Watts Bar, Unit 2, Attachment 31, General Atomics ...HF Conducted EN61000-4-6 (1996) 10 kHz to 200...

Attachment 31

General Atomics-Electronics Systems Inc. redacted non-proprietary document 04509050,"RM-1 000 EMC Test Report," dated April 22, 2003 (Letter Item 11)

REVISIONS

REV DESCRIPTION DATE APPROVED

25402-011 -VIA-HARA-00212-001General Atomics HARA

RM-1000 EMC Test Report (redact)

BECKTEL POWERCORPORATION I Job Number. 25402SUPPLIER DOCUMENT REVIEW STATUS

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25402-011 -VI A-HARA-00212-001General Atomics HARA


RM-1000 EMC TESTING

1. Introduction

BUSINESSSENSITIVE

This report describes the EI,,roI m netic Compatibility (EMC) testing specified by SorrentoElectronics (SE) for the RM-1000 radiation monitoring equipment. Testingreported here was conducted at Nemko USA, Inc., EMC Division in San Diego and includedrequirements for RM-1000 monitor systems of several SF nroiets- Thp q/;tpm

BUSINESS The testing took place from December 13, 2002 through January 14, 2003 and wasENSITIVE performed by Nemko EMC Test Engineers, Mike Krumweide and Ferdie Custodio. Walter

Wong, the project engineer from SE, witnessed the tests, verified the operational status ofthe Equipment Under Test (EUT) and maintained the engineering log during testing.

2. Purpose of EMC Tests

The purpose of the electromagnetic compatibility (EMC) tests was to measure levels ofconducted and radiated interference emitted from the EUT and to determine its immunity toexternal electromagnetic signals and fields. The test results were compared with thespecified limits, which were designed to accommodate sets of EMC requirements of severalprojects. The focus of this report is for compatibility to the nuclear power plant's requirementof EPRI TR-102323 "Guidelines for Electromagnetic Interference Testing of Power PlantEquipment".

sBUSINESSSENSITIVE__

The tests were intended to reveal any unacceptable susceptibility and emissior the RM-1000/detector electronics and interconnecting cables. Because the tested i detector

the testing was primarilyinene o verity adequate EMC compliance of this component. The RM-1000 detectorprocessing electronics are identical for all area and rocess monitors. Therefore, thetesting, with both the verified EMC compliance of allprocess and area monitors utilizing the RM-1000 electronic module.

3. Equipment Description

Thp Pnifinmpnt tp-,tpri wq-q n PM..Iflflf rnrinatirn mcnnitnr

IBUSINESSSENSITIVEJ Cabling to and from the

through the module multi-pin connectors.

Document 04509050Rev. - Page 2



4. Reference Documents

Test Standards:

TEST PARAMETER STANDARDS

LF Conducted 1RF Immunity MIL-STD-461E__________________________________CS-I01

HF Conducted RF Immunity EN61001-4-6(LEC 1000-4-6)

LF Radiated IRF Immunity MIL-STD-461ERS-101

HF Radiated RF Immunity EN 61000-4-3 (1995)(IEC 1000-4-3)

Surge Immunity EN 61000-4-5 (1995)(IEC 1000-4-5)EN 61000-4-4 (1995)

Electrical Fast Transient/Burst Immunity (IEC 1000-4-4)

EN 61000-4-2 (1995)

Electrostatic Discharge Immunity (IEN 1000-4-2)

LF Conducted RF Emissions MIL-STD-461ECE-101MIL-STD-461IE

HF Conducted RF Emissions CE. 2CE- 102

LF Radiated RF Emissions MIL-STD-461ERE- 101

HF Radiated RF Emissions EN 55022,Class A

EN 61000-4-8 (1994)Magnetic Field Immunity (IEC 1000-4-8)

Voltage Dips, Short Interruptions & Voltage EN 61000-4-11 (1994)Variations Immunity (IEC 1000-4- 11)

BUSINESS ITest Report (Appendix A):SENSITIVE_

Documents:

ISSUED BY NUMBER TITLE

Guidelines for Electromagnetic Interference Testing ofPower Plant Equipment

EPRI TR-102323-Rev. 2, Nov. 2000




5. Test Configuration

Refer to Figure 1 for the test configuration of the system. This configuration was designed

S ý to simulate a typical installation.

E In ^rHarrk ffnmi rl nnrrmnI oatnitirmil wcbrinftin rf thn PI1•hAr .oiris•i tfr4 rwrintinn Iun,•elBUSINES

The d detector cable assembly was connected to the Area RM-1000 module.

The ý detector cable assembly • was connected to the process RM-1I000module.

The Equipment-Under-Test (EUT) was defined as the components of the radiationmonitoring system. The following equipment is included in this list:

a. RM-1000 Radiaion Jy* 0 ulesb. Power Supply,c. ,mma Detector Assemblyd. Beta Detector Asse, Ue. Line filter/Surge suppressor,

6.BUSINESSSENSITIVE

Monitoring of EUT

A )rovided a means of monitoring the operation of the EUT durinvvas used to monitor the RM-1000

7. Operational Mode

Pre-test and post-test verification of the monitor system was performed to ensure properoperation and to establish baseline data.

The monitor equipment was placed in its normal operational condition prior to EMC testing.




BUSINESSSENSITIVE

Figure 1. RM-1000 EMC Test Configuration




8. System Modifications

1. Based on previous EMC testing, the RM-1000 design was modified to provide enhancedEMC performance as follows:

BUSINESS]SENSITIVE

BUSINESSSENSITIVE

2. Table 3 shows the location and numberimmunity tests.

of to pass specific

9. Emission Criteria

The acceptance criteria for the EUT was to demonstrate compliance with the applicableconducted and radiated RF emission limits specified in Tables 4 and 5.

10. Immunity CriteriaBUSINESSSENSITIVE 1. Equipment shall not malfunction and shall not have undesired response, degraded

performance or permanent damage when subjected to the immunity tests. A malfunctionshall be determined to be a loss of safety function, which is the ability to detect anincrease in radiation levels, and an undesired response is a false indication of excessiveradiation levels.

2. There shall be no High Alarms ), Alert Alarmsý) nor Failure Alarm generated when the system is subjected to the immunity test

transients. Additionally, these alarms shall be maintained during immunity testing whenthey existed prior to the test.

3. There shall be no variation in the Activity Level (cpm) when thesystem is subjected to the immunity tests. Based on the baseline data collected (seesection 11), Table 1 tabulated the acceptance criteria were applied to theýýreadings obtained during immunity testing.




Table 1

BUSINESSSENSITIVE

4. Failure of fuses or surge limiting protective devices during the surge immunity test will notbe deemed a failure of the EUT.

5. At the conclusion of all testing, the EUT must successfully pass a complete functionaltest.




11. Test Summary

BUSINESS Tables 4 and 5 provide the test result summaries for the =detector andSENSITIVE1 detector channels.

Appendix A contains the EMC Test Report for the RM-1000 Radiation MonitorSystem.

1. Conducted Emissions (MIL-STD-461E, CE-101 and CE-102) Testing:

These tests passed with no mitigation measures.

2. Radiated Emissions (MIL-STD-461E, RE-101) Testing:

This test passed with no mitigation measures.

3. Radiated Emissions (EN 55022, Class A) Testing:


4. Immunity Testing (General):

Baseline data was collected prior to EMC testing. Immunity test pass/fail criteria wereapplied to these nominal values. The results are as follows:

Table 2BUSINESSSENSITIVEJ

Test result criteria:

Criterion A is normal performance within the specification limits.

Criterion B is temporary degradation of performance or loss of function that is self-recoverable.

Criterion C is temporary degradation of performance or loss of function thatrequires operator intervention or system reset.

5. Radiated Field Immunity (EN61000-4-3) Testing:

A. The Area = Channel passed criterion A at




BUIESSSENSITVE

B. The Proces:

6. Electrical Fast Transient (EFT)/Burst Immunity (EN61000-4-4) Testing:

BUSINESSSENSITIVE.I

A. Ch~nnnA nn-cqim Pritfricnn A ot

Table 3

7. High-Frequency Conducted Immunity (EN61000-4-6) Testing:BUSINESS ISENSITIVE

B. The Pro




BUSINESSSENSITIVE

BUSINESSSENSITIVE

8. Surge Immunity (EN61000-4-5) Testing:

This test das2d spvpritv I•.•. t

9. Low-Frequency Conducted Immunity (MIL-STD-461E, CS-101) Testing:


10. Low-Frequency Radiated Immunity (MIL-STD-461 E, RS-1 01) Testing:


11. Magnetic Fields Immunity (EN61000-4-8) Testing:


12. Voltage Dips, Interruptions and Variations Immunity (EN61000-4-1 1) Testing:

These tests passed with no mitigation measures.

