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© November 16, 2007 Dr. Lynn Fuller Testing Devices and Sensors Page 1 Rochester Institute of Technology Microelectronic Engineering ROCHESTER INSTITUTE OF TECHNOLOGY MICROELECTRONIC ENGINEERING Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: http://people.rit.edu/~lffeee Microelectronic Engineering Rochester Institute of Technology 82 Lomb Memorial Drive Rochester, NY 14623-5604 Tel (585) 475-2035 Fax (585) 475-5041 Email: [email protected] Department webpage: http://www.microe.rit.edu 11-16-2007 Intro_Test.ppt
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Page 1: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 1

Rochester Institute of TechnologyMicroelectronic Engineering

ROCHESTER INSTITUTE OF TECHNOLOGYMICROELECTRONIC ENGINEERING

Testing of Semiconductor Devices and Sensors

Dr. Lynn Fuller Webpage: http://people.rit.edu/~lffeee Microelectronic Engineering

Rochester Institute of Technology 82 Lomb Memorial Drive Rochester, NY 14623-5604 Tel (585) 475-2035 Fax (585) 475-5041

Email: [email protected] Department webpage: http://www.microe.rit.edu

11-16-2007 Intro_Test.ppt

Page 2: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 2

Rochester Institute of TechnologyMicroelectronic Engineering

OUTLINE

IntroductionDefinition of TermsCharacterization of Electronic DevicesElectronic Device ClassificationI-V CharacteristicsTesting Resistors

Resistor Temperature SensorResistor Chemical Sensor

Testing DiodesDiode Temperature SensorDiode Light SensorDiode Light Source

Testing TransistorsBJTMOSFET

ReferencesReview Questions

Page 3: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 3

Rochester Institute of TechnologyMicroelectronic Engineering

INTRODUCTION

This is a laboratory guide that will introduce the reader to testing of semiconductor devices and sensors. Most devices are tested by measuring voltages across a device and the resulting current through a device. This can be done manually with variable voltage sources, voltmeters and current meters. A programmable test instrument called “Semiconductor Parameter Analyzer” could also be used and can provide equivalent results with easier and more flexible setup.

Page 4: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 4

Rochester Institute of TechnologyMicroelectronic Engineering

DEFINITION OF TERMS

DUT - Device Under TestOhm’s Law – Fundamental Relationship between current through

and voltage across a resistor.Charge – created by the presence or absence of electronsCurrent – movement of chargeVoltage – potential to move chargeResistor – opposition to the movement of chargeLED – Light Emitting DiodeDiode – device that allows current to flow in one direction onlyBJT – Bipolar Junction TransistorMOSFET – Metal Oxide Semiconductor Field Effect Transistor

Page 5: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 5

Rochester Institute of TechnologyMicroelectronic Engineering

CHARACTERIZATION OF ELECTRONIC DEVICES

Electronic devices are classified by their current-voltage (I-V) characteristics. The I-V characteristics could be measured experimentally or derived theoretically. The experimental approach would involve applying several voltages and measuring the corresponding current. The current vs. voltage is plotted and compared with known classifications. For example: a variable voltage supply Vs is used to apply different voltages to the Device Under Test (DUT) while a current meter (I) and Digital Multimeter(DMM) is used to measure I and V

DUTVs

I

+

-DMM

I

V

Data is collected for I and V(shown on the next page)

Page 6: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 6

Rochester Institute of TechnologyMicroelectronic Engineering

DEVICE CLASSIFICATIONS

I

V1 2 3 4

-4 -3 -2 -1

R = 1000 ohms

R = 4000 ohms

Resistors have linear I-V characteristics that go through the origin.

Battery has linear I-V characteristics with constant voltage at any current

Diode has exponentially increasing current in the first quadrant and ~ zero current in the third quadrant (until breakdown).

