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Industrial Testing Education at Undergraduate Level: A Datasheet and Diagnosis Labs Approach
EWME2010
Béatrice Pradarelli / Laurent Latorre / Pascal Nouet
TRCC
Outline
• Introduction to CNFM/CRTC
• Labs oriented approach for industrial testing education of undergraduate students
• Future Developments
CNFM
National Comity for Education in Nano and
Microelectronics
EWME2010
Micro/Nano-electronic industry CNFM centers
RENATER Network
CNFM Network
• Created 25 years ago to answer to the need of sharing high cost equipments (tester, cleaning room, …) for education
• Sponsored by French government & micro/nano electronic industry
• 12 CNFM centers strategically located
CNFM Missions
• To share equipments dedicated to IC manufacturing and characterization, prototyping, test of IC and SIP/SOC products and design automation tools
• To offer dedicated trainings to academic people (students and teachers)
• To develop collaborations with research labs and companies to promote innovation
CRTC: CNFM Test Resource Center
• Public organization, created in 1998, specialized in the test of microelectronic products. Located in Montpellier, south of FRANCE.
• Owner of an industrial tester, the Verigy V93K PinScale:
• Used for Education at undergraduate and L, M, D levels. • Used for test engineering services (test time, support, consulting) to companies & research labs• Accessible from anywhere
INDUSTRIAL TESTING EDUCATIONAT UNDERGRADUATE LEVEL
EWME2010
ICs testing in Mass production
• Millions of parts (ICs) tested automatically daily
• Rooms full of test equipments (tester/handler/prober)
• Skilled technicians in charge of the overall process
CRTC Environment and Network
RemoteLogin
VNC
VERIGY_OFF2Linux
Tester
SmarTest®“Offline Mode”SSH & VNC servers
VERIGY_ONLinux
SmarTest®Online & Offline ModeSSH & VNC servers
Classroomwith Terminals
AccountServer
DEVICE UNDER TEST
Optical Link
Lab Oriented Approach
• Pedagogical Objectives
• Initiate undergraduate students to industrial testing• Guide them having a better understanding of the interaction between ICs design, manufacturing & test
Data Sheet
Test Prog.
Test Results
P F
Analysis Diagnosis
Device robustness versus design and
manufacturing
From Data Sheet to Test Program
Test Program
Data Sheet• Block diagram• Pinning• Operating conditions • Truth table• DC characteristics• AC characteristics
Test Program• Test conditions: T (°C), Vcc • Functional test• Parametric tests: Vil/Vih/Vol/Voh and leakage measurements• Timing tests: propagation delay, set
up and hold times measurements
Continuity Test
Fonctional Test
AC TestSTART DC Test
Test Results Analysis
Manufacturing, assembly verification• Industrial test concept• Protection diodes on each pad• ESD damages / wrist strap usage
Continuity Test
Functional Test
AC TestSTART DC Test
Test Results Analysis
Device behavior verification• Go/no Go test
• Test flow execution order, test strategy, cost of test
Continuity Test
Functional Test
AC TestSTART DC Test
Pass (Go)
Fail (No Go)
Fonctional Test @ f1
Fonctional Test @ f2<f1
$
$$$
Test Results Analysis
Electrical and timing parameters verification• Measured values vs data sheet ones
• Product characterization: shmoo plots
• Product robustness versus process
Continuity Test
Functional Test
AC TestSTART DC Test
ma
rgin
ma
rgin
LL UL
Failing Device
• FPGA approach to insert stuck at/delay faults
SWITCHES
MODE
DELAY
Good IC
Schematic
+
new lines
Diagnosis
• Understanding the failures and finding the root cause in the IC using the tester debugger tools
• Interaction between Test, Design, Design for Testability (DFT) and process
Sa1 S1
Summary
• CRTC test activities and organization offer test services and trainings to academic, research lab and industrial people.
• Lab oriented approach to initiate undergraduate students to industrial testing in 8 hours deployed since 2008: 50 students attended.
• Next: develop a new lab using the FPGA platform and addressing the DFT, fault simulations, SCAN test concepts
EWME2010