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ION BEAM ANALYSISION BEAM ANALYSIS
Mădălina BADEA1
Daniela Adriana LĂCĂTUŞ1
Alin Răzvan PARASCHIV1
Katarzyna ZIELIŃSKA2
Supervisor: Alexander Pavlovich KOBZEV
1 Research Center for Atomic Physics and Astrophysics,Faculty of Physics, University of Bucharest, Bucharest, Romania2 Nicolaus Copernicus University, Poland
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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Ion Beam Analysis (IBA) is based on the interaction, at both the atomic and the nuclear level, between accelerated charged particles and the bombarded material. When a charged particle moving at high speed strikes a material, it interacts with the electrons and nuclei of the material atoms, slows down and possibly deviates from its initial trajectory. This can lead to the emission of particles or radiation whose energy is characteristic of the elements which constitute the sample material.
Overview
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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Van de Graaff Accelerator
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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Parameters of the EG-5 Accelerator:Energy region: 0.9 – 3.5 MeVBeam intensity: 30 μA for H, 10 μA for HeEnergy spread: <500 eVPrecision of energy: 2 keVNumber of beam lines: 6
Van de Graaff Accelerator
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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TECHNIQUE ION BEAM SIGNAL DETECTEDRBS (Rutherford Backscattering
Spectrometry) 4He+, H+ elastically scattered ions
ERD (Elastic Recoil Detection) 4He+ recoiled target nucleiPIXE (Particle-induced X-ray
Emission) H+ X-rays
NRA (Nuclear Reaction Analysis) H+, 4He+
prompt product particles or gamma-rays
RBS ERD PIXE
backscattering
recoil
sample
IONS BEAM
Ion beam techniques
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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RBS (Rutherford Backscattering Spectrometry)
RBS demonstrates the electrostatic repulsion between high energy incident ions and target nuclei. The specimen is bombarded with a monoenergetic beam of 4He+ particles and the backscattered particles are detected.M1 M2E0
E1
M1
θ
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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The kinematic factor:
The differential cross-section of the solid angle unit:
Equations RBS
depth
Ein
Ec
Eout
sample
E0
E1
tEnergy loss:
Channel energy thickness:
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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RBS (Rutherford Backscattering Spectrometry)
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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RBS (Rutherford Backscattering Spectrometry)
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
10
RBS (Rutherford Backscattering Spectrometry)
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
11
NRA (Nuclear Reaction Analysis) is based on nuclear reactions and the analysis is performed with charged particles. NRA has demonstrated its usefulness in the study of the oxidation and deposition of hydrocarbon residue on metallic surfaces.
NRA (Nuclear Reaction Analysis)
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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ERD (Elastic Recoil Detection)
ERD is a technique for a quantitative analysis of light elements in solids. Heavy ions collide with a sample and atoms (H, He) are ejected from the sample. The incident energetic ions typically have MeV of energy, enough to kick out the atoms being struck. For ERD, the mass of the incident particle must be greater than that of the target nucleus.
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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Setup
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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ERD (Elastic Recoil Detection)
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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PIXE (Particle-induced X-ray Emission)
Particle-induced X-ray emission or proton-induced X-ray emission (PIXE) is a technique used in the determining of the elemental make-up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the x-ray part of the electromagnetic spectrum specific to an element. PIXE is a powerful yet non-destructive elemental analysis technique now used routinely in different fields of research.
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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PIXE (Particle-induced X-ray Emission)
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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PIXE (Particle-induced X-ray Emission)
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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PIXE (Particle-induced X-ray Emission)
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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Conclusions
Non-destructive methods Depths profile of elements from H to
heavier using relatively low energies (1-3 MeV)
Thickness from 1015-1019 at/cm2 High sensitivity of measurement
(precision of 5% concentration of heavy and 10% for lighter in the case of RBS; NRA precision for lighter of 1%)
PIXE exact determination of elements present in sample with extremely high accuracy
Applicable in different fields of research
2010 STUDENT PRACTICE IN JINR FIELDS OF RESEARCH – 5–25 July 2010
ION BEAM ANALYSIS – FRANK LABORATORY OF NEUTRON PHYSICS
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