3.5 VoltBattery

Diode0.0040.0030.002

Resistor Symbol

RI

V -+

+

-VB

Battery Symbol

Page 7: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 7

Rochester Institute of TechnologyMicroelectronic Engineering

HP4145 – SEMICONDUCTOR PARAMETER ANALYZER

On ButtonMeasurement LED

(turns on when measurement is in progress)

Screen(Displays useful information

and options)

Data Transfer & Standby LED’s

Press the On Button to Power Up

Page 8: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 8

Rochester Institute of TechnologyMicroelectronic Engineering

RESISTOR TEST DATA

30.00320.00210.00100-1-0.001-2-0.002-3-0.003

V (volts)I (amps)

Y = mX + B0

I = slope V + 0

I = (1/R) V Ohm’s Law

I

V

Data in Table Form Data in Graph Form

1 2 3 4

-4 -3 -2 -1

-0.002-0.003-0.004

0.0040.0030.002

Slope = 0.002/2R = 1000 ohms

Page 9: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 9

Rochester Institute of TechnologyMicroelectronic Engineering

TESTING RESISTORS

Resistor I-V CharacteristicsResistor as a Light Sensor

Resistor as a Temperature SensorTesting of a Resistive Chemical Sensor

Page 10: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 10

Rochester Institute of TechnologyMicroelectronic Engineering

RESISTOR I-V CHARACTERISTICS

R = Rhos L/Wfind Rhos R= 1/1.44e-3

= 694 ohms

Page 11: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 11

Rochester Institute of TechnologyMicroelectronic Engineering

RESISTOR LIGHT RESPONSE

No lightFull light

R = ρ L/(W xj) ohms

ρ = 1/( qµnn + qµpp)

L,W,xj do not change with light, µn and µp does not change with light but can change with temperature, n and p does not change much in heavy doped semiconductors (that is, n and p is determined by doping)

Page 12: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 12

Rochester Institute of TechnologyMicroelectronic Engineering

RESISTOR TEMPERATURE RESPONSE

I

V1 2 3 4

-4 -3 -2 -1

-0.002-0.003-0.004

0.0040.0030.002

Cold

Hot

Page 13: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 13

Rochester Institute of TechnologyMicroelectronic Engineering

TESTING RESISTOR CHEMICAL SENSORS

Upper Left: Finished Sensor with chip pinsUpper Right: Close up of interdigitated gold fingers

Page 14: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 14

Rochester Institute of TechnologyMicroelectronic Engineering

COMPLETED POLYMER/CARBON BLACK RESISTORS

Mix a polymer with Carbon Black and apply a thin coating over the interdigitated gold fingers.

Page 15: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 15

Rochester Institute of TechnologyMicroelectronic Engineering

MANUAL TESTING

Micro Sensor Resistence (ohms)

0

50

100

150

200

250

300

350

400

450

500

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25

Time

Res

iste

nce

The resistance is measured using an ohmmeter. Measurements are taken every 15 seconds. Chemical fumes are presented to the sensor after 60 seconds causing an increase in resistance

time

Res

ista

nce

Page 16: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 16

Rochester Institute of TechnologyMicroelectronic Engineering

AUTOMATED TESTING

Computer controlled ohmmeter measures resistance every second for 3 min. Output is plotted versus time.

30s off, 30s on, 60s off, 30s on, 30s off

Off means no chemical vaporsOn means chemical vapor exists

Page 17: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 17

Rochester Institute of TechnologyMicroelectronic Engineering

MORE CHEMICAL SENSOR TEST RESULTS

30s off, 30s on, 60s off, 30s on, 30s off0.5 ml Acetone/ 125 ml bottle = 4000 ppmResistance goes from ~100 ohms (no vapor) to ~ 100,000 ohms (with vapor)

30s off, 30s on, 60s off, 30s on, 30s offIsopropanol ~ 10,000 ppmNo Response

Page 18: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 18

Rochester Institute of TechnologyMicroelectronic Engineering

MORE CHEMICAL SENSOR TEST RESULTS

30s off, 120s on, 60s off, 120s on, 30s off 0.1 ml Acetone/ 125 ml bottle = 800 ppmResistance goes from ~100 ohms (no vapor) to ~ 4,000 ohms (with vapor)