BUSINESS 13. Electrostatic Discharge Immunity (EN61000-4-2) Testing:SENSITIVE ESD test passed severity level 4 (8 kV) direct contact discharge and level

discharcie with no mitiaation measures,




12. Conclusion

BUSINESS The RM-1000 radiation monitor system with the NSENSITIVE]i llthe EMC emission and im t test requirements

The RM-1000 radiation monitor system withQjl--,ý tl I% n11M !nil f hf -.ke,,M ,.. ,:




Table 4 EMC TEST RESULTS FOR RM-1000 SYSTEM

TESTPARAMETER STANDARDS

FREQUENCYRANGE

TESTLEVEL/LIMIT

ANTENNADISTANCE

TEST RESULTS

LF ConductedImmunity

MIL-STD-461ECS-101

100 Hz to 5 kHz

5 kHz to 50 kHz

142 dBR.ANA

142 - 122 dBuA

HF Conducted EN61000-4-6 (1996) 10 kHz to 200 MHz 10 V open ckt. (unmod. rms) NAImmunity I (IEC 1000-4-6) 1 80% AM, I kHz

LF RadiatedImmunity

MIL-STD-461ERS-101

30 Hz to 60 Hz

60 Hz to 100 kHz

180 dBpT5 cm

180 - 116 dBpTt I t

HF RadiatedImmunity

EN 61000-4-3 (1998)(IEC 1000-4-3)

30 MHz to 10 GHz 10 V/meter, 80% AM,I kHz 3 meters

Surge EN 61000-4-5 (1995) NA + 2 kV common mode; NAImmunity (IEC 1000-4-5) + I kV differential mode

Power leads: + 2kVEFT/Burst EN 61000-4-4 (1995) NA NAImmunity (IEC 1000-4-4) Data/control leads: + 1 kV

Contact discharge: +±4 kVElectrostatic Discharge EN 61000-4-2 (1995) NA NA

Immunity (IEC 1000-4-2) Air discharge: + 8 kV

Magnetic Field EN 61000-4-8 (1994) 50 Hz 30 A (RMS) /meter NAImmunity (IEC 1000-4-8) 50 Hz 30 A (RMS)/meter NA

Voltage Dips, Short EN 61000-4-11 (1994) 70% for 10 ms,Interruptions & Voltage NA 40% for 100 is, NA

Variations Immunity (IEC 1000-4-11) 0 V for 5 sec

LF Conducted EmissionsMIL-STD-461ECE-101

100 Hz to I kIHzI kHz to 10 kHz

110 dBVtA110 - 90 dBuA

NA Passed:

HF Conducted Emissions MIL-STD-461E 10 kHz to 100 kHz 90 - 60 dBýiA NA Passed:CE-102 100 kHz to 10 MHz 60 - 40 dBAtA

LF Radiated Emissions MIL-STD-461E 30 Hz to 60 Hz 160 dBpT 7 cm Passed:RE-101 60 Hz to 100 kHz 160 - 96 dBpT

HF Radiated Emissions EN 55022, Class A 30 MHz to 230 MHz 40 dBjiV/meter 10 meters Passed:(Table 5) 230 MHz to I GHz 47 dBpV/meter

Cto L1

Cl)


25402-011 -V1 A-HARA-00212-001General Atomics HARA


Table 5 EMC TEST RESULTS FOR RM-1000 SYSTEMS

TESTPARAMETER STANDARDS FREQUENCY

RANGETEST

LEVEL/LIMITANTENNADISTANCE TEST RESULTS

+ 4

LF ConductedImmunity

MIL-STD-46 tECS-101

100OHz to 5kI-z

5 kHz to 50kHz

142 dBiiANA

142- 122 dBaiA

HF Conducted EN61000-4-6 (1996) 10 kHz to 200 MHz 10 V open ckt. (unmod. rms) NAImmunity (lEC 1000-4-6) 80% AM, I kHz

LF RadiatedImmunity

MIL-STD-461ERS-101

30 Hz to 60 Hz

60 Hz to 100 kHz

180 dBpT5 cm

180 - 116 dBoT+ + 4 4

HF RadiatedImmunity

EN 61000-4-3 (1998)(IEC 1000-4-3)

30 MHz to 10 GHz10 V/meter, 80% AM,1 kHz 3 meters

Surge EN 61000-4-5 (1995) NA + 2 kV common mode; NAImmunity (LEC 1000-4-5) + I kV differential mode

Power leads: + 2KvEFT/Burst EN 61000-4-4 (1995) NA NAImmunity (IEC 1000-4-4) Data/control leads: + 1 kV

Electrostatic DischargeImmunity

EN 61000-4-2 (1995)(IEC 1000-4-2)

NAContact discharge: + 4 kV

Air discharge: + 8 kVNA

+ l-Magnetic Field

ImmunityEN 61000-4-8 (1994)(IEC 1000-4-8) 50 Hz 30 A (RMS) /meter NA

Voltage Dips, Short EN 61000-4-11 (1994) 70% for 10i ms, NAInterruptions & Voltage NA 40% for 100 ms,

Variations Immunity 0 V for 5 sec

LF Conducted EmissionsMIL-STD-461ECE-101

100Hz to I kHzI kHz to 10 kHz

110 dBpA110 - 90 dBlpA

NA Passed:

HF Conducted Emissions MIL-STD-461E 10 kHz to 100 kHz 90 - 60 dBpA NA Passed:_ _ _ CE- 102 100 kHz to 10 MHz 60 - 40 dBIAtA

LF Radiated Emissions MIL-STD-461E 30 Hz to 60 Hz 160 dBpT 7 cm Passed:RE-101 60 Hz to 100 kHz 160 - 96 dBpT.

HF Radiated Emissions EN 55022, Class A 30 MHz to 230 MHz 40 dBpV/meter 10 meters Passed:(Table 5) 230 MHz to I GHz 47 dBi.tV/meter _ _ 1

mU)




APPENDIX A

Nemko EMC Test Report

No. 23-012-Ri

Dated 03/19/03

Document 04509050Rev. - Page A-1



Nemko USA, Inc.11696 Sorrento Valley Rd, Suite F

San Diego, CA 92121-1024Phone (858) 793-9911 Fax (858) 793-9914

Nemko

EMC TEST REPORT

PER EPRI TR-102323 REVISION 2

For Sorrento Electronics

Model: RM-1000

PREPARED FOR:

Sorrento Electronics4949 Greencraig LaneSan Diego, CA 92123

PREPARED ON 03/19/03

REPORT NUMBER 23-012-RI

PROJECT NUMBER 22-463-SOR

25402-011 -VI A-HARA-0021 2-001General Atomics HARA

RM-1000 EMC Test Report (redact)11696 Sorrento Valley Road, Suite F, San Diego, CA 92121

Nemko USA, Inc. FPhone (858) 793-9911 Fax (858) 793-9914DATE DOCUMENT NAME DOCUMENT# PAGE

03119103 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 2 of 89

DOCUMENT HISTORY

REVISION DATE COMMENTS

- 02/05/03 Prepared By:

- 02/14/03 Initial Release:

03/19/03 Rev. I Release

NOTE: Nemko USA, Inc. hereby makes the following statements so as to conform to Chapter 10 (Test

Reports) Requirements of ANSI C63.4 (1992) "Methods and Measurement of Radio-Noise Emissions from

Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz":

o The unit described in this report was received at Nemko USA, Inc.'s facilities on December 13,

2002. Testing was performed on the unit described in this report on December 13, 2002-

January 14, 2003.

" The Test Results reported herein apply only to the Unit actually tested, and to substantially

identical Units.

