LAT PROJECT DOCUMENT CHANGE NOTICE (DCN) … · 4.18 Crane Operations ... This document provides a...

FORM # LAT-FS-0012-03

DCN No.

LAT-XR-05484-01

LAT PROJECT DOCUMENT CHANGE NOTICE (DCN) SHEET 1 OF 1

ORIGINATOR: Dave Nelson PHONE: 650-926-4652 DATE: 12/15/04

CHANGE TITLE: DCN for TPS Assembly CPT/LPT Test Procedure ORG.:

DOCUMENT NUMBER TITLE NEW REV.

LAT-TD-01652 Tower Power Supply Assembly CPT/LPT Test Procedure 03

CHANGE DESCRIPTION (FROM/TO): Please see LAT-XR-05485-01 for changes to this document

REASON FOR CHANGE: To clean up some minor items

ACTION TAKEN: Change(s) included in new release DCN attached to document(s), changes to be included in next revision Other (specify):

DISPOSITION OF HARDWARE (IDENTIFY SERIAL NUMBERS): DCN DISTRIBUTION:

No hardware affected (record change only)

List S/Ns which comply already:

List S/Ns to be reworked or scrapped:

List S/Ns to be built with this change:

List S/Ns to be retested per this change:

SAFETY, COST, SCHEDULE, REQUIREMENTS IMPACT? YES NO If yes, CCB approval is required. Enter change request number:

APPROVALS DATE OTHER APPROVALS (specify): DATE

ORIGINATOR: D. Nelson (signature on file) 12/16/04

ORG. MANAGER: G. Haller (signature on file) 12/16/04

PSA- Darren Marsh (signature on file) 1/5/05

Manufacturing- R. Patterson (signature on file) 12/16/04

DCC RELEASE: Natalie Cramar (signature on file) 1/5/05 Doc. Control Level: Subsystem LAT IPO GLAST Project

DCN No: LAT-XR-05484-01

Hard copies of this document are for REFERENCE ONLY and should not be considered the latest

revision.

Document # Date effective

LAT-TD-01652-03 12/16/04

Author(s) Supersedes

D. Nelson LAT-TD-01652-02

Subsystem/Office

Electronics & DAQ Subsystem Document Title

Tower Power Supply Assembly CPT/LPT Test Procedure



revision. LAT-TD-01652-03 Page 2

CHANGE HISTORY LOG

Revision Effective Date Description of Changes

01 05/21/04 Initial Revision

02 10/28/04 Fine tuned the text and data sheet tolerances, changed Load regulation o-scope views for EM and

Flight, changed Test Board Filter Figure, made new boilerplate changes.

03 12/04/04 Corrected values in Data Sheet on page 68 (2.50 - 8.00 ms).




Table of Contents -TOC

1. SCOPE .......................................................................................................................................... 5

2. DEFINITIONS AND ACRONYMS ............................................................................................ 6

2.1 Definitions............................................................................................................................. 6

2.2 Acronyms.............................................................................................................................. 6

3. REFERENCES ............................................................................................................................. 8

3.1 Applicable Documents.......................................................................................................... 8

4. REQUIREMENTS........................................................................................................................ 9

4.1 General.................................................................................................................................. 9

4.2 Specific Test Requirements .................................................................................................. 9

4.3 Test Personnel and Descriptions......................................................................................... 11

4.4 Test Readiness Review (TRR) and Post Test Review (PTR) ............................................. 11

4.5 Environmental Conditions .................................................................................................. 11

4.6 Contamination Control........................................................................................................ 12

4.7 Handling and Transportation .............................................................................................. 12

4.8 ESD..................................................................................................................................... 12

4.9 Mate/Demate Connectors.................................................................................................... 12

4.10 Test Equipment ................................................................................................................... 12

4.11 Test Data and Review ......................................................................................................... 13

4.12 Flight Hardware Log Book ................................................................................................. 13

4.13 Nonconforming Test Data, Equipment and Software......................................................... 13

4.14 Redlines to Documents ....................................................................................................... 13

4.15 Quality Assurance............................................................................................................... 14




4.15.1 Product Assurance Requirements ............................................................................... 14

4.16 Warnings, Cautions, and Notes........................................................................................... 15

4.17 Safety .................................................................................................................................. 15

4.18 Crane Operations ................................................................................................................ 16

5. PROCEDURE............................................................................................................................. 17

5.1 Test Procedure Instructions/Information ............................................................................ 17

5.1.1 Test Prerequisites ........................................................................................................ 17

5.1.2 Test Sequence ............................................................................................................. 17

5.1.3 Test Equipment ........................................................................................................... 18

5.1.4 Participant List ............................................................................................................ 19

5.2 Test Setup............................................................................................................................ 20

5.2.1 Pre-Operation Verifications ........................................................................................ 24

5.3 Test Descriptions ................................................................................................................ 26

5.4 Subassembly Level Testing ................................................................................................ 27

5.4.1 Switching Test ............................................................................................................ 28

5.5 LPT and CPT Unit Level Test Procedures ......................................................................... 30

5.5.1 LPT Testing ................................................................................................................ 32

5.5.2 CPT Testing ................................................................................................................ 42

Appendix A (Data Sheets and Covers) ............................................................................................... 53




1. SCOPE

This test procedure verifies compliance with Tower Power Supply Specification and ICD, LAT-SS-

01281. This document provides a procedure for Performance Testing of the circuits that provide

power to the three main parts of the tower assembly. This document also tests the temperatures that

are part of the Tower Power Supply (TPS) circuits. This document provides instructions for how to

test the TPS at subassembly and box level testing.

The TPS receives regulated 28VDC power from the spacecraft bus and provides nine independent

regulated DC supply voltages to components of the Tower Assemblies via the Tower Electronics

Module (TEM). The Tower Assembly consists of the Calorimeter (CAL), Tracker (TRK), TEM, and

the CAL and TRK front end electronics circuit card assemblies (CAL-AFEE [Analog Front End

Electronics] and TRK MCM [Multi Chip Module] ).

Testing in this procedure measures the accuracy of the 1.5, 2.5, 2.6, 3.3 VDC digital and analog

output voltages, and the variable bias voltages for the CAL and TKR functions. This test measures

the voltages with input voltages of 26.0, 28.0, 30.0 and 40.00 VDC. The complete list of testing and

descriptions of the tests, see page 26.

Note: This procedure shall be considered subordinate to any Assembly and Inspection Data

Sheet (AIDS) that is used in conjunction with this testing process.