Sensor shows no response to 1 ppm acetone (just measurement noise)

Page 19: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 19

Rochester Institute of TechnologyMicroelectronic Engineering

DIODES - THEORY

VD

ID

1.0-

+

SYMBOL

Diodes are like check valves. Current only flows in one direction (as shown by arrow in the symbol)

Anode (p-side)

Cathode (n-side)

ID = Io [EXP( –VD/Vth) -1 ]Io is a constant eg 1E-9 AmpsVth is ~ 0.026 at room temperture

Ideal Diode Equation

ID

VD

Page 20: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 20

Rochester Institute of TechnologyMicroelectronic Engineering

TESTING DIODES

Diode I-V CharacteristicsTesting a Diode as a Temperature Sensor

Testing a Diode as a Light SensorTesting a Diode as a Light Source (LED)

Page 21: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 21

Rochester Institute of TechnologyMicroelectronic Engineering

DIODE I-V CHARACTERISTICS

Nearby N++ contact to n type substrate allows us to use the resistor as a photo diode

Page 22: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 22

Rochester Institute of TechnologyMicroelectronic Engineering

DIODE TEMPERATURE SENSOR

Compare with theoretical -2.2mV/°C

Gnd

~20Volts

Vout+-

R=22K I

Gnd

Idea is to keep the current constant and measure Vout vs T

Page 23: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 23

Rochester Institute of TechnologyMicroelectronic Engineering

DIODE TEMPERATURE TEST DATA

Temperature vs Dial Setting

0

20

40

60

80

100

120

0 1 2 3 4 5 6

Dial Setting

Tem

per

atu

re (

°C0

Diode Voltage vs Temperature

0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0 20 40 60 80 100 120

Temperature (°C)

Dio

de

Vo

ltag

e (V

olt

s)

I

V

T1T2

T1<T2

Dial Vdiode Temp0 0.6539 20

0.51

1.52 0.601 54.5

2.53 0.5747 71

3.5 0.556 834 0.543 90

4.5 0.5246 1005 0.51 108.5

Page 24: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 24

Rochester Institute of TechnologyMicroelectronic Engineering

DIODE RESPONSE TO LIGHT

No light

Full light

Medium light

~ Max Power Out

P=IV = (9.97e-6)( 0.32)=3.19µwatts

P/unit area =3.18e-6/500e-6/100e-6

= 63.8watt/m2

Page 25: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 25

Rochester Institute of TechnologyMicroelectronic Engineering

TESTING LIGHT EMITTING DIODES

VD

ID

2.0

LED

-10.0

Light

Flat

np

Light Emitting Diode -LED

- Va +

Page 26: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 26

Rochester Institute of TechnologyMicroelectronic Engineering

TESTING TRANSISTORS

Theoretical BJT I-V CharacteristicsTesting a BJT

Theoretical MOSFET I-V CharacteristicsTesting a MOSFET

Page 27: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 27

Rochester Institute of TechnologyMicroelectronic Engineering

THEORETICAL BJT I-V CHARACTERISTICS

npn

Schematic Symbol

Base - p

Collector - n

Emitter - n

10 µA increments

1 mA2 mA3 mA4 mA5 mA

7 mA8 mA9 mA

10 mA

∆IC = 5 mA

VCE

IC

6 mA

IB = 10 µA

IB = 20 µA

IB = 30 µA

Steps of base current - IB

βdc

Current Gain (Beta)Βdc = IC / IB = 5 mA / 20 µA = 250

IB = 0 µA

IC

VCE

+-IB

p nnEmitterLead

BaseLead

CollectorLead

Page 28: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 28

Rochester Institute of TechnologyMicroelectronic Engineering

DEFINITIONS

§ Bipolar Junction Transistor - (BJT) Both holes and electrons participate in the conduction of current, hence the name bipolar.