'e This test report must not be used to claim product endorsement by any Government agency.Documentclassification chan

Tm



INemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914

DATE DOCUMENT NAME DOCUMENT N PAGE

03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R1 3 of189

TABLE OF CONTENTS

DOC UM ENT HISTO RY .................................................................................................................................. 2

CERTIFICATION ................................................................. 6

1. ADMINISTRATIVE DATA AND TEST SUMMARY .................................................................... 7

.1.ADMINISTRATIVE DATA ..................................................................... 7

i .2 .TE ST SU M M A RY .............................................................................................................................................. 8

2. SYSTEM CONFIGURATION .............................................................................................................. 10

2.1 .SYSTEM COMPONENTS AND POWER CABLES ............................................................................................ 10

2.2.DEvICE INTERCONNECTION AND 1/O CABLES ............................................................................................ 10

2.3.DEsIGN MODIFICATIONS FOR COMPLIANCE ................................................... i

3. TEST FAC ILITIES ................................................................................................................................ 12

3.1 .T EST F A C ILITIES ........................................................................................................................................... 12

3.2 .G RO UN D PLA N E ............................................................................................................................................ 12

3.3.A N ECHO IC C HA M BER .................................................................................................................................... 12

3.4.D ETECTION SYSTEM ..................................................................................................................................... 13

4. DESCRIPTION OF TESTING METHODS .................................................................................... 16

4.1.T EST SET- PU P ................................................................................................................................................. 16

4 .2.T EST M O D E ................................................................................................................................................... 16

5. DESCRIPTION OF TESTING METHODS FOR COMPLIANCE ............................................... 17

5. I COND UCTED EM ISSIONS CE 10 1 .................................................................................................................... 175.2.CONDUCTED EM ISSIONS CE 102 .................................................................................................................... 19

5.3.R ADIATED EM ISSIONS RE 10 ! ...................................................................................................................... 22

5.4.CONDUCTED SUSCEPTIBILITY C S 101 ........................................................................................................... 25

5.5.RADIATED SUSCEPTIBILITY R S 101 ............................................................................................................... 30

5.6.CONFIGURATION AND METHODS OF MEASUREMENTS FOR FREQUENCY IDENTIFICATION ........................ 35

5.7.CONFIGURATION AND METHODS OF MEASUREMENTS FOR RADIATED EMISSIONS .................................... 36

5.8.STATISTICAL SAMPLING REQUIRED FOR CONTINUED COMPLIANCE ................................ 37

5.9.ELECTROSTATIC DISCHARGE IMMUNITY: I EC 1000-4-2 (1995) ............................................................... 38

5. 1 0.RADIO FREQUENCY IMMUNITY: IEC 1000-4-3 (1998) ........................................................................... 39

5.1 1.ELECTRICAL FAST TRANSIENT IMMUNITY: IEC 1000-4-4 (1995) ......................................................... 40

5.12.POWER LINE SURGE IMMUNITY: IEC 1000-4-5 (1995) ......................................................................... 41

5.13.HIGH FREQUENCY CONDUCTED COMMON MODE IMMUNITY: IEC 1000-4-6 (1996) .............................. 42

5.14.MAGNETIC FIELD IMMUNITY: IEC 1000-4-8 (1994) .............................................................................. 43

5.15.VOLTAGE DIPS AND SHORT INTERRUPTIONS: IEC 1000-4-11 (1994) .................................................... 44


RM-1000 EMC Test Report (redact)Nemko USA, Inc. t11696 Sorrento Valley Road, Suite F, San Diego, CA 92121

Phone (885) "93-99 II Fax t858) 793-9914

DATE DOCUMENT NAME DOCI IMENT# PAGE

03/19/03 Sorrento Electronics RNI-1000 CE Test Report 23-012-RI 4 of 89

6. T EST R ESULTS ..................................................................................................................................... 45

6.1 .CONDUCTED EMISSIONS TEST DATA (CE 101) ........................................................................................ 45

6.2.RADIATED EMISSIONS TEST DATA ....... ...... I ................................................................................... 48

6.3.RADIATED EMISSIONS RE 101 TEST DATA ................................................................................................ 51

6.4.RADIATED SUSCEPTIBILITY RS 101 TEST DATA ....................................................................................... 53

6.5.CONDUCTED SUSCEPTIBILITY CS 101 TEST DATA .................................................................................... 54

6.6.ELECTROSTATIC DISCHARGE IMMUNITY TEST RESULTS & TEST POINTS .................................................. 55

6.7.RADIO FREQUENCY IMMUNITY TEST RESULTS .......................................................................................... 61

6.8.ELECTRICAL FAST TRANSIENT BURST IMMUNITY TEST RESULTS ............................................................. 63

6.9.POWER LINE SURGE IMMUNITY TEST RESULTS ........................................................................................ 64

6.1 0.HF CONDUCTED COMMON MODE DISTURBANCE IMMUNITY TEST RESULTS .......................................... 65

6.11 .POWER FREQUENCY MAGNETIC FIELD IMMUNITY TEST RESULTS ......................................................... 66

6.12.VOLTAGE DIPS AND INTERRUPTIONS IMMUNITY TEST RESULTS ............................................................. 67

TEST SETUP DIAGRAMS

Figure i. CE101 Test Configuration ................................... ............... .............................. 18

Figure 2. C E 102 Test C onfiguration ................................................................................................................. 21

Figure 3. R E 101 Test C onfiguration ................................................................................................................. 24

Figure 4. CS 101 Test Configuration ........................................................................................................ 27

Figure 5. CS101 Calibration of Susceptibility Signal ................................................................................. 28

Figure 6. C S 101 Lim it W aveform .................................................................................................................... 29

Figure 7. RSIOI Test Configuration ........................................................................................................ 33

Figure 8. RSi01 Calibration Configuration ................................................................................................. 34



Nemko USA, Inc. F - Phone (858) 793-9911 Fax (858) 793-9914

DATE DOCUMENT NAME I DOCUMENT# PAGE

03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R1 5 of 89

TEST CONFIGURATION PHOTOGRAPHS

Photograph 1. General EUT Test Configuration .......................................................................................... 14

Photograph 2. ESD Test Points ........................................................................................................................ 56

Photograph 3. CE 101 Test Configuration ................................................................................................. 68

Photograph 4. CE 102 Test Configuration ................................................................................................. 69

Photograph 5. Radiated Emissions Test Configuration ............................................................................. 70

Photograph 6. Radiated Emissions RE 101 Test Configuration ................................................................ 71

Photograph 7. Radiated Susceptibility RS 101 Test Configuration ............................................................ 72

Photograph 8. Conducted Susceptibility CS 101 Test Configuration ........................................................ 73

Photograph 9. ESD Test Configuration ..................................................................................................... 74

Photograph 10. Radio Frequency Immunity Test Configuration ................................................................ 75

Photograph 11. EFT Immunity Test Configuration .................................................................................... 76

Photograph 12. Power Line Surge Immunity Test Configuration ............................................................... 77

Photograph 13. HF Conducted Immunity Test Configuration ....................................... 78

Photograph 14. Magnetic Field Immunity Test Configuration .................................................................... 79

Photograph 15. Voltage Dips/Short Interruptions Immunity Test Configuration ........................................ 80

APPENDICES

A. CONDUCTED & RADIATED EMISSIONS MEASUREMENT UNCERTAINTIES ................................................... 81

B. NEMKO USA, INC.'S TEST EQUIPMENT & FACILITIES CALIBRATION PROGRAM ........................................ 83

C. A2LA ACCREDITATION / NEMKO AUTHORIZATION ................................................................................... 85


RM-1000 EMC Test Report (redact)Nemko USA, Inc. 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121

N UPhone (858) 793-9911 Fax (858) 793-9914

DATE DOCUMENT NAME DOCUMENT# PAGE

03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 6 of 89

CERTIFICATION

The compatibility testing and this report have been prepared by Nemko USA, Inc., an independent

electromagnetic compatibility consulting and test laboratory.

As specified by document EPRI TR-102323 Revision2 and Client Test Plan, the testing and test methods were

accomplished in accordance with MIL-STD and lEC specifications.

f certify the data evaluation and equipment configuration herein to be a true and accurate representation of the

sample's immunity and emission characteristics, as of the test date(s), and for the design of the test sample

utilized to compile this report.

Ricky Hill

EMC Laboratory Supervisor



Phone (858) 793-9911 Fax (858) 793-9914DATE DOCUMENT NAME DOCUMENT PAGE

03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R! 7 of 89

1. ADMINISTRATIVE DATA AND TEST SUMMARY

1.1. Administrative Data

CLIENT: Sorrento Electronics4949 Greencraig LaneSan Diego, CA 92123(858) 522-8361(858) 522-8385- fax

CONTACT: Walter Wong

DATE (S) OF TEST:BUSINESSUSENSITIVE S EQUIPMENT UNDER TEST (EUT):

Model

Condition Upon Receipt

December 13, 2002- January 14, 2003

inadiation Monitoring System

RM-1000

Suitable for Test

TEST SPECIFICATION: Radio Frequency Emissions and Electromagnetic Immunitytests in accordance with requirements of EPRI TR-102323Revision2

Test Type In Accordance Document Title

EPRI TR-102323 Guidelines for Electromagnetic Interference Testing of

Radiated Emissions Revision2 Power Plant Equipment

Radiated Emissions MIL-STD-461 E Measurement of Electromagnetic Interference

Test RE 101 Characteristics

Conducted Emissions MIL-STD-461E Measurement of Electromagnetic Interference

Test CE 101 Characteristics

Conducted Emissions MIL-STD-46 1 E Measurement of Electromagnetic InterferenceTest CE 102 Characteristics

Radiated Susceptibility MIL-STD-4611E Measurement of Electromagnetic InterferenceTest RSIOI Characteristics