2. DEFINITIONS AND ACRONYMS

The following terms, abbreviations, and acronyms are used in this document.

2.1 Definitions

AFEE Analog Front End Electronics

A, An Analog

D, Dg Digital

Hz Hertz, unit of frequency

msec, ms millisecond, 10-3 Second

mV millivolt, 10-3 Volt

Ω ohm, unit of electrical resistance

s, sec seconds

µ 10-6

V Volt

W Watt

2.2 Acronyms

AIDS Assembly and Inspection Data Sheet

ADC Analog to Digital Converter

CAL Calorimeter

DAC Digital to Analog Converter

EGSE Electrical Ground Support Equipment

EM Engineering Model

EMI Electro Magnetic Interference

EUT Equipment Under Test

GLAST Gamma Ray Large Area Space Telescope

LAT Large Area Telescope

MCM Multi Chip Module

QAE Quality Assurance Engineer




RMS Root Mean Squared

TC Test Conductor

TEM Tower Electronics Module

TKR Tracker

TP Test Point

TPS Tower Power Supply




3. REFERENCES

The list below provides documents that are to be used as references for this procedure.

3.1 Applicable Documents

Document Number Description

SPECIFICATIONS

LAT-SS-00136 LAT Power Supplies Level IV Specification

LAT-SS-00288 Specification and ICD, Tower Electronics Module

LAT-SS-00778 LAT Environmental Specification

LAT-SS-01281 Specification and ICD, Tower Power Supply

PROCEDURES

LAT-TD-02541 Thermal Vacuum Operation Procedure

PLANS

LAT-MD-00039 Performance Assurance Implementation Plan

LAT-MD-00078 GLAST LAT System Safety Program Plan

LAT-MD-00404 LAT Contamination Control Plan

LAT-MD-00408 LAT Program Instrument Performance Verification Plan

LAT-TD-00297 LAT Electronics Test Plan

LAT-SS-00296 T & DF Test Plan

DRAWINGS

LAT-DS-02388 Circuit Card Assembly, Tower Power Supply

LAT-DS-02389 Printed Wiring Board, Tower Power Supply

LAT-DS-02390 Schematic Diagram, Tower Power Supply

LAT-DS-02939 Schematic Diagram, Tower Power Supply Tester (Test Board)

OTHER

LAT-MD-00091 GLAST Quality Manual

LAT-MD-00471 Control of Nonconforming Product

LAT-MD-00472 Corrective and Preventative Action

LAT-MD-00473 Handling, Storage, Packing, Preservation and Delivery




4. REQUIREMENTS

This section lists the requirements that shall be followed during the TEM Power supply Qualification

and Acceptance process.

4.1 General

The Performance Assurance Implementation Plan, LAT-MD-00039 shall be utilized to ensure that

the products produced by the GLAST LAT project intended for design qualification, flight and

critical ground support equipment usage meet the required levels of quality and functionality for

their intended purposes.

This document shall follow the LAT Program Instrument Performance Verification Plan LAT-MD-

00408 which details the LAT and its subsystem verification test flow.

The LAT T & DF Test Plan, LAT-TD-00296 shall be utilized to address the overall requirements at

engineering model, qualification and production level phases. This document defines the time period

from post circuit board fabrication until electronic box delivery to LAT Integration and Test.

Testing within this document shall conform to the requirements stated in LAT Performance and

Operations Test Plan LAT-MD-02730 for all testing that relates to LAT I & T.

4.2 Specific Test Requirements

This document verifies the requirements from the following:

Source Document Source Paragraph Test Paragraph Verification

LAT-SS-01281: Tower Power

Supply Specification and ICD

5.1: Functional Description 5.5.1-16 through 26 Test

LAT-SS-01281 5.1: Functional Description and

Table 1: Tower PS Electrical Specification

5.5.1-27 through 33 Test

LAT-SS-01281 Table 1: Tower PS Electrical Specification 5.5.1-34 through 37 Test

LAT-SS-01281 Derived 5.5.1-39 Test



5.5.1-40 and 42 Test



5.5.1-44 Test




Source Document Source Paragraph Test Paragraph Verification

LAT-SS-01281 Table 1: Tower PS Electrical Specification 5.5.2-2 Test



LAT-SS-01281 Not applicable (EGSE only) 5.5.2-10 and 12 Test

LAT-SS-01281 Derived 5.5.2-17 through 25 Test





4.3 Test Personnel and Descriptions

Test personnel are described in GLAST LAT Integration and Test Subsystem Test Plan, LAT-MD-

01376.

4.4 Test Readiness Review (TRR) and Post Test Review (PTR)

The TRR and PTR are organizational meetings that shall be held at the appropriate times to inform

all parties about the testing that is to be accomplished and has been completed. The TRR and PTR

meetings are defined in the GLAST LAT Integration and Test Subsystem Test Plan, LAT-MD-

01376.

4.5 Environmental Conditions

Testing performed in accordance with this document shall conform to standard environmental test

conditions unless specific test requirements within this document exist. Standard Environmental test

conditions are as follows:

• Dynamic Mechanical Conditions: No load, at rest

• Temperature: 18.3 to 25.7°C

• Atmospheric Pressure: Uncontrolled local conditions

• Humidity: 30% to 50% RH for testing when the Calorimeter or Engineering Model (EM)

Calorimeters are present. For all other testing 30% to 60% RH is required.

This document shall follow the LAT Environmental Specification, LAT-SS-00778 for all testing

where non standard environments are required. The Environmental Specification defines the

thermal, vibration and on-orbit exposure design and test environments for the LAT instrument and

its subsystems.




4.6 Contamination Control

The Contamination Control Plan defines the overall contamination control requirements necessary to

establish hardware cleanliness for the GLAST LAT program. When work is performed at SLAC,

follow LAT-MD-01386. When work is performed elsewhere, follow LAT-MD-00404.

4.7 Handling and Transportation

This document shall follow the requirements found in the Handling, Storage, Package, Preservation

and Delivery document, LAT-MD-00473. This document establishes handling, storage, packaging

and transportation practices adequate to maintain the safety, reliability and quality of SLAC LAT

flight hardware items and achieve their damage free delivery to the place and time of ultimate use.

4.8 ESD

The CAL, TKR, T & DF Contamination Control Plan and the LAT Contamination Control Plan

define the ESD requirements for the GLAST LAT program. When work is performed at SLAC

follow LAT-MD-01386. When work is performed elsewhere follow LAT-MD-00404.