§ Minority carrier - In a p-type semiconductor electrons are the minority carrier type, in an n-type semiconductor holes are the minority carrier type.

§ Emitter - Emits minority carriers into the base region of a BJT. For example, in an NPN BJT the n-type emitter, emits electrons into the p-type base. The emitter usually has the highest doping levels of the three regions of a BJT.

§ Base - Thin region (<1µm) which is used to control the flow of minority carriers from the emitter to the collector

§ Collector - Collects the minority carriers that make it through the base from the emitter. The collector usually has the lightest doping concentrations of the three regions.

§ DC Beta ( βdc ) - The ratio of the steady-state collector current to the base current. (Current Gain)

βdc = IC / IB

Page 29: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 29

Rochester Institute of TechnologyMicroelectronic Engineering

BIPOLAR JUNCTION TRANSISTORS

Flat

12 3

Discrete Packaged BJTLabel

2N39

04

1 2 3

Bottom View

2N3904NPNGain ~200Maximum VCE = 30VMaximum IC = 800mAMaximum Power = 1.8watts

emitterbase collector

Page 30: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 30

Rochester Institute of TechnologyMicroelectronic Engineering

TESTING A BJT

VD

ID

1.0VD

ID

1.0

V

I

1.0

Base - EmitterBase - Collector

Collector to Emitter

-7.0

-7.0

Page 31: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 31

Rochester Institute of TechnologyMicroelectronic Engineering

TESTING A BJT

General purpose npn 2N3904

Page 32: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 32

Rochester Institute of TechnologyMicroelectronic Engineering

THEORETICAL MOSFET I-V CHARACTERISTICS

Id (Amps)

10-5

VgsVt

Sub Vt Slope (mV/dec)

10-410-310-2

10-1010-910-810-710-6

10-11

10-12

G

D

S

Vgs=VdsId

+

-

+Ids+Vgs

+Vds

+5+4+3+2

+Vgs

+Id

Vto

Vsub = 0

-2-1

-3 volts

G

D

S

Vgs

Id+

-Vsub

Vd = 0.1 Volt

Family of Curves

Ids vs Vgs

Subthreshold

Saturation Region Non SaturationRegion

Non SaturationRegion

Saturation Region

Page 33: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 33

Rochester Institute of TechnologyMicroelectronic Engineering

TESTING A MOSFET

Page 34: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 34

Rochester Institute of TechnologyMicroelectronic Engineering

REFERENCES

1. Dr. Fuller’s webpage http://www.rit.edu/~lffeee2. more

Page 35: Testing of Semiconductor Devices and Sensors Dr. Lynn · PDF fileTesting Devices and Sensors ... Testing of Semiconductor Devices and Sensors Dr. Lynn Fuller Webpage: ... in an n-type

© November 16, 2007 Dr. Lynn Fuller

Testing Devices and Sensors

Page 35

Rochester Institute of TechnologyMicroelectronic Engineering

REVIEW QUESTIONS

1. A 220 ohm resistor has 1.5 volts across it. The current through the resistor is a)1.5A b) 0.0068A c) 68mA d) 0.147A

2. A diode has voltage of -1.5 volts applied to it. The current isa) zero b) infinite c) 1A d) 68 mA

3. An npn BJT biased in the forward active mode has base currentof 20 µA and current gain of 150. What is the collector current?a) zero b) infinite c)300 µA d)3 mA

4. A nMOSFET has 5 volts on the gate. The transistor is:a) On b) Off c) saturated d) subthreshold

5. A diode can be used to sense temperature. If the temperature increases the voltage VD: a) increases b) decreases c) stays the same d) none of above

6. A resistor can be used to sense temperature. If the temperature increases the resistance value will: a) increases b) decreases c) stay the same d) none of above

-

+ ID

VD


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