Conducted MIL-STD-461 E Requirements For The Control Of ElectromagneticSusceptibility Interference Characteristics Of Subsystems AndTest CSI01 EquipmentElectrostatic Discharge IEC 1000-4-2 (1995) Electromagnetic Compatibility for Industrial ProcessImmunity Measurement and Control Equipment Electrostatic

Discharge Requirements

Radio Frequency IEC 1000-4-3 (1998) Electromagnetic Compatibility, Basic ImmunityImmunity Standard, Radiated Radio Frequency Electromagnetic

Field, Immunity Test

Electrical Fast IEC 1000-4-4 (1995) Electromagnetic Compatibility for Industrial ProcessTransient Burst Measurement and Control Equipment Electrical FastImmunity Transient / Burst Requirements



Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914


03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R11 of 89

Test Specifications Continued:

Power Line Surge IEC 1000-4-5 (1995) Electromagnetic Compatibility, Power Line SurgeImmunity Immunity

HF Conducted IEC 1000-4-6 (1996) Electromagnetic Compatibility - Basic ImmunityImmunity Standard - Conducted Disturbances Induced By Radio-

Frequency Fields - Immunity Test

Magnetic Field IEC 1000-4-8 (1994) Electromagnetic Compatibility - Basic ImmunityImmunity Standard - Conducted Disturbances Induced By

Magnetic Fields - Immunity Test

Voltage Dips and Short IEC 1000-4-11 (1994) Electromagnetic Compatibility - Testing andInterruptions Immunity Measurement Techniques - Voltage Dips, Short

Interruptions and Voltage Variations Immunity Tests

1.2. Test Summary

1.2.1. Emissions Test Summary

Speciflication Frequency Range Compliance Status

MIL-STD-461 E, Test CE 101 Power Leads PASS

Conducted Emissions 30 Hz - 10 kHz

MIL-STD-461 E, Test CE 102 Input Power Leads PASS

Conducted Emissions 10 kHz - 10 MHz

EN 55022. Class "A" 30 MHz- 1000 MHz PASSRadiated Emissions

MIL-STD-461 E, Test RE 101 Magnetic Field PASS

Radiated Emissions 30 Hz - 100 kHz

Test Supervisor:R. Hi , Nemko USA, c.




DATE DOCUMENT NAME DOCUMENT N PAGE


1.2.2. Immunity Test Summary

BUSINESSSENSITIVEJ Specification

Minimum CriterionLevel Required

as client test plan.MIL-STD-461 ETest CSI01 120 Hz - 50 kHz on

Conducted Power LeadsSusceptibility

MIL-STD-461E 30 Hz to 100kHzTest RS 101 180-116dBpt

IEC 1000-4-2 (1995) Criterion A- ESD Immunity :8 kV air discharge,

±4 kV contact dischargeIEC 1000-4-3 (1998) Criterion A-Radio Frequency 10V/m from 30MiHz to 10GHzImmunity (80% AM at IkHz)

IEC 1000-4-4 (1995) Criterion A-Electrical Fast power line pulses of ± 2 kV;Transient Immunity 1/0 line pulses of± 1 kV

IEC 1000-4-5 (1995) Criterion A-Surge Immunity ±2kV common mode surges,

±1kV differential mode surgesIEC 1000-4-6 (1996) Criterion A-RF Common Mode 10 kHz - 200 MHz at 10 VrmsImmunity I kHz 80% amplitude modulated

IEC 1000-4-8 (1994) Criterion A- Magnetic Fields Helmholtz coil at 50 Hz,Immunity to 30 amps (rms) per meter

IEC 1000-4-11 (1994) Criterion A and C- Voltage Dips and Voltage Dips of 30% and 60%;Short Interru tions Interru tions of >95%.

*Client Accepts lower mitigated threshold levels.

Test Supervisor: / •R\ J ill, Nemko USAY', Inc.

Refer to the test results section for further details about test results.

25402-011-VIA-HARA-00212-001General Atomics HARA




03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 10 0189

2. SYSTEM CONFIGURATION

2.1. System Components and Power Cables

BUSINESSSENSITIVEJ

BUSINESSSENSITIVEJ

MANUFACTURERDEVICE MODEL # POWER CABLE

SERIAL #EUT - 2-Channel Radiation Sorrento Electronics 2m, unshielded, 18 AWG, 3-

Monitoring System RM-1000 wire, hard-wiredN/A

Detector Sorrento Electronics N/A

N/A

Detector Sorrento Electronics N/A

N/A

2.2. Device Interconnection and I/O Cables

CONNECTION

Interface Modules toDetectors

EUT to Alarm Relay

EUT to Analog Coaxial Out

EUT to RS 485 Comms.

1/0 CABLE 11



Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914DATE DOCUMENT NAME DOCUMENT# PAGE

03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 11 o189

BUSINESS]SENSITIVEI

2.3. Design Modifications for Compliance

Devie:RWadiation Monitoring System

Model: RM-1000

Nemko USA, Inc. recommends a safety review be completed in reference to the above-listed design

modification. The purpose of this review is to ensure that no safety issues are introduced as a result of these

design modifications,

25402-011 -ViA-HARA-00212-001General Atomics HARA


11696 Sorrento Valley Road, Suite F, San Diego, CA 92121Phone (858) 793-9911 Fax (858) 793-9914



3. TEST FACILITIES

3.1. Test Facilities

The test site is located at 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121. The site is physically

located 18 miles Northwest of downtown San Diego. The general area is a valley 1.5 miles east of the Pacific

Ocean. This particular part of the valley tends to minimize ambient levels, i.e. radio and TV broadcast

stations and land mobile communications.

3.2. Ground Plane

The conducted emissions and conducted susceptibility portions of the testing were performed on a ground

plane which measures 16' x 9'. The ground plane consisted of a 8' x 3' x 1/8" thick copper plate mounted on

a wooden bench and is connected to the ground rod via a copper bus bar I" wide and 0.25" thick. The DC

bonding resistance between the ground plane and ground is less than 2.5mOhm. The EUT and LISNs were

bonded to the ground plane.

3.3. Anechoic Chamber

The radiated emissions and susceptibility tests were conducted inside an anechoic chamber which measures

28' x 19' x 12'. A combination of carbon-loaded cones and ferrite tiles provide RF dissipation.



Nemko USA, hic'. FPhone (858) 793-9911 Fax (858) 793-9914

DATE DOCUMENT NAME DOCUMENT I PAGE


3.4. Detection SystemBUSINESSSENSITIVE

The automated detection system used in emission testir

vere used where necessary and where they are

of the report. Commercially available EMI

hese measurements. In this software package,

the bandwidths and sweep times actually used

are per the requirements of MIL-STD-461E:

FREQUENCY RANGE 6 dB BANDWIDTH MINIMUM MEASUREMENT TIME

30 Hzto I kHz 10 Hz 0.015 sec/Hz

I kHz to 10 kHz 100 Hz 0.15 sec/Hz

10 kHz to 250 kHz I kHz 0.015 sec/kHz

250 kHz to 30 MHz 10 kHz 1.5 sec/MHz

30 MHzto I GHz 100 kHz 0.15 sec/MHz

> I GHz I GHz 15 sec/MHz

For General Test Configuration please refer to the following page.






BUSINESSSENSITIVE

Photograph 1. General EUT Test Configuration



Nemko Inc. Phone (858) 793-9911 Fax (858) 793-9914


03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 15 of89

BUSINESSSENSITIVEJ


RM-1000 EMC Test Report (redact)oUSA, 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121

Nemko U Inc. Phone (858) 793-9911 Fax (858) 793-9914

DATE DOCUMENT NAME DOCUMENT # PAGE


BUSINESSSENSITIVE 4. DESCRIPTION OF TESTING METHODS

4.1. Test Set-Up

The RM-1000 is ainadiation Monitoring System. Its function is to monitor and warn of excessive

radiation levels in nuclear power facilities. The EUT was installed in a rack chassis, which was mounted in a

rack pedestal using the normal rack-mount flanges, or the system was placed on a wooden table, 80cm in

height. The detector units were placed on the rack-mount flange or on the base of the pedestal or on tabletop.

The rack pedestal was otherwise empty and was bonded to the ground plane.

4.2. Test Mode

The EUT was placed into a The

results are displayed Each detector was given value range of a

lower limit and an upper limit. If the average measured values fell below or above the limits, the unit would

go into an alarm state. The alarm state conditions were displayed as a red LED



Nemko U Inc. Phone (858) 793-9911 Fax (858) 793-9914



5. DESCRIPTION OF TESTING METHODS FOR COMPLIANCE

BUSINESSSENSITIVE1 5.1. Conducted Emissions CEI01

The purpose of this test was to measure the conducted emissions appearing on the power input leads of both

EUT's in the frequency rangee d to determine whether these emissions were in compliance

with the CE101 requirements defined in MIL-STD-461E.