4.9 Mate/Demate Connectors

This document shall follow the requirements found in the Mate and Demate Workmanship Standard

LAT-PS-04459. The mate/demate process shall be followed for each and every connector mate. This

consists of a visual inspection of the interface, cleaning if required, and proper mating techniques.

4.10 Test Equipment

This document shall follow the requirements found in the LAT Program Instrument Performance

Verification Plan, LAT-MD-00408, which defines calibration, accuracy, substitutions, etc. for the

test equipment.




4.11 Test Data and Review

This document shall follow the requirements found in the LAT Program Instrument Performance

Verification Plan, LAT-MD-00408, which defines the test data sheets and details the personnel that

reviews test data. Test data shall be recorded on the data sheets that are found in Appendix A of this

document. The data sheets and any supporting data shall use a cover sheet that is found in Appendix

A of this document.

4.12 Flight Hardware Log Book

The LAT Program Instrument Performance Verification Plan, LAT-MD-00408 requires that a log of

hardware installation, software installation, power ON and mates/demates to flight connectors shall

be kept for each flight unit. The log book is part of the package that is deliverable to the customer.

4.13 Nonconforming Test Data, Equipment and Software

This document shall follow the requirements found in the Control of Nonconforming Product, LAT-

MD-00471. This document establishes methods to identify and control nonconforming product

developed by the LAT project team.

4.14 Redlines to Documents

The users of this document shall follow the requirements found in the Requirements for Creating and

Using Redlines for GLAST LAT Documents and Drawings, LAT-MD-03474.




4.15 Quality Assurance

This document shall follow the requirements found in the Corrective and Preventative Action

document, LAT-MD-00472 and the GLAST Quality Manual, LAT-MD-00091 and LAT Program

Instrument Performance Verification Plan, LAT-MD-00408.

The Corrective and Preventative Action document establishes the method to be used to initiate,

implement, evaluate and record corrective and preventive actions. The GLAST Quality Manual

defines the methods implemented by the GLAST LAT project to ensure consistent quality of all

processes for procurement, design, development and production of flight hardware, flight software,

calibration and all associated ground support equipment interfacing with flight hardware and

software. The LAT Program Instrument Performance Verification Plan defines test configuration,

data sheets and review of test results.

4.15.1 Product Assurance Requirements

The Quality Assurance Engineer (QAE) shall witness the initial test setup and validation operations.

In the event of a failure a Non Conformance Report (NCR) shall be written. The root cause and

corrective action shall be identified and there shall be QAE approval before the operation is

continued. Any deviation from this document requires approval from the QAE as well as the Test

Conductor (TC).




4.16 Warnings, Cautions, and Notes

The following SAFETY ALERTS are intended to create awareness of the potential safety hazards

and the steps that must be taken to avoid accidents. These same alerts are used throughout this

document to identify specific hazards that may endanger personnel and/or equipment.

Identification of every conceivable hazardous situation is impossible. Therefore, all personnel have

the responsibility to diligently exercise safe practices whenever exposed to this equipment.

WARNING: Indicates a potential hazardous situation which, if not avoided, could result in

death or injury.

CAUTION: Indicates a potential hazardous situation which, if not avoided, could result in damage

to equipment.

Note: Indicates a notification of information that is important, but not hazard related.

4.17 Safety

This document shall follow the requirements found in the GLAST LAT System Safety Program

Plan, LAT-MD-00078. This document defines all phases of the LAT program including: design,

development, fabrication, handling, transportation, storage, test, assembly and operation.

WARNING: When high voltages are present extreme care should be exercised.




4.18 Crane Operations

Before a crane (or any lifting device) is used it should be verified that the proof loading is current

and the expected load to be lifted does not exceed the load capacity of the device. The operator shall

have a current certification for the operation.

There shall be three people present before, during and at the completion of all lifting operations.

Each one of these people shall perform only one of the following three duties:

• Crane Operator – When the crane operator controls the crane no other duties shall be

performed. At other times this person may help with the mechanical or electrical duties.

• Spotter – During the lifting operation this person guides the item that is to be moved up or

down, checks clearances and the overall movement of all items. At other times this person

may help with the mechanical or electrical duties.

• Safety Person (for crane operations only) – Before lifting the item, this person double checks

all operations and the removal of bolts/hardware from the item to be moved. During crane

operations this person is an observer of the operation and directs the overall lifting operation.




5. PROCEDURE

This procedure is used for Performance Testing of the circuits that provide power to the three main

parts of the tower assembly. This document also tests the temperatures that are part of the TPS

circuits.

Unless otherwise noted use a DVM for all measurements. Some measurements require the use of an

oscilloscope or a true Root Mean Squared (RMS) volt meter.

Note: When performing measurements with a DMM connect the negative lead first.

5.1 Test Procedure Instructions/Information

This section provides the general instructions and information that is used and required to perform

this procedure, including: test parameters, sequence, equipment and Test Participants.

5.1.1 Test Prerequisites

This section describes processes and procedures that must be completed prior to performing the tests

in this document.

• TPS Electrical Interface Continuity and Isolation Test (EICIT): LAT-TD-04090

• TPS Stray Voltage Test (SVT): LAT-TD-04849

• TPS Interface Verification Test (SVT): LAT-TD-04098

• Safe Process for TPS Electrical Ground Support Equipment (EGSE) Validation:

LAT-TD-04080

5.1.2 Test Sequence

This section describes the requirements of the event sequence for performing this procedure. Tests

are to be performed in the order listed in this document unless otherwise specified. It is permissible

for Assembly Instruction Data Sheets (AIDS) to be used to change the order of tests or select a

single test paragraph to be performed. In that case, the data sheet for the test performed will be

included in the end item data package linked to the AIDS step that required it. Test sequencing can

also be changed in a TRR and black lined into the test procedure.




5.1.3 Test Equipment

The test equipment listed below is necessary for the tests described in this procedure. If additional

equipment is used, please add it to the table below with the signature of the TC and QAE, and

proceed with the test.

5.1.3.1 EGSE

To record the test equipment, cables, connector savers and software:

1. Record the information for all equipment on the data sheet. See the list below for descriptions

of the information to be recorded.

• Description and Manufacturer

• Model/LAT number (Data Logger and cards, etc)

• Serial/Revision number (for equipment, files and software)

• Calibration due date (enter NA for non calibrated equipment)

• Validation completion date for all EGSE

The table below lists the major pieces of equipment required to perform this procedure.

