vista-PRO RF system produces a robust and stable plasma suitable for thedirect analysis of samples ranging fromorganic solvents to industrial wastes and concentrated brines. Unlike crystallocked designs, Vista-PRO’s free running RF generator responds instantly to changes in the plasma impedance forsuperior stability.

The direct aspiration of methanol for anextended period is atest of RF and sampleintroduction stability.This continuousmeasurement of arange of elements forover an hourdemonstrates theexcellent robustnessand stability of theVista-PRO.

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Linear dynamic range from parts per billion to percent levelsThe revolutionary VistaChip CCD detectorprovides full wavelength coverage from167-785 nm. Our unique MultiCal™ featurethen automatically assigns each result tothe appropriate wavelength for that result.MultiCal extends the linear range of ICP-OES analysis from parts per billion topercentage levels. Unlike dual view systems,Vista-PRO provides this linear dynamicrange without having to analyze the sampletwice. Vista-PRO provides one-step analysisfrom a single plasma view.

Automatic results confirmationOne of the greatest challenges in thelaboratory is to prove that you haveaccurate results for unknown samples.Vista-PRO’s MultiCal can help by providingautomatic on-line results confirmationthroughout the analysis. Use MultiCal tosimply monitor your results at two or morewavelengths for each element and you haveautomatic results validation. MultiCal alsooffers an extra level of data quality control,giving you confidence in the accuracy ofyour results and confirmation of freedomfrom interferences. If you are not usingMultiCal confirmation today, how can yoube sure of the accuracy of your data?

Vertical or horizontal plasma?Vista-PRO offers either optimized axiallyviewed or radially viewed plasma systems.The horizontal, axially viewed plasma is ideal for environmental and researchapplications that require excellentsensitivity, while MultiCal provides thedynamic range needed from one plasmaview. Varian’s axially viewed plasma is suitable for the routine analysis ofsamples with dissolved solids content up to 5% (or up to 25% with Varian’s HighSolids* torch).

If long term analysis of the most difficultsamples is required, the Vista-PRO radiallyviewed plasma offers the benefits of robustoperation with minimal maintenance. The radially viewed plasma is verticallyoriented, providing immediate venting of exhaust vapors for reduced injector tube blockage and longer torch life.Vertically oriented, radially viewed plasmasystems are the accepted standard in many industries including chemicalsmanufacture, salt production, wear metalsanalysis, petrochemical production andprecious metals refining. Dual view plasmasystems, which feature horizontal torches,cannot match the rugged, high dissolvedsalts performance of the Vista-PRO radial system.

* patent pending

Element Wavelength 3σ Detection Limits (µg/L)(nm) Vista-PRO Vista-PRO

Radial Axial

Ag 328.068 1 0.3Al 167.016 0.9 0.2As 188.979 5 1.5Au 267.595 5 1.0B 249.773 0.6 0.1Ba 455.403 0.15 0.03Be 234.861 0.05 0.01Bi 223.061 6 2Ca 396.847 0.06 0.01Cd 214.438 0.6 0.05Ce 418.660 2 2Co 238.892 1 0.2Cr 267.716 0.9 0.15Cu 327.396 1 0.3Fe 259.940 0.8 0.1K 766.490 4 0.3Li 670.784 1 0.06Mg 279.553 0.04 0.01Mn 257.610 0.08 0.03Mo 202.030 2 0.5Na 589.592 2 0.15Ni 231.604 1.4 0.3P 177.432 5 2Pb 220.353 5 0.8S 181.971 10 5Sb 231.147 5 2Se 196.026 6 2Si 251.611 2.2 1.4Sr 407.771 0.05 0.01Ti 334.941 0.2 0.1Tl 190.790 6 2V 292.402 0.7 0.2W 207.911 3.5 2Zn 213.856 0.8 0.2Zr 343.823 0.9 0.3

One-step analysis from one plasma view

The advantages ofMultiCal: shown is Ca calibrated usingboth the 315.887 and370.602 nm lines withan axial Vista-PRO. The wavelengths arecalibrated to 100 mg/Land 1000 mg/Lrespectively, providingextended lineardynamic range anddetection limits fromone plasma view.