5.1.1. Test Configuration

BUSINESSSENSITIVE

During this test, each EUT was placed on a conductive ground plane and bonded to the Dlane.

The test configuration is shown in Figure I and a complete list of the test

equipment together with the calibration information is provided below.

BUSINESSSENSITIVE]

5.1.2. Test Procedure

The spectrum analyzer was connected to the computer and the EMC test software loaded. Measurements of

the conducted emissions were then Derformed in the. frelneninv rnnao



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DATE DOCUMENT NAME DOCUMENT#j PAGE

03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI1 18 of 89

5.1.3. Test Results

BUSINESSSENSITIVE1 The results of the CEI0I test are presented in the Section 6. These results indicate the EUT is in compliance

with the CEI 01 requirement of MIL-STD-461E.

Figure 1. CE101 Test Configuration



Phone (858) 793-9911 Fax (858) 793-9914

NAME DOCUMENT# 9PAGEDOCUMENT

Sorrento Electronics RM-1000 CE Test Report 23-012-RI 19 of89

5.2. Conducted Emissions CE102

BUSINESSISENSITIVE The purpose of this test was to measure the conducted emissions appearing on the power lines of both EUT's

in the frequency range ind to determine whether these emissions were in compliance with

the CE 102 requirements defined in MIL-STD-461 E.

5.2.1. Test ConfigurationBUSINESS1

ISENSITI During this test, each EUT was placed on a conductive ground plane and bonded to the lane.

The

test configuration is shown in Figure 2 and a complete list of the test equipment together with the calibration

information is provided below.

DESCRIPTION MANUFACTURER MODEL CAL. DATE I CAL. DUE




DATE DOCUMENT NAME DOCUJMENT # PAGE


BUSINESSSENSITIVE


The spectrum analyzer was connected to the computer and the EMC test software loaded. Measurements of

the conducted emissions were then performed in the frequency range

5.2.3. Test Results

The results of the CE102 test are presented in Section 6. These results indicate that the EUT is in compliance

with the CE 102 requirement of MIL-STD-461E.






Figure 2. CE102 Test Configuration

BUSINESSSENSITIVE1


RM-1000 EMC Test Report (redact)IU n11696 Sorrento Valley Road, Suite F, San Diego, CA 92121

Nemko USA, Inc. IPhone (858) 793-9911 Fax (858) 793-9914



5.3. Radiated Emissions RE101

The purpose of this test was to measure the magnetic field radiated emissions produced by the EUT and

associated cabling and to determine whether these emissions are in compliance with the requirements of MIL-

STD-461 E.


BUSINESSSENSITIVE]

The test equipment was

configured as indicated in Figure 3 and a complete list of the test equipment and calibration data are provided

below.

DESCRIPTION MANUFACTURER MODEL CAL. DATE CAL. DUE

I DESCRIPTIONI MANUFACTURER I

MODEL I CAL. DATE I CAL. DUE



Nemko USA, Inc. 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121Nemko SA, Ic. F -Phone (858) 793-9911 Fox (858) 793-9914




The EUT was powered and measurements were then performed of the radiated magnetic field emissions

produced by the EUT and its associated cabling. The data was recorded at the locations of the highest

emissions, then reduced and plotted together with the applicable REI01 limit.

5.3.3. Test Results

The test data sheets pertaining to this test are presented in Section 6. These results indicate that both EUT's

are in compliance with the RE101 requirement of MIL-STD-461E.



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03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 24 or89

Figure 3. RE101 Test Configuration

EUSINESS]SENSITIVEI






5.4. Conducted Susceptibility CS101

BUSINESSSENSITIVE

5.4.1. Purpose

The purpose of this test was to determine the susceptibility of the EUT to audio frequency noise injected into

the power line in the frequency range

BUSINESSSENSITIVE1


The EUT was set up on the ground plane as described in Section 5. 1.1

The test configuration is shown

in Figure 4. A complete list of the test equipment used in this test is provided below.

Nemko USA, Inc.DATE

03/19/03

BUSINESS 5.4.3. TeSENSITIVE

I - F-




DOCUMENT# PAGE

ort 23-012-RI 26 of 89

•st

Procedure

DOCUMENT NAME

Sorrento Electronics RM-1000 CE Test Rep

st Procedure

5.4.4. Test Results

BUSINESSSENSITIVE The CS 101 test indicated that the EUT was not susceptible to audio frequency signals in the frequency range

Data sheets for this test are provided in Section 6. The EUT is in compliance with the

CS 101 requirement of MIL-STD-46 I E.


RM-1000 EMC Test Report (redact)oUSA, 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121

emko USAInc. Phone (858) 793-9911 Fax (858) 793-9914



Figure 4. CS1I01 Test Configuration

BUSINESSSENSITIVEI




DATE DOCUMENT NAME DOCUMENT41 PAGE


Figure 5. CSIOI Calibration of Susceptibility Signal

[BUSINESSSENSITIVE


RM-1000 EMC Test Report (redact)11696 Sorrento Valley Road, Suite F, San Diego, CA 92121Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914



Figure 6. CSI01 Limit Waveform

BUSINESSSENSITIVE






5.5. Radiated Susceptibility RS101BUSINESSSENSITIVE The purpose of this test was to expose the EUT to radiated magnetic fields in the frequency range

=and to determine the susceptibility of the EUT to these fields.


BUSINESSSENSITIVE The EUT was Dlaced on a conductive 2round iDlane and bonded to

own in Figure 7. A complete list of the test equipment together with the calibration data is

provided below.

DESCRIPTION MANUFACTURER MODEL

I DESCRIPTION

I MANUFACTURER IMODEL CAL.

DATECAL.DUE,

25402-011 -V1A-HARA-00212-001General Atomics HARA

RM-1 000 EMC Test Report (redact)

Nemko USA, Inc. 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121

N Phone (858) 793-9911 Fax (858) 793-9914



5.5.2. Test ProcedureSUSINESSSENSITIVE .The EUT was powered up and correct opera

tced over several locations of the system for complete exposure to

the radiated field.

5.5.3. Test Results

The test results are presented in Section 6. These results indicate that the EUT is in compliance with the

RS 101 requirements of MIL-STD-461E.



N~emko USA, Inc. 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121Phone (858) 793-9911 Fax (858) 793-9914



RS1I01 Limits for all Army applications

BUSINESSSENSITIVE




DATE DOCUMENT NAME DOCUMENT #j PAGE

03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R 1 33 of89

BUSINESSSENSITIVE] Figure 7. RSI01 Test Configuration





03/19/03 Sorrento Electronics RM.1000 CE Test Report 23-012-RI 34 of 89

Figure 8. RS101 Calibration Configuration

BUSINESSSENSITIVE



Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914DATE DOCUMENT NAME DOCUMENT # PAGE


5.6. Configuration and Methods of Measurements for Frequency Identification

BUSINESSSENSITIVE When performing all testing of equipment, the actual emissions of the EUT are segregated from ambient

signals present within the laboratory or the open-field test range. Preliminary testing is performed to ensure

that ambient signals are sufficiently low to allow for proper observation of the emissions from the EUT.






5.7. Configuration and Methods of Measurements for Radiated EmissionsBUSINESSSENSITIVE.

EN 55022 also specifies limits and methodology for radiated emissions testing. Initially, the primary emission

freauencies are identified inside a shielded chamber

rhe numerical results of the test are

included herein to demonstrate compliance. The numerical results of the test are included herein to

demonstrate compliance.

The numerical results that are applied to the emissions limits are arrived at by the following method:

The final adjusted value is then compared to the appropriate emission limit to determine compliance.



Nemko USA, Inc. Phone (858)793-9911 Fax (858) 793-9914



5.8. Statistical Sampling Required for Continued Compliance

For quality assurance of ongoing productions to comply with RFI interference limits, CISPR 22 Clause 7

stipulates a statistical sampling procedure. In summary, this rule states that the manufacturer should ensure

80% of the units must be in compliance with an 80% confidence level. Refer to CISPR Publication 22,

(1985), Clause 7 for a detailed description of the sampling procedure.






5.9. Electrostatic Discharge Immunity: IEC 1000-4-2 (1995)

The test plan specifies the IEC 1000-4-2 Standard as the basic procedure for ESD testing. The standard

configuration as outlined in IEC 1000-4-2 (1995) is used. Tabletop devices are placed on an insulated mat on

a horizontal coupling plane. Air discharges and contact charges are made to the EUT on connectors and

conducting surfaces (as illustrated in the Test Results section of this Test Report). The discharges shall be

applied in two ways:

BUSINESSSENSITIVE]

For further information, please refer to the technical sections in the IEC 1000-4-2 (1995) publication in

addition to the test results section and photographs of the test set-up provided in this report.