Test Equipment Description/Manufacturer Model/LAT Number Oscilloscope, Tektronix 220

Digital Voltmeter, Fluke 87-III

Power Supply (min. 26.0V to 40.0V capability), BK Precision 1697

True RMS Volt Meter, Agilent (HP) 3400A

TPS Test Board, SLAC LAT-DS-02938

VME crate, Dawn VME Products VMESC5

VME, TST-STP Trans card, SLAC LAT-DS-00999

VME SBC MVME2304 card, Motorola MVME2304-0123

VME SBC VMESC5 card, Dawn VME Products VMESC5

VME LCB Mezzanine card, SLAC LAT-TD-00860

PC (local PC, provided by I&T), Dell




Test Equipment Description/Manufacturer Model/LAT Number LCB Transition board cable, SLAC LAT-DS-03247

28 Volt supply cable, SLAC LAT-DS-03246

VME to test board cable (3 required), SLAC LAT-DS-03245

Filter assembly, SLAC LAT-DS-04767

78 Pin jumper cable, SLAC LAT-DS-03244

CAT5 Ethernet cable TRD855PL-50

RS-232 Cable TDC003-7 (RECO98M connectors)

CAT6 Crossover cable TB-4F7036

The figure below shows the layout of the test boards test points, jumpers, LEDs and connectors.

D2, D3 and D4LEDs J2 J1

TP1 to TP29

D5 to D11LEDs

J4

JP1 to JP8

Jumpers

J3 J5

Figure 1. TPS Test Board Layout 5.1.4 Participant List

This section provides a data sheet to record test participants.

1. Record all test participants in the data sheet.




5.2 Test Setup

The Figure below is a block diagram of the TPS test setup.

TPS

Test/Load Board

PowerSupply

VMELocal PC

O-Scope

True RMS Volt Meter

DVM

Figure 2. TPS Test Setup Block Diagram




5.2 Test Setup (continued)

The Figure below shows the test configuration of the equipment, cables and connections for testing.

VME

LAT-DS-03245

LAT-DS-03245

DC Power Supply

(+)

(-)

Local network connectionLocal PC

Slot 0SBC MVME 2304 Card

10/100Base

Debug

To LCBEVENT

To LCBCMD

LAT-DS-03247

Serial port connection and adapter

LAT-DS-03246

J1

J2

J3

Test BoardLAT-DS-02938

LAT-DS-03245

P2

P2

P2

TPSEquipment under test

LAT-DS-03244Test board pigtail

True RMS Volt Meter

O-Scope

DVM

This equipment is used for taking measurements at test points on the test board as called out by the procedure.

TPS pigtail TPS pigtail

J5

J4

J3

J6

J2

P1

P1

P2

J2

J1

J1

J2

Off the shelf test leads

LAT-DS-04767Filter Assy.

LCB Mezzanine CardLAT-TD-00860

Slot 4 TST-STP Trans CardLAT-DS-00999

J20

P1

P1

J18P1

J19

Dawn VMEModel VMESC5 card

190 Ohm >1 Watt resistor, provides a soft ground.

Power In J1J2 Power Out

J1 Power In Power Out J2

TDC003-7,(RECO98M Connectors)

RS-232 Cable

TRD855PL-50CAT5 Ethernet

TDC003-7,(RECO98M Connectors)

RS-232 Cable

Network card

CAT6 Crossover Cable

Note: For Network connection use a) Local network connection or b) Crossover cable.

Figure 3. Test Setup Interconnection Diagram

Note: The TPS board and TPS box have different labeling for J1 and J2.





The Figure below shows the external power supply that is used in this document.

RecallProg.

EnterClear

Output Switch condition indicator

Shift

O/P on/off

RS-232/485 Lock/Unlock

Figure 4. External Power Supply





The Figure below shows the RMS volt meter and the filter assembly that is used on the TPS Noise

test section of this document.

Figure 5. True RMS Volt Meter and Filter Test Setup




5.2.1 Pre-Operation Verifications

This section details the pre-operation verification checks before testing the EUT.

To perform the pre-operation verification checks:

CAUTION: Follow ESD processes during this checkout.

Note: Prior to the connection of any hardware to other electronics, it shall be verified that

all power supplies, signal generators, VME racks, and any other test and

measurement equipment shall be connected to the same AC ground. The simplest

way to do this is to connect all AC-powered equipment to the same power strip. In

cases where this is not practical (e.g. possibly a thermal-vacuum test), greater care

must be taken to ensure there are no floating grounds since this would represent a

hazard to the electronics.

Note: Leave all connector savers in place until the actual flight mate is to be made. The

AIDS provides authorization to install and remove connector savers.

Note: All flight mates and demates must be completed and entered into the mate demate log

before measurements are made or testing can start.

1. Notify QAE that testing is expected to start, so the QAE can arrange to be present for the

setup and start of testing. Record per the data sheet.

2. Verify that the Test Readiness Review has concluded and all parties have signed the cover

sheet. Record per the data sheet.

3. Record the serial numbers and locations per the data sheet.

4. Turn off the LAT or the EGSE power. Record in the data sheet.

5. Set the DMM to the auto-ranging setting. Record in the data sheet.

6. Measure DMM lead resistance by connecting the two leads together. Record in the data sheet.




7. Measure the resistance between the EUT chassis and technical ground. Record in the data

sheet.

8. Measure the resistance between the test equipment chassis and technical ground. Record in

the data sheet.

9. Verify connector savers are on all flight hardware (install the connector savers per

authorization from an AIDS if necessary). Record in the data sheet.

10. Verify that the test equipment and participant lists have been completed.




5.3 Test Descriptions

Types of tests that are performed on the Equipment Under Test (EUT) in this procedure are in the

following three groups:

Subassembly (only) level tests:

• Switching Filter Test (100% load) – Checks the wave form of the 28.0 volt power input line

just after a filter that is designed to prevent TPS board noise from propagating back to the

spacecraft.

LPT testing:

• Voltage and Current Measurements (10% load) – Measures the voltages and currents.

• CAL and TKR on/off Control (10% load) – Verifies the operation of the CAL and TKR

control circuits.

• Ripple Voltage (100% load) – Measures the conducted EMI of the unit.

• Load Regulation – Tests the ability to maintain a constant output voltage with changes in

load (loads at 100% and 150%).

• Efficiency Ratio (100% load) – Compares the power input of the unit vs. the power output of

the unit.

