Imaging & Spectroscopy @ 10 nm Spatial Resolution
Far-infrared / THz imaging &
spectroscopy < l/20000
spatial resolution
The only commercial cryogenic
near-field microscope
operating < 10 K
Real space imaging
of the local electric field
e.g. nano-antennas
Leading Experts in Nanoscale
Imaging & Spectroscopy
Synchrotron nano-
spectroscopy
Chemical
nano-ID
Nano-plasmonic
field mapping
Terahertz nano-
spectroscopy
Cryogenic
nanoscopy
Ultrafast nano-
spectroscopy
Molecular spectroscopy
@ 10 nm spatial resolution
(nano-FTIR)
Femtosecond pump-probe
spectroscopy @ 10nm
spatial resolution
IR-Synchrotron compatible
for ultra-broadband
nano-FTIR spectroscopy
MADE IN
GERMANY
neaSNOM 2019
1/7
1. AFM and near-field Imaging
▪ improved AFM detection and new build-in electronics greatly increase AFM
topography dynamic range and sensitivity.
▪ Improved Synchronization of AFM with Optical Signals.
▪ Custom developed FPGA-PCIe hardware board optimized for high-performance near-
field background suppression.
▪ Improved Near-Field Imaging Quality due to better AFM performance.
▪ Additional 2-times improved signal-to-noise ratio due to complex-data evaluation of multiple side-bands.
▪ No post-processing required anymore for optical phase, due to better physical interpretation.
▪ OPS (Optical phase stabilization) without need to re-lock anymore.
neaSNOM model 2019
System Upgrade Improvements
2/7
2. Improved nano-FTIR Spectroscopy Quality & Speed
▪ DPA (Dynamical position adjustment) enables:
- up to 7.5-times faster with 0.4 ms/pixel
- 5-10x improved signal-to-noise (speed dependent)
- up to 10 spectra/second
▪ Unprecedented data quality of nano-FTIR spectroscopy enables measurement of hyperspectral data sets: measurement of full spectroscopic signature at every pixel of imaged area. Hyperspectral imaging of a polymer monolayer is presented below.
▪ Ultrafast-pump probe measurements based on DFG broadband fs laser.
3. Improved neaSCAN software Usability and Automation
▪ Optimized workflow-based user-guided interface for fast and reliable measurements even for unexperienced users.
▪ External neaSCAN automation via LabView API (Q4/2015).
▪ 3D real-time data visualization by 3D gaming GFX engine.
▪ Full neaSCAN automation & data processing via built-in scripting & programming language.
▪ Automated one-click switch of imaging & spectroscopy;.
3/7
▪ Multi-user and measurement data management via professional SQL database.
The screenshot shows the start page of the database where on the left bar the projects can
be selected. In the center panel samples/measurement locations can be selected and
acquired data chosen from the right menu. All data can be 3D visualized and exported from
data management software sphere.
▪ Multiple Optical Beam-Path Management
- Pre-alignment of multiple beam-paths - Semi-automated beam-path configuration
4/7
▪ Automated Laser Control, Auto-focussing and Monitoring:
- Automated control and monitoring for nano-FTIR spectroscopy laser; - IR laser power measurement and control; - Laser focus auto-alignment; - Automated one-click switch of imaging & spectroscopy;
The new nano-FTIR measurement mode even allows controlling the complete functionality of
the nano-FTIR laser system via the neaSCAN user software. The modular housing supports a
power meter to check and control the available laser power for the nano-FTIR measurements.
Another important automated function in the neaSCAN
user software that enhance the usability of the microscopes
is the ‘Auto-Focussing’ capability of the software. As
highlighted in the left picture the software supports during
the workflow-guided alignment process an automated
adjustment of the laser focus to the AFM tip in order to
optimize the near-field signal. The software even supports
2D and 3D auto alignment. Particularly for unexperienced
users this function provides a huge step and support for
system operation.
The automated laser frequency-tuning & -sweep control for Imaging and Photo Thermal
Expansion (PTE) Spectroscopy enable automated sequential imaging routine. It means that
several measurements can be programmed by at pre-defined laser frequencies, locations and
having different scan size parameters.
5/7
▪ AFM auto-alignment:
- Auto-tuning of AFM cantilever from 0-1Mz; - Intelligent optimization of the AFM detection.
Further, the current neaSCAN user software supports intelligent analysis
of the AFM cantilever response with simulation of the cantilever
resonance properties. As a result, the resonance tapping frequency and
amplitude can be determined very accurately which is essential for real-
time optimization of the measurement process (signal analysis) and the
quantitative comparison of near-field measurements. Results of such an
online analysis of AFM cantilever properties (frequency, amplitude) are
highlighted in the picture below.
Detection of the AFM signal is automatically optimized, as shown in the
right side screenshot.
▪ Update Services:
- Windows 10 based with modern look and feel; - Automatic and frequent online software updates adding new features based on user feedback.
The current neaSCAN software supports frequent updates for new features. As can be seen in the
screenshots above the software is based on Windows 10.
4. New Generation Electronics
▪ Custom developed FPGA-PCIe hardware board for increase data acquisition and
analysis speed.
• 2 x ADC Inputs Extendable with up to 4x24 bit ADC inputs: All inputs with FPGA-based higher harmonic demodulation for e.g. Photocurrent-Measurements, Photoluminescence, etc.
▪ ADC inputs available without higher harmonic demodulation for e.g. Confocal Raman
Correlative Microscopy.
▪ Availability of Additional Imaging & Spectroscopy Modes:
- Infrared Point Spectroscopy (IRPS);
6/7
- Kelvin Probe Force Microscopy (KPFM);
- Photocurrent Imaging (PCI);
- AFM Contact Mode;
- 2-times faster AFM Intermittent Contact Mode;
- More measurements mode are implemented frequently based on customer
feedback.
5. Modular housing with Imaging Modules and Illumination Units
▪ Increased AFM and optical stability.
▪ Imaging and Spectroscopy Modules are more compact and robust.
▪ easy replacement of modules by magnetic three-point mounting principle.
▪ Rack for system controller and additional electronics provided.
7/7