25402-011 -VI A-HARA-0021 2-001General Atomics HARA





5.10. Radio Frequency Immunity: IEC 1000-4-3 (1998)

The test plan specifies the IEC 61000-4-3 Standard for radio frequency (RF) immunity requirements and test

methods for equipment that is required to withstand electromagnetic (EM) fields. The RF immunity test

entails subjecting the equipment under test to a uniform field of radiated electromagnetic energy of a specified

field strength and frequency, and monitoring the functionality of the device as the frequency is swept over a

specified frequency range.

The specification limits and technical parameters for testing are outlined in the IEC 1000-4-3 (1998) Standard.

This edition of the publication specifies a transmit antenna to EUT distance of 3m and a frequency range of 80

M-lz to 1000 M]Hz (80% amplitude modulated at a I kHz rate). The standard configuration as outlined in IEC

1000-4-3 (1998) is used. The EUT is set up inside a shielded, semi-anechoic chamber with a radiating

antenna at a distance of 3 meters from the EUT. For further information, please refer to the technical sections

in the IEC 1000-4-3 (1998) publication in addition to the test results section and photographs of the test set-up

provided in this report.




DATE DOCUMENT NAME DOCUMENT J PACE


5.11. Electrical Fast Transient Immunity: IEC 1000-4-4 (1995)

The test plan specifies the IEC 1000-4-4 Standard as the basic procedure for electrical fast transient testing.

lEC 1000-4-4 (1995) defines the immunity requirements and test methods for equipment that are required to

withstand high-voltage transients coupled on supply, signal and control ports. The standard configuration for

"type tests" outlined in IEC 1000-4-4 (1995) is used. For further information, please refer to the technical

sections in the IEC 1000-4-4 (1995) in addition to the test results section and photographs of the test set-up

provided in this report.



Nemko USA, Inc. 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121Phone (858) 793-9911 Fax (858) 793-9914



5.12. Power Line Surge Immunity: IEC 1000-4-5 (1995)

The test plan specifies the IEC 1000-4-5 Standard as the basic procedure for power line surge immunity tests.

This standard relates to the immunity requirements, test methods, and range of recommended test levels for

low voltage equipment to unidirectional surges caused by over-voltages from switching and lightning

transients. The standard configuration as outlined in IEC 1000-4-5 (1995), section 7 was used.

Each device was tested in a total of three surge configurations:

Surge #1: Combination Wave, Line to Protective Earth with 9uF and 10 Ohm, common mode, generatorearthed.

Surge #2: Combination Wave, Neutral to Protective Earth with 9uF and 10 Ohm, common mode,generator earthed.

Surge #3: Combination Wave, Line to Neutral with 18uF, differential mode, generator floated.

For further information, please refer to the technical sections in the IEC 1000-4-5 (1995) in addition to the test

results section and photographs of the test set-up provided in this report.

For Power line surge tests, the EUT meet at least performance Criterion B for +2kV common mode and ± I kV

differential mode surges in the AC power supply configuration.



Nemko USA, Inc. IPhone (858) 793-9911 Fax (858) 793-9914



5.13. High Frequency Conducted Common Mode Immunity: IEC 1000-4-6 (1996)

The test plan specifies the IEC 1000-4-6 Standard as the basic standard for radio frequency conducted

common mode disturbance testing. This standard relates to the immunity requirements, test methods, and

range of recommended test levels for immunity to conducted disturbances induced by radio-frequency fields

in the 150 kHz to 80 MHz frequency range. The standard configuration as outlined in the 1EC 1000-4-6

(1996) was used. For further information, please refer to the technical sections of the lEC 1000-4-6 (1996)

publication in addition to the test results section and photographs of the test set-up provided in this report,



N Phone (858) 793-9911 Fax (858) 793-9914


03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI1 43 of 89

5.14. Magnetic Field Immunity: IEC 1000-4-8 (1994)

The test plan specifies IEC 1000-4-8 as the basic procedure for testing apparatus containing devices

susceptible to magnetic fields, e.g. Hall Effect sensors, electrodynamic microphones, etc., and to CRT's. The

standard configuration as outlined in the IEC 1000-4-8 was used. For further information, please refer to the

technical sections of the IEC 1000-4-8 publication (1994) in addition to the test results section and

photographs of the test set-up provided in this report.

25402-011 -Vi A-HARA-00212-001General Atomics HARA





5.15. Voltage Dips and Short Interruptions: IEC 1000-4-11 (1994)

The test plan specifies the IEC 1000-4-11 Standard as the basic standard for voltage variations immunity

testing. This standard relates to the immunity requirements, test methods, and range of recommended test

levels for immunity to variations in AC line voltage. The standard configuration as outlined in the IEC 1000-

4-11 (1994) was used.

BUSINESSSENSITIVE]

For further information, please refer to the technical sections of the IEC 1000-4-11 (1994) Standard in

addition to the test results section and photographs of the test set-up provided in this report.



JNemko USA, Inc. FPhone (858) 793-9911 Fax (858) 793-9914DATE DOCUMENT NAME DOCUMENT # PAGE


BUSINESSSENSITIVEJ

6. Test Results

6.1. Conducted Emissions Test Data (CE 101)



Jemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914



BUSINESSSENSITI E F . ..... ..

&ý'Wý' -Nth,%






BUSINESSSENSITIVEon I Conducted Emissions Test Equipment



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03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-Ri 48 of 89

6.2. Radiated Emissions Test Data

BUSINESSSENSITIVE

Nemko USA, Inc.EN55022 (CISPR 22), Class 'A' Radiated Emissions Data Sheet

(10 m Open Area Test Site)

Client:

EUT

Model

Sorrento

Radiation Monitor System

RM-1000

Conducted by: Mike KrumweideDate oj 12-24-02

Frequencr! Range:






BUSINESSSENSITIVE

Sorrento Electronics - Radiation Monitor System RM-1000EN55022 'A' Radiated Emissions Profile (12-24-02) - Nenmko

USA

Nemko USA, Inc.DATE

03/19/03

BUSINESSSENSITIVE[

- L



Phone (858) 793-9911 Fax (858) 793-9914

DOCUMENT# PAGE

ort 23-012-1I 50 of 89

DOCUMENT NAME

Sorrento Electronics RM-1000 CE Test Repo

Radiated Emissions Test Equipment






6.3. Radiated Emissions RE 101 Test Data

BUSINESS]SENSITIVE


RM-1000 EMC Test Report (redact)N U I11696 Sorrento Valley Road, Suite F, San Diego, CA 92121




BUSINESSSENSITIVE

Sorrento Electronics - 2 Channel Radiation Monitoring System:RM-1000

MIL-STD-461E RE 101 (12/31/02) - Nemko USA



Nernko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914

DATE DOCUMENT NAME DOCUMENTF PAGE


6.4. Radiated Susceptibility RS 101 Test Data

BUSINESSSENSITIVE1






6.5. Conducted Susceptibility CS 101 Test DataBUSINESS

SENSITIVEMIL-STD-461E CS 101SORRENTO ELECTRONICSModel: RM-1000


RM-1000 EMC Test Report (redact)N U c11696 Sorrento Valley Road, Suite F, San Diego, CA 92121

Nemko USA, Inc. I Phone (858) 793-9911 Fax (858) 793-9914



SBsUSINESSSENSITIVE

6.6. Electrostatic Discharge Immunity Test Results & Test Points

___niln NMPPPLjhoto JK



11696 Sorrento Valley Road, Suite F, San Diego, CA 92121Nemko USA, Inc. F Phone (858) 793-9911 Fax (858) 793-9914



BUSINESS]SENSITIVE

Photograph 2. ESD Test Points

All discharges are contact


RM-1 000 EMC Test Report (redact)11696 Sorrento Valley Road, Suite F, San Diego, CA 92121



03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 57 o189

BUSINESSSENSITIVE






SENSITIVE


RM-1000 EMC Test Report (redact)N U n11696 Sorrento Valley Road, Suite F, San Diego, CA 92121




BUSINESSSENSITIVEI

Nemko USA, Inc.DATE

03/19/03

DOCUMENT NAME

Sorrento Electronics RM-1000 CE Test Rep




DOCUMENT # PAGE

o1!23-012-R! 60 of 89

BUSINESSSENSITIVEJ



A'emko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914



6.7. Radio Frequency Immunity Test Results

O iA _._ N I ....... ............................ . oaho.