CPT Testing:

• Line Regulation (100% load) – Tests the ability to maintain a constant output voltage with

varied line input voltages. The input voltage settings are 26.0, 28.0, 30.0 and 40.0.

• Margin Bias – Checks that the TEM, TKR and CAL voltages are stable at 100% load. For

Flight unit testing, the margin tests are not run.

• Load Response Transient (an oscillator switches between 10 and 100% loads) – Verifies

when a load is applied that the peak to peak transients are within the required levels.

• TPS Noise (100% load) – Verifies noise over a frequency of 1KHz-1MHz.

Note: CPT testing contains information on testing the EM and Flight units




5.4 Subassembly Level Testing

This section provides the instructions for testing the TPS that is done only at the subassembly level.

The Limited Performance Test (LPT) portion of the test is run using the box level procedure and the

Comprehensive Performance Test (CPT) is run using the box level. The LPT portion contains the

setup process. The process for subassembly level testing is as follows:

• Run the LPT from Para 5.5.1.

• Run the Switching test Para 5.4.1.

• Run the CPT from Para 5.5.2.




5.4.1 Switching Test

Switching Test (wave form, after the filter):

1. Run the LPT testing Para 5.5.1.

Note: Only perform the LPT testing. When the LPT testing is complete continue with step

2. The LPT testing includes the setup procedure for the test.

Note: After the LPT test is complete, the setup is left on set with the 100% (nominal) load.

2. Connect an O-scope to the test points (at the TPS on the side of Q12 & ground) per the Figure

below (the connections are made directly on the unit under test).

ComponentQ12

TPS Ground

Full View Close-up

Figure 6. Test Board Filter Test Points




5.4.1 Switching Test (continued)

3. View and verify that the data is good. The Figure below is an example of how the signal after

the filter should look. Record per the data sheet.

Figure 7. 28 Volt Line After the Filter

Note: Verify that the band width (20MHz) limit on the scope is in the on position.

4. Run the CPT Test Procedure from Para. 5.5.2.




5.5 LPT and CPT Unit Level Test Procedures

This procedure verifies that the TPS functions properly for the LPT and CPT tests and performs to

the levels required by the TPS specification. The LPT test portion contains the setup of the test.

Therefore when the CPT test is performed, it shall be preceded by the LPT test.

Note: Test Point 1 (TP1) is used throughout this document as the common ground for all

measurements.




5.5 LPT and CPT Unit Level Test Procedures (continued)

There are four sections in this procedure as listed below.

Setup:

• A block diagram shows the equipment needed and an interconnect diagram identifies the

cabling starting at page 20.

• A list of equipment and the model numbers is provided at page 18.

• Verify the external power supply voltage settings.

Initialization (how to turn on the equipment and configuration):

• Boot-up the computer.

• Initialize the various settings.

Functional Tests:

• Initial voltages and currents

• Baseline voltages and currents

• LEDs Illuminated

Performance tests:

• This section tests the line regulation, load regulation, noise performance, and transient

response, etc.

Calibration measurements:

• This measures and records the calibration values for the TPS under test that are used when

the TEM and TPS are later mated up as one unit. Each TPS unit has different calibration

values that are recorded with this check.

WARNING: This procedure contains high voltages that are part of the setup and care should

be taken when measurements are made.




5.5.1 LPT Testing

Setup:

1. Enter the serial numbers and the calibration due dates for all equipment per the data sheet.

2. Mate all cables and power connections per the interconnect diagram.

3. Power up the VME.

4. Power up the PC.

5. Open the “ttermpro” file located in the C:\Program Files\TeraTermProSSH\ directory.

6. Open a Command Prompt window. and startup the software for the test.

7. At the command prompt, on the C: drive, type in "TPS_Test.bat" and then enter.




8. The “TPS Test” window appears for configuring the test board and equipment.

Figure 8. TPS Test Window




5.5.1 LPT Testing (continued)

9. Disconnect the output cable (LAT-DS-03246) from the external power supply.

10. Power up the external power supply.

11. At the TPS Test window click on each of the power supply buttons to verify the voltage

output settings as listed below.

• 1.0 volt

• 28.0 volts

• 26.0 volts

• 30.0 volts

• 40.0 volts

12. Click on the “Voltage_In 1V” button to set the power supply to 1.0V.

13. Reconnect the output cable (LAT-DS-03246) to the external power supply.





Initialization:

The TPS Test GUI contains buttons that configure the following test board and external power

supply features:

• Main Power and Main off buttons – Control the power on/off condition of the external power

supply.

• Enable TPS, Disable TPS, Enable CAL, Disable CAL, Enable TKR and Disable TKR

buttons – Controls the on/off condition of the TPS, CAL and TKR functions.

• Set_CAL_HV_100, Set_CAL_HV_0, Set_TKR_HV_150 and Set_TKR_HV_0 buttons –

Controls Bias control settings for the CAL and TKR.

• Enable_90%_LD, Disable_90%_LD, Enable_50%_LD and Disable_50%_LD buttons –

Controls the 90% and 50% test loads. When all the loads disabled the test board is configured

for a 10% nominal load.

• Enable_Osc and Disable_Osc buttons – Controls the test oscillator.

• Set_Nom_Margin, Set_Low_Margin and Set_HI_Margin buttons – Controls the margin

settings.

• Read all values – This creates a list of all readings (i.e. voltages) in the command prompt

window.

14. At the TPS Test window, click on “Disable_Osc”, “Disable_90%_LD”, “Disable_50%_LD”,

“Set_CAL_HV_0”, “Set_TKR_HV_0”, “Disable CAL”, “Disable TKR”, “Disable TPS” and

“Main Off”.

Note: Upon powering on the test board, the configuration is the state it was in before it was

last powered off. Therefore all the complete configuration commands and settings

shall be performed prior to starting this test.





Functional Tests, LEDs Illuminated Verifications:

15. At the TPS Test window, click on the “Voltage_In 28V” button.

16. At the test board verify that LEDs D2 (VDD, power to the test board) and D3 (28_IN) are

illuminated. Record the values per the data sheet.

17. Monitor the external power supply current level. Record the values per the data sheet.

18. At the TPS Test window, click on the “Enable TPS” button to turn the DAC on.

19. Verify that LEDs D4 (28_OUT), D10 (TEM 2.5) and D11 (TEM 3.3) are illuminated. Record

the values per the data sheet.