The accuracy of theresults is verified by theContinuing CalibrationVerification (CCV)results. The firstcolumn combines theresults from the twowavelengths to providethe mean final result.

3 sigma detection limits of Vista-PRO radial andaxial radial instruments using 30 s integration time

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With ICP Expert, you are the Expert

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ICP Expert software for the Vista-PRO is themost capable ICP software ever developed.Use its multi-tasking capabilities toreprocess results from yesterday’s analyses,whilst collecting results for today’s samples.ICP-Expert software is compatible withMicrosoft Windows® 98, Windows NT4 andWindows 2000, ensuring it is suitable forany laboratory computing environment.

The intuitive interface of ICP Expert islogically organized for easy navigation anduse. With ICP Expert you can become anexpert user quickly, with wizards that guideyou through common operations and avideo help system that shows you how todo everything from setting up a method to changing an accessory.

ICP Expert is compatible with Varian’scomplete range of ICP spectrometers and features unmatched softwarecapabilities, including:

• Powerful reporting features that enable you to export to spreadsheets for trendanalysis and process monitoring, and toHTML formats for web access compatibility.

• Full retrospective editing that allows you to mask replicates or standards, correctstandard concentrations, try alternativecalibration algorithms and adjust yourchoice of background correction.

• The capability to mathematically combine results for different elements or wavelengths, and to provide automatic calibration range verification. This facility is ideal for manufacturers of metals, chemicals and pharmaceuticalsseeking total composition analysis, purity calculations or elemental ratios.

• Complete units’ conversion facilities andelement reporting in molecular forms suchas KCl or NaCl.

• Stability Reference Standardization (SRS),which provides periodic referencing to astandard reference material for the ultimatein analytical accuracy. SRS is ideal forgeochemical and high salt content samplesand when internal standard elementscannot be used.

• Extensive Quality Control Protocols (QCP)that can be easily modified to suit yourlaboratory’s QC system.

• A unique time resolved signal mode that enables you to couple the Vista-PRO to an HPLC for fast speciation andseparation applications.

• Compliance to the US FDA’s 21 CFR Part 11 requirements for audit trails,electronic signatures and access privileges(optional software).

The ICP Expert onlinehelp includes videoinstructions onhardware setup androutine maintenanceprocedures.

Need help? Join PlasmaNet™,Varian’s online ICP user email forum.

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Varian’s patented Fast Automated Curve-fitting Techniqueprovides real timespectral deconvolutionwith no time penalty.FACT improvesanalytical accuracy bysolving spectralinterference problemsin difficult samples.Best of all, if yoususpect a spectralinterference in youranalysis, you can apply FACT after theanalysis has finished.

As shown here FACTeasily handles theresolution of thedifficult Fe interferenceon Cd at 214.438 nm.Shown are:a. the unresolvedspectrum from a soil sampleb. the FACT model of the interference(500 mg/L Fe)c. the FACTdeconvolution of theCd analyte

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We take pride in Vista-PRO’s performance

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Ag 328.068 2.3 2.2 ±0.3As 188.979 83.5 82.1 ±1.2Ba 233.527 46.6 49.6 ±3.1Be 265.045 23.1 23.1 ±2.2Cd 226.502 12.1 12.2 ±1.0Co 228.616 21.5 23.5 ±0.8Mn 257.610 35.7 35.1 ±2.2Mo 202.030 100.0 104.3 ±1.0Ni 231.604 58.0 60.6 ±7.3Pb 220.353 32.7 35.3 ±0.9V 292.402 28.1 31.4 ±2.8

Element Wavelength (nm)

Measured (µg/L)

Certified (µg/L)

Analysis of NIST SRM 1643c Water

Today, busy laboratories are expected to be both centres of analytical excellence and profitability. Providing excellent long-term stability and plasma robustness,Varian’s Vista-PRO is perfect for achievingthese goals. The long-term stability offered by the Vista-PRO results in greaterproductivity and profits for your laboratorydue to less downtime and maintenancecosts. The superior stability of the Vista-PROreduces the need for recalibration, therebyreducing running costs and maximizing thethroughput of samples per hour.