03119103 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 62 of 89

IBSNIES/E



SU ,11696 Sorrento Valley Road, Suite F, San Diego, CA 92121Nemko USA, Inc. IPhone (858) 793-9911 Fax (858) 793-9914


03/19/03 Sorrenlo Electronics RM-1000 CE Test Report 23-012-RI 63 of 89

BUSINESSSENSITIVE

6.8. Electrical Fast Transient Burst Immunity Test Results

.C.ompliant .1 • I Non-Compliant

Nemko USA, Inc.DATE

BUSINESS 03/19/03

SENSITIVE 6.9. Power Li



Phone (858) 793-9911 Fax (858) 793.9914

DOCUMENT # PAGE

ort 23-0t2-RI 64 of 89

DOCUMENT NAME

Sorrento Electronics RM-1000 CE Test Repc

ne Surge Immunity Test Results

-- ----- ............ ... ........ -.. ý-2TP-Iiant ________,,-.--..-----ý.-Non-Compliant



BUSINESSSENSITIVE



03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R! 65 of 89

:L__ 6.10.HF Conducted Common Mode Disturbance Immunity Test Results

.... ..... ... ... ................ ... ... ............. .. ................. ...... ............. .......... .... ..... .......... ... ---- .. .... .. .............. .... .. ...... .. ....... ........ ....... ..... ...... .. .... .,,__qop t - J-1 -- --- . Non-&'mpitant koto[ 7X






BUSINESSSENSITIVE

6.11.Power Frequency Magnetic Field Immunity Test Results

... U.. mII~1Lan. _.A...



Nemko USAInc. Phone (858) 793-9911 Fax (858) 793-9914DATE DOCUMENT NAME DOCUMENT # PAGE


BUSINESSISENSITIVEI



Phone (858) 793-9911 Fax (858) 793-9914


03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-Ri 68 of 89

Photograph 3. CE 101 Test Configuration

BUSINESSSENSITIVE3



Phone (858) '793-9911 Fax (858) 793-9914



Photograph 4. CE 102 Test Configuration

BUSINESSSENSITIVE



Nemko USA, Inc. 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121Phone (858) 793-9911 Fax (858) 793-9914



BUSINESSSENSITIVE

Photograph 5. Radiated Emissions Test Configuration



ito Valley Road, Suite F, San Diego, CA 92121Phone (858) 793-9911 Fax (858) 793-9914

DOCUMENT 1 PAGEDOCUMENT NAME

Sorrento Electronics RM-1000 CE Test Report 23-012-RI 71 of 89

Photograph 6. Radiated Emissions RE 101 Test Configuration



Photograph 7. Radiated Susceptibility RS 101 Test Configuration

BUSINESSSENSITIVE


RM-1 000 EMC Test Report (redact)11696 Sorrento Valley Road, Suite F, San Diego, CA 92121




Photograph 8. Conducted Susceptibility CS 101 Test Configuration

BUSINESSSENSITIVEJ



Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914DATE DOCUMENT NAME DOCUMENT # PAGE


Photograph 9. ESD Test ConfigurationBUSINESSSENSITIVEI


RM-1000 EMC Test Report (redact)I 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121

Nemko USA, Inc. F Phone (858) 793-9911 Fax (858) 793-9914



Photograph 10. Radio Frequency Immunity Test Configuration

BUSINESSSENSITIVE]



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03119/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 76 of 89

Photograph 11. EFT Immunity Test Configuration

BUSINESSSENSITIVE


RM-1000 EMC Test Report (redact)11696 Sorrento Valey Road, Suite F, San Diego, CA 92121




Photograph 12. Power Line Surge Immunity Test Configuration

BUSINESSSENSITIVE


RM-1000 EMC Test Report (redact)N U n11696 Sorrento Valley Road, Suite F, San Diego, CA 92121

Nemko USA, Inc. I- Phone (858) 793-9911 Fax (858) 793-9914DATE DOCUMENT NAME DOCUMENT # PAGE


Photograph 13. HF Conducted Immunity Test Configuration

BUSINESSSENSITIVEJ






Photograph 14. Magnetic Field Immunity Test Configuration

BUSINESSSENSITIVE


RM-1000 EMC Test Report (redact)11696 Sorrento Valley Road, Suite F, Sa

N Phone (858)793-9911DATE DOCUMENT NAME DOCUMENT #

03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI

Photograph 15. Voltage Dips/Short Interruptions Immunity Test

Configuration

BUSINESSSENSITIVE






APPENDIX A

A. Conducted & Radiated Emissions Measurement Uncertainties

1. Introduction

ISO Standard 17025 and ANSI/NCSL Z540-I (1994) require that all measurements contained in a test report be

"traceable". "Traceability" is defined in the International Vocabulary of Basic and General Terms in

Metrology (ISO: 1993) as: "the property of the result of a measurement.., whereby it can be related to stated

references, usually national or international standards, through an unbroken chain of comparisons, all having

stated uncertainties".

The purposes of this Appendix are to "state the Measurement Uncertainties" of the conducted emissions and

radiated emissions measurements contained in Section 5 of this Test Report, and to provide a practical

explanation of the meaning of these measurement uncertainties.

2. Statement of the Worst-Case Measurement Uncertainties for the Conducted and

BUSINESS Radiated Emissions Measurements Contained in This Test Report

SENSITIVE Table 1: Worst-Case Expanded Uncertainty "U" of Measurement for a k=2 Coverage Factor




DATE DOCUMENT NAME I DOCUMENT # PAGE


3. Practical Explanation of the Meaning of the Conducted and Radiated EmissionsMeasurement Uncertainties

In general, a "Statement of Measurement Uncertainty" means that with a certain (specified) confidence level,

the "true" value of a measurand will be between a (stated) upper bound and a (stated) lower bound.

In the specific case of EMC Measurements in this test report, the measurement uncertainties of the conducted

emissions measurements and the radiated emissions measurements have been calculated in accordance with the

method detailed in the following documents:

" ISO Guide to the Expression of Uncertainty in Measurement (ISO, 1993)

o NIS 81:1994, The Treatment of Uncertainty in EMIC Measurements (NAMAS, 1994)

o NIST Technical Note 1297(1994), Guidelines for Evaluating and Expressing the Uncertainty of NIST

Measurement Results (NIST, 1994)

The calculation method used in these documents requires that the stated uncertainty of the measurements be

expressed as an "expanded uncertainty", U, with a k=2 coverage factor. The practical interpretation of this

method of expressing measurement uncertainty is shown in the following example:

EXAMPLE:

Assume that at 39.51 MI-Iz, the (measured) radiated emissions level was equal to +26.5 dBuV/m, and

that the +/- 2 standard deviations (i.e. 95% confidence level) measurement uncertainty was +/- 3.4 dB.

In the example above, the phrase "k = 2 Coverage Factor" simply means that the measurement uncertainty is

stated to cover +/-2 standard deviations (i.e. a 95% confidence interval) about the measurand. The measurand is

the radiated emissions measurement of +26.5 dBuV/m at 39.51 MNHz, and the 95% bounds for the uncertainty

are -3.4 dB to + 3.4 dB. One can thus be 95% confident that the "true" value of the radiated emissions

measurement is between +23.1 dBuV/m and +29.5 dBuV/m. In effect, this means that in the above example

there is only a 2.5% chance that the "true" radiated emissions value exceeds +29.5 dB0,V/m.




DATE DOCUMENT NAME DOCUMENT # PACE


APPENDIX BB. Nemko USA, Inc.'s Test Equipment & Facilities Calibration Program

Nemko USA, Inc. operates a comprehensive Periodic Calibration Program in order to ensure the validity of all

test data. Nemko USA's Periodic Calibration Program is fully compliant to the requirements of NVLAP Policy

Guide PG-!-1988, ANSI/NCSL Z540-1 (1994), ISO 10012-1 (1993-05-01), ISO Standard 17025, ISO-9000

and EN 45001. Nemko USA, Inc.'s calibrations program therefore meets or exceed the US national

commercial and military requirements [N.B. ANSL'NCSL Z540-I (1994) replaces MIL-STD-45662A].

Specifically, all of Nemko USA's primary reference standard devices (e.g. vector voltmeters, multimeters,

attenuators and terminations, RF power meters and their detector heads, oscilloscope mainframes and plug-ins,

spectrum analyzers, RF preselectors, quasi-peak adapters, interference analyzers, impulse generators, signal

generators and pulse/function generators, field-strength meters and their detector heads, etc.) and certain

secondary standard devices (e.g. RF Preamplifiers used in CISPR 11/22 and FCC Part 15/18 tests) are

periodically recalibrated by:

o A Nemko USA-approved independent (third party) metrology laboratory that uses NIST-traceable

standards and that is ISO Standard 17025-accredited as a calibration laboratories by NIST; or,

o A Nemko USA-approved independent (third party) metrology laboratory that uses NIST-traceable

standards and that is ISO Standard 17025-accredited as a calibration laboratory by another

accreditation body (such as A2LA) that is mutually recognized by NIST; or,

o A manufacturer of Measurement and Test Equipment (M&TE), if the manufacturer uses NIST-

traceable standards and is ISO Standard 17025-accredited as calibration laboratory either by NIST or

by another accreditation body (such as A2LA) that is mutually recognized by NIST; or

o A manufacturer of M&TE (or by a Nemko USA-approved independent third party metrology

laboratory) that is not ISO Standard 17025-accredited. (In these cases, Nemko USA conducts an

annual audit of the manufacturer or metrology laboratory for the purposes of proving traceabilty to

NIST, ensuring that adequate and repeatable calibration procedures are being applied, and verifying

conformity with the other requirements of ISO Standard 17025).