21. At the TPS Test window, click on the “Enable CAL” button.

22. Verify that LEDs D5 (CAL 3.3 Analog) and D6 (CAL 3.3 digital) are illuminated. Record the

values per the data sheet.


24. At the TPS Test window, click on the “Enable TKR” button.

25. Verify that LEDs D7 (TKR 2.65 digital), D8 (TKR 2.65 analog) and D9 (TKR 1.5 analog) are

illuminated. Record the values per the data sheet.






Functional Test Point Measurements:

The command window shows the voltages for the test board, as shown in the Figure below.

Figure 9. Command Window Measurements

27. Measure the DC voltage for the 28V Current Monitor Test Point (TP2). This voltage

measurement indicates the current in this circuit. Record the values per the data sheet.

Note: TP1 is used throughout this document as the common ground for most measurements.

28. Measure the TEM high and low voltage for the TEM Current High and Low (TP4, TP5).

These voltage measurements indicate the current in this circuit. Record the values per the

data sheet.

29. Measure the TKR Bias (set to zero scale) monitors (TP6, TP10). Voltage measurement TP6

(TKR Bias Current Monitor) indicates the current in this circuit. Record the values per the

data sheet.





30. Measure the CAL Bias (set to zero scale) monitors (TP7, TP8). Voltage measurement TP7

(CAL Bias Current Monitor) indicates the current in this circuit. Record the values per the

data sheet.

31. At the TPS Test window, click on the “Set_CAL_HV_100” & “Set_TKR_HV_150” buttons.

32. Measure the TKR Bias (set to full scale) monitors (TP6, TP10). Voltage measurement TP6

(TKR Bias Current Monitor) indicates the current in this circuit. Record the values per the

data sheet.

33. Measure the CAL Bias (set to full scale) monitors (TP7, TP8) and the external power supply.

Voltage measurement TP7 (CAL Bias Current Monitor) indicates the current in this circuit.

Record the values per the data sheet.





Baseline Measurements:

34. Measure the CAL and TKR Bias voltages (TP9 & TP11). Record the values per the data

sheet.

35. Measure the CAL, TKR and TEM analog and digital voltages (TP12-TP18). Record the

values per the data sheet.

36. Measure the TEM V1 and V2 voltages (TP19-TP20). Record the values per the data sheet.

37. Measure the four temperature readings, two for the unit under test and two are simulated TEM

temperatures (TP26-TP29). Record the values per the data sheet.





Ripple Voltage Test:

38. At the TPS Test window, click on the “Enable_90%_LD” button, to set all supplies at a 100%

load.

39. Measure with an O-scope, the AC ripple voltage (TP3), it should look similar to the Figure

below. Record the values per the data sheet.

Figure 10. Ripple Sample

Note: The O-scope screen should look like the capture above and meet the requirement in

the data sheet.





Load Regulation Test:

40. Measure the nine CAL, TKR and TEM supply voltages (TP9, TP11-TP18) and current at the

external power supply. This step uses the baseline measurements to calculate the delta.


41. At the TPS Test window, click on the “Enable_50%_LD” button, to set all supplies at a 150%

load.




43. At the TPS Test window, click on the “Disable_50%_LD” buttons, to set all supplies to the

100% (nominal) load.

Efficiency Test:

44. Record the external power supply current level for the efficiency test per the data sheet.




5.5.2 CPT Testing

Line Regulation Test:

1. At the TPS Test window, click on the “Enable_90%_LD” and “Voltage_In 26V” buttons, to

set all supplies to the 100% (nominal) load and 26 input volts.
















5.5.2 CPT Testing (continued)

Margin Test:

Note: Do not run the margin tests for Flight unit testing.

8. At the TPS Test window, click on the “Enable_90%_LD” button.

9. Click on the “Set_Low_Margin” button.

10. Measure the seven CAL, TKR and TEM supply voltages (TP12-TP18) and current at the

external power supply. Record the values per the data sheet.

11. Click on the “Set_HI_Margin” button.

12. Measure the seven CAL, TKR and TEM supply voltages (TP12-TP18) and current at the

external power supply. Record the values per the data sheet.

13. Click on the “Set_Nom_Margin” button, to set the margin to nominal.





Load Response Transient Test:

14. At the TPS Test window, click on the “Disable_90%_LD” button.

15. Click on the “Enable_Osc” button.

The oscillator cycles the load in and out of a 10% to 100% load condition.

16. Connect the scope triggers to the TP9, 11-18 use CH1 and TP25 toCH2 (for all

measurements).

Note: Verify that the scope probe and scope are set at 10X for the 10X test leads.





Load Response Transient Test (continued)

The next two Figures are examples of the Engineering Model (EM) and Flight digital transients as

viewed on a scope.

Note: Use the appropriate Figure for the test being performed.

Figure 11. EM Digital Load Response Transient Test






Figure 12. Flight Digital Load Response Transient Test






The next two Figures are examples of the EM and Flight unit analog transients as viewed on a scope.

Note: Use the appropriate Figure for the test being performed.

Figure 13. EM Analog Load Response Transient Test






Figure 14. Flight Analog Load Response Transient Test






The Figure below is an example of the EM and Flight unit CAL bias transients as viewed on a scope.

Figure 15. EM and Flight CAL Bias Load Response Transient Test






The Figure below is an example of the EM and Flight unit TKR bias transients as viewed on a scope.

Figure 16. EM and Flight TKR Bias Load Response Transient Test






For this test the scope probe is connected to each of the seven voltages each in succession. The

oscillator cycles through all the circuits creating transients that are viewed at the test points. The first

measurement is made then the scope trigger is reset and then the other test points are measured.

17. View and verify that the data is good per the sample in Figure 15, for CAL Bias supply

voltage (TP9). Record per the data sheet.

18. View and verify that the data is good per the sample in Figure 16, for TKR Bias supply


19. View and verify that the data is good per the sample in Figure 13, for CAL 3.3 analog supply


20. View and verify that the data is good per the sample in Figure 11, for CAL 3.3 digital supply


21. View and verify that the data is good per the sample in Figure 11, for TKR 2.65 digital supply


22. View and verify that the data is good per the sample in Figure 13, for TKR 2.65 analog supply


23. View and verify that the data is good per the sample in Figure 13, for TKR 1.5 analog supply


24. View and verify that the data is good per the sample in Figure 13, for TEM 2.5 supply voltage

(TP17). Record per the data sheet.