With Vista-PRO you can confidently analyzeany sample, from the highest dissolvedsolids to the most volatile organic solvents,simply and accurately.

The Vista-PRO axialinstrument offers one-step analysis fromone plasma view. Soil digest analyses are easily andaccurately performed.Varian’s MultiCal givesaccurate recoveriesfrom parts per billionto sub-percentagelevels, such as theexcellent recovery for 650 mg/L of Alshown. (Right)

As 188.979 6.0 6.3Ba 233.527 6.6 7.0Cd 214.438 0.2 0.2Co 228.616 0.07 0.1Cu 324.754 3.1 3.0Zn 206.200 68.8 70.0Fe 260.709 348.0 350.0Al 257.510 649.0 650.0K 766.490 221.0 210.0

Element Wavelength (nm)

Measured (mg/L)

Certified (mg/L)

Analysis of Soil Digest

With Varian’s uniquehigh solids torch, the axial Vista-PROshows excellentstability for the directaspiration of 25%sodium chloride over24 hours. (Top)

The stability ofelements in kerosenedirectly aspirated for 8 hours with nointernal standardizationis shown. (Bottom)

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Sample introduction systems for every analytical challenge

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Every analysis presents its own uniquechallenges. Varian’s comprehensive range of sample introduction components allowsyou to tailor your ICP to achieve the best,most accurate results as quickly as possible.

Varian’s sample introduction systems areeasy to mix and match for your specificapplication. For high dissolved solidsapplications choose our high solids torchwith Twister™ spraychamber and Seaspray™nebulizer. For volatile organic solvents you can rapidly change to our fully or semi-demountable torches with our water-cooled glass spraychamber foroptimum performance.

The benefits of Varian’s sample introductionsystems include:

• A wide choice for ultimate flexibility

• Easy, fast set-up and changeover

• Dedicated systems for unique applications

• Fast delivery

SafetyIt is Varian’s policy to manufacture safeproducts and to meet all legal requirementsgoverning the design, manufacture and sale of safe products. As with all similarproducts, some or all of the followinghazards may be present: high temperatures,high pressure gases, explosive gases,magnetic and radio frequency radiation, UV and visible light and electricity. Each product is designed to protectoperators from potential hazards. Varian supplies instructions that describethe correct procedures for the operation and maintenance of each product.

The Vista-PRO series Inductively CoupledPlasma Optical Emission Spectrometer isdesigned to be used to determine the levelsof trace and major elements.

Vista-PRO is certifiedto comply with therequirements of theEMC and LV directivesof the European Union.

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Varian, Inc. is committed to a process of continuousimprovement whichdemands that weunderstand and then meetor exceed the needs andexpectations of ourcustomers—both inside and outside the company—in everything we do.

Varian, Inc. • www.varianinc.com• North America 800.926.3000, 1.925.939.2400• Europe The Netherlands 31.11.867.1000• Asia Pacific Australia 613.9560.7133• Latin America Brazil 55.11.3845.0444• China 86.21.6375.6969• Japan 81.3.5232.1239• Korea 82.2.3452.2452• Taiwan 886.22.698.9555• India 91.22.857.0181Other sales offices and dealers throughout the world

8510166200 2/02 Printed in Australia

• Varian Sales and Dealer Offices

GC • LC • MS • AAS • UV-Vis-NIR • Fluorescence • Dissolution • NMR • Analytical Supplies

Varian, Inc. serving worldwide markets in:AgricultureBasic ChemicalBiotechnologyClinicalElectronicsEnvironmentalPhotonicsToxicologyPharmaceuticalFood and BeverageMetals and MiningPetroleum and Petrochemical

C E R T I F I E D

Q U A L I T Y S Y S T E M

All trademarks are the property of their respective owners.

Specifications subject to changewithout notice.

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