25. View and verify that the data is good per the sample in Figure 13, for TEM 3.3 supply voltage

(TP18). Record per the data sheet.

26. At the TPS Test window, click on the “Disable_Osc” button.





TPS Noise Test:

27. At the TPS Test window, click on the “Enable_90%_LD” button (to set the load at 100%).

28. Measure (with the HP3400A true RMS volt meter) and record the TPS noise on all nine

voltages (including the bias voltages). Record the values per the data sheet.

29. If testing is to be continued for other units go back to LPT Para 5.5.1, step 15 and re-run this

procedure.

30. When testing is complete shut down all equipment and then disconnect the cables.




Appendix A (Data Sheets and Covers)




COVER SHEET

Program: GLAST

Procedure Number: LAT-TD-01652

Procedure Title: TPS Performance Test Procedure

Controlling Document Number:

Controlling Document Step Number:

Unit S/N:

Descriptive Comment:

TEST READINESS REVIEW COMPLETED AND APPROVED BY THE FOLLOWING:

Test Director: Date:

Quality Assurance: Date:

Test Conductor: Date:

REVIEWED AND APPROVED BY THE FOLLOWING:

Test Director: Date:

Quality Assurance: Date:

Test Conductor: Date:

Tower Power Supply (TPS) Performance Test Procedure



TEST DATA SHEET Unit S/N:

Date/Temperature:

Title: 5.1.3 Test Equipment Operator:

QA:

Para./ Step

Test Equipment Description, Manufacturer

Model/LAT Number

*Cal./Val. Date

5.1.3.1 - 1 Record Model/LAT number, Serial/Revision number, Calibration due dates and Validation date for all equipment used in

this procedure:

Oscilloscope, Tektronix 220

Digital Voltmeter, Fluke 87-III

Power Supply (min. 26.0V to 40.0V capability), BK

Precision

1697

True RMS Volt Meter, Agilent (HP) 3400A

TPS Test Board, SLAC LAT-DS-02938

VME crate, Dawn VME Products VMESC5

VME, TST-STP Trans card, SLAC LAT-DS-00999

VME SBC MVME2304 card, Motorola MVME2304-0123

VME SBC VMESC5 card, Dawn VME Products VMESC5

VME LCB Mezzanine card, SLAC LAT-TD-00860

PC (local PC, provided by I&T), Dell

LCB Transition board cable, SLAC LAT-DS-03247

28 Volt supply cable, SLAC LAT-DS-03246

VME to test board cable (3 required), SLAC LAT-DS-03245

Filter assembly, SLAC LAT-DS-04767

78 Pin jumper cable, SLAC LAT-DS-03244

CAT5 Ethernet cable TRD855PL-50

RS-232 Cable TDC003-7 (RECO98M connectors)

CAT6 Crossover cable TB-4F7036

∗ This column is used to enter the date that equipment is validated, when validated equipment is recorded in this data sheet.





Date/Temperature:

Title: 5.1.4 Participant List Operator:

QA:

Para./ Step

Title Print Name Signature

Record names of all personnel that take part in the test/operation:

5.1.4 - 1





Date:

Title: 5.2.1 Pre Operation Verifications Operator:

QA:

Para./ Step

Description Limits Unit Data

5.2 Pre-Operation Verifications -1 Notify QAE. OK OK/NG

-2 Test Readiness Review is done. OK OK/NG

Record the EUT equipment:

TEM Part number NA NA

TEM LAT Bay location NA NA

TEM Serial number NA NA

TPS Part number NA NA

TPS LAT Bay location NA NA

-3

TPS Serial number NA NA

-4 Power off the LAT or EGSE. OFF ON/OFF

-5 Set DMM to autoranging for resistance. OK OK/NG

-6 Measure DMM lead resistance. < 2.0 Ω

-7 Measure EUT to ground. < 2.0 Ω

-8 Measure equipment to ground. < 2.0 Ω

-9 All connector savers are installed on the flight connections. OK OK/NG

-10 The test equipment and participant lists have been completed. OK OK/NG




TEST DATA SHEET Unit S/N: Date/Temperature:

Paragraph: 5.4 Subassembly Level Testing Operator: QA:

Step Description Requirement Units Data

Switching Test:

<400m peak to peak Volts 5.4.1-3 Verify that the information on the scope matches the sample, the signal

after the filter (TPS EUT) at the top of Q12 (+) and the TPS ground (-) 8 to 10µ Seconds





Paragraph: 5.5.1 LPT Testing Operator: QA:


Functional Tests, LEDs Illuminated Verifications:

Verify that LED D2 is illuminated. OK OK/NG 5.5.1-16

Verify that LED D3 is illuminated. OK OK/NG

5.5.1-17 Record the external power supply current. 0.01 - 0.06 Amperage



5.5.1-19


5.5.1-20 Record the external power supply current. 0.08 – 0.13 Amperage

Verify that LED D5 is illuminated. OK OK/NG 5.5.1-22





5.5.1-25







Paragraph: 5.5.1 LPT Testing (continued) Operator: QA:


Initial Functional Test Point Measurements:

5.5.1-27 Measure and record DC voltage for the 28V Current Monitor at TP2 (+)

and TP1 (-)

(-) 0.2 – 0.0 Volts

Measure and record TEM high voltage for the TEM Current High, at

TP4 (+) and TP1 (-)

1.9 – 2.2 Volts 5.5.1-28

Measure and record TEM low voltage for the TEM Current Low, at

TP5 (+) and TP1 (-)

1.9 – 2.2 Volts

Measure and record TKR bias voltage for the TKR Bias Current

Monitor, at TP6 (+) and TP1 (-)

0.0 – 0.25 Volts 5.5.1-29

Measure and record TKR bias monitor, at TP10 (+) and TP1 (-) 0.0 – 0.1 Volts

Measure and record CAL bias for the CAL Bias Current Monitor, at

TP7 (+) and TP1 (-)

0.0 – 0.4 Volts 5.5.1-30

Measure and record CAL bias monitor, at TP8 (+) and TP1 (-) 0.0 – 0.4 Volts

Measure and record TKR bias voltage for the TKR Bias Current

Monitor, at TP6 (+) and TP1 (-)

1.3 – 1.5 Volts 5.5.1-32

Measure and record TKR bias monitor, at TP10 (+) and TP1 (-) 1.3 – 1.5 Volts

Measure and record CAL bias for the CAL Bias Current Monitor, at

TP7 (+) and TP1 (-)

0.8 – 1.1 Volts

Measure and record CAL bias monitor, at TP8 (+) and TP1 (-) 0.8 – 1.1 Volts

5.5.1-33

Record the external power supply current. 0.225- 0.325 Amps







Baseline Measurements:

Measure and record CAL Bias voltage, at TP9 (+) and TP1 (-) 80 - 100 Volts 5.5.1-34

Measure and record TKR Bias voltage, at TP11 (+) and TP1 (-) 125 – 155 Volts

Measure and record CAL 3.3 analog voltage, at TP12 (+) and TP1 (-) 3.2 – 3.465 Volts

Measure and record CAL 3.3 digital voltage, at TP13 (+) and TP1 (-) 3.2 – 3.465 Volts

Measure and record TKR 2.65 digital voltage, at TP14 (+) and TP1 (-) 2.50 – 2.80 Volts

Measure and record TKR 2.65 analog voltage, at TP15 (+) and TP1 (-) 2.50 – 2.80 Volts

Measure and record TKR 1.5 analog voltage, at TP16 (+) and TP1 (-) 1.55-1.75 Volts

Measure and record TEM 2.5 voltage, at TP17 (+) and TP1 (-) 2.4 – 2.625 Volts

5.5.1-35


Measure and record TEM V1 voltage, at TP19 (+) and TP1 (-) 3.1 – 3.36 Volts 5.5.1-36

Measure and record TEM V2 voltage, at TP20 (+) and TP1 (-) 3.1 – 3.36 Volts

Measure and record TEM T1 temperature, at TP26 (+) and TP1 (-) 1.5 – 1.7 Volts

Measure and record TEM T2 temperature, at TP27 (+) and TP1 (-) 1.5 – 1.7 Volts

Measure and record TEM PS T1 temperature, at TP28 (+) and TP1 (-) 1.3 – 1.9 Volts

5.5.1-37

Measure and record TEM PS T2 temperature, at TP29 (+) and TP1 (-) 1.3 – 1.9 Volts







Ripple Voltage:

Measure and record AC ripple voltage, at TP3 (+) and TP1 (-) on scope < 60m peak to peak Volts 5.5.1-39

Measure and record the time, at TP3 (+) and TP1 (-) on scope 8 – 11 µ Seconds

Load Regulation, at 100% load:

Measure and record the 9 supply voltages and current at the external

power supply

NA NA NA

Measure and record CAL Bias voltage, at TP9 (+) and TP1 (-) 70 – 100 Volts

Calculate the delta between measurements (TP9 step 32 – TP9 step 38) 0.0 – 10.0 Volts

Measure and record TKR Bias voltage, at TP11 (+) and TP1 (-) 105 - 145 Volts
















5.5.1-40

Record the external power supply current. 0.9 – 1.1 Amps







Load Regulation, at 150% load:


power supply

NA NA NA

Measure and record CAL Bias voltage, at TP9 (+) and TP1 (-) 65 - 105 Volts


















5.5.1-42


Efficiency Test, at 100% load:

5.5.1-44 Record the external power supply current for efficiency test 0.82 – 1.18 Amps





Paragraph: 5.5.2 CPT Testing Operator: QA:


Line Regulation Test, at 100% load:


power supply (at 26.0V input voltage)

NA NA NA



















5.5.2-2






Paragraph: 5.5.2 CPT Testing (continued) Operator: QA:


Line Regulation Test, at 100% load: (continued)

Measure and record the 9 supply voltages and current at the external power

supply (at 30.0V input voltage)

NA NA NA



















5.5.2-4








Line Regulation Test, at 100% load: (continued)

Measure and record the 9 supply voltages and current at the external power

supply (at 40.0V input voltage)

NA NA NA



















5.5.2-6








Margin Test, at 100% load:

Note: Do not run the margin tests for Flight unit testing.







5.5.2-10








5.5.2-12








Load Response Transient Test, oscillator on:

NOTE: For the Digital and analog tests, use the EM sample for the EM unit and the Flight sample for the Flight unit.

5.5.2-17 Verify that the information on the scope matches the Bias sample, CAL

Bias, scope connection CH1 at TP9 (+) and TP1 (-)

<10 peak to peak Volts

5.5.2-18 Verify that the information on the scope matches the Bias sample, TKR

Bias, scope connection CH1 at TP11 (+) and TP1 (-)

<25 peak to peak Volts

Verify that the information on the scope matches the analog sample, CAL

3.3 analog voltage, scope connection CH1 at TP12 (+) and TP1 (-)

<400m peak to peak Volts 5.5.2-19

Verify the signal settles for the required period 2.50 –8.00 ms

Verify that the information on the scope matches the digital sample, CAL

3.3 digital voltage, scope connection CH1 at TP13 (+) and TP1 (-)



Verify that the information on the scope matches the digital sample, TKR

2.65 digital voltage, scope connection CH1 at TP14 (+) and TP1 (-)

<1.75 peak to peak Volts 5.5.2-21


Verify that the information on the scope matches the analog sample, TKR




Verify that the information on the scope matches the analog sample, TKR


<1.5 peak to peak Volts 5.5.2-23


Verify that the information on the scope matches the digital sample, TEM

2.5 voltage, at scope connection CH1 TP17 (+) and TP1 (-)


Verify the signal settles for the required period <1 ms

Verify that the information on the scope matches the digital sample, TEM

3.3 voltage, scope connection CH1 at TP18 (+) and TP1 (-)


Verify the signal settles for the required period <1 ms







TPS Noise Test, at 100% load:

Measure and record CAL Bias voltage, at TP9 (+) and TP1 (-) <500µ Volts

Measure and record TKR Bias voltage, at TP11 (+) and TP1 (-) <500µ Volts

Measure and record CAL 3.3 analog voltage, at TP12 (+) and TP1 (-) <150µ Volts

Measure and record CAL 3.3 digital voltage, at TP13 (+) and TP1 (-) <200µ Volts

Measure and record TKR 2.65 digital voltage, at TP14 (+) and TP1 (-) <150µ Volts

Measure and record TKR 2.65 analog voltage, at TP15 (+) and TP1 (-) <150µ Volts

Measure and record TKR 1.5 analog voltage, at TP16 (+) and TP1 (-) <150µ Volts

Measure and record TEM 2.5 voltage, at TP17 (+) and TP1 (-) <500µ Volts

5.5.2-28

Measure and record TEM 3.3 voltage, at TP18 (+) and TP1 (-) <500µ Volts

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