RM-1 000 EMC Test Report (redact)

N U n11696 Sorrento Valley Road, Suite F, San Diego, CA 92121Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914



In all cases, the entity performing the Calibration is required to furnish Nemko USA with a calibration test

report and/or certificate of calibration, and a "calibration sticker" on each item of M&TE that is successfully

calibrated.

Calibration intervals are normally one year, except when the manufacture advises a shorter interval (e.g. the HP

8568B Spectrum Analyzer is recalibrated every six months) or if US Government directives or client

requirements demand a shorter interval. Items of instrumentation/related equipment which fail during routine

use, or which suffer visible mechanical damage (during use or while in transit), are sidelined pending repair and

recalibration. (Repairs are carried out either in-house [if minor] or by a Nemko USA-approved independent

[third party] metrology laboratory, or by the manufacturer of the item of M&TE).

Each antenna used for CISPR II and CISPR 22 and FCC Part 15 and Part 18 radiated emissions testing (and

for testing to the equivalent European Norms) is calibrated annually by either a NIST (or A2LA) ISO Standard

17025-Accredited third-party Antenna Calibration Laboratory or by the antenna's OEM if the OEM is NIST or

A2LA [SO Standard 17025-accredited as an antenna calibration laboratory. The antenna calibrations are

performed using the methods specified in Annex G.5 of CISPR 16-1(1993) or ANSI C63.5-1991, including the

"Three-Antenna Method". Certain other kinds of antennas (e.g. magnetic-shielded loop antennas) are

calibrated annually by either a NIST (or A2LA) ISO Standard 17025-accredited third-party antenna calibration

laboratory, or by the antenna's OEM if the OEM is NIST or A2LA ISO Standard 17025-accredited as an

antenna calibration laboratory using the procedures specified in the latest version of SAE ARP-958.

In accordance with FCC and other regulations, Nemko USA recalibrates its suite of antennas used for radiated

emissions tests on an annual basis. These calibrations are performed as a precursor to the FCC-required annual

revalidation of the Normalized Site Attenuation properties of Nemko USA's Open Area Test Site. Nemko

USA, Inc. uses the procedures given in both Subclause 16.6 and Annex G.2of CISPR 16-1 (1993), and, ANSI

C63.4-1992 when performing the normalized site attenuation measurements.



11696 Sorrento Valley Road, Suite F, San Diego, CA 92121Nemko USA, Inc. IPhone (858) 793-9911 Fax (858) 793-9914



APPENDIX CC. A2LA Accreditation / Nemko Authorization

THE AMERICANASSOCIATIONFOR LABORATORYACCREDITATION

ACCREDITED LABORATORY

A2LA has accredited

NEMKO USA, INC.San Diego EMC DivisionSan Diego, CA

for technical competence in the field of

Electrical Testing

The accrediation covers the specific tests and types of tests listqd on the agreedscope of accreditaton. This laboratory meets the requirements of ISO/IEC 17025 -1999 "General Requirement for the Competence of Testn and CalibrationLaboratories and any additional program reqciremsnta in the Identified field of testing.Testing and calibration laboratories that comply with this Intemational Standard alsooperate in accomdance with ISO 001 or ISO g002 (1994).

Presented this 13" day of May, 2002.

For the Accreditation CouncilCertificate Number 1817.01Valid to January 31, 2004.

of tests to which this accreditatio applies, pleae refer to thelaborators Electrical Scope of Accreditation






American Association for Laboratory Accreditation

SCOPE OF ACCREDITATION TO ISOAMC 17025-1969

NEMKO USA. INC.San Diego EMC Division

11696 Sorrento Valley Road, Suite FSan Diego, CA 92121

Ryan Huckaboae Phone: 858 793 9911

ELECTRICAL (EMC)

Valid to: January 31 ,2004 Certificat Number. 1817-01

In recognition otthe successful completion of the A2LA evaluation process, accreditation is Wanted to thislaboratory to perform the following electromsmentic compatibilitv tests:

Radiated Emissions Code of Federal Regulaskm (CFR) 47. FCC Pamt 15 (using ANSI C63A) andI .C1SPR 11. CISPR 22

Conducted Emissions Code of Federal Regulation (CFR) 47, FCC Parts I S (using ANSI C63.4)and IS; CISPR 11; CISPR22

Electro•a•ic Discharge (ESD) EN 61000-4-2

Radiated Inmmniy EN 61000-4-3

Electical Fast Transict'Burst EN 610004-4

:. Surge Immunity EN 61000-4-5

Concdtied Immunity EN 61000-4-6

Power Frequency MagneticField Immunity EN610004--

Voltage Dips, Short Interuptions. andLine Voltage Variations EN 61000-4-11

• Hamonica EN 61060-3-2

Flicker EN 61000-3-3

On the followinz ooducts or D'•i of poducts: Information Technology Equipment (ITE) and Industrial.Scientific and Medical Equipment (ISM)

(A2LA CcrL No. 1817.01)05/13/02 Page I of I.•moi Bcest:.•oow., Sutet&& 350 -Fnaik MD 217O.73 * Phn: 30164" 3248 o IF-. 301-.6 2974 3






EMC LaboratoryAuthorisation

Aut. No,: ELA 137

EMC Lawaly Nemko USA Inc, San Diego EMC Division11696 Sorrento Valley Road, Suite FSan Diego, Callforria 92121USA

Scope Of All CENELEC standards JENs] for EMC that am listed on theAu~thovatim: accompanying page, and, all of the corresponding CISPR.

IEC, and ISO EMC standards that are listed on theaccompanying page.

Nemko has assessed the teastng f tes, qualficatans and taest pacDca and th relevant pad of theom nlat•no• The above.mentl•ned EMC Lsatofy has been valdated against B4 4M1 and 18.0and ftond to be compla. The taboto aftic the cnt desvlbad in Nnk Ocu0ma M.IWF:.O . Duriag Mmnw's visK It was tuod that f EMC Labwstoy Is capable of perom g teste within theSc"ofe Afte fsaitushk given on the aocoevrvslirng pags(s).

Acoodng;y, Nan*O *W accept repor from the tabwatmy as a basis for atiesn con•Onnty to VtesEMCSuidens uderafterte Fmpsn Lw EC ned~e.(OW336EEC) or, when apliptcable, the

Naiona standlards of mmbours Mambo ha beew aidtihised to aftest confon~fty with.

In oder to mintain the Auorftatlon, the kiaonation gven in the pert•ient ELA-INFO-10 rnt be camsyfollowed. Nenmo Is to be pronvply notfled abouL any dmanges In toe situation at the EMC Laboraty. whichmay affect the basis for 0* Aut•i•r on. The Author•ation may be withdrawn at any time If the condftnare no ng considered to be kutied.

The Authorlsatlon Is valid through 31. December 2004.

Oslo. 2. May 2002For INMmo AS;

X011t Beigh. Neambo Group EMC CoadnJator

BLA4.10WBXasaN..SC--*1wik.30 tObo-7355- 1`34021601 Ph-. , T4722550330 P .472294 0 bEaspw. WWo.O5I44S2



11696 Sorrento Valley Road, Suite F, San Diego, CA 92121Nemnko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914



('7,) Nemko


Aut. No.: ELA 137(Page 2 of 3)

SCOPE OF AUTHORIZATION

GENERIC & PRODUCT-FAMILY STANDARDSEN 80061-1:1092 EN 50081-2: 193 EN -1 :1997E?461000-6-3:2001 EN 6100044:2001 EN 61000•4-1.901IEC 610006-3 1996 (Mod) IEC 6100044:1997 (mod) IEC 610004-1:1997 (mod).N616000-2:1999 EN 55=-2(1995) 4Ai(199T1 EN 50091-2(g956

HEC 610004-2;1990EN 6100-,6-2:2001|EC 610004-.1999 (mod)EN 50130-4:1995I Al :9 . N 50199(1996) EN 55011:199 *A1:99

CISPR I t.7 * A1 :99EN 59013:1990 • A12:tW94 - EN 55014-1:1993 - A1:1997. EN 55014-2:1997A13:1906 * A14 :199 A2 :1999 CISPR 14-2:1997CISPR 13:1975 + A1:1983mod. CISPR 14:1993 + AI:196 +EN 56013 2001 A2:1996ClSPR 13:2001 EN 55014-12000 A1 :2001

CISPR 14-1 2000 +At 2001EN 55015:1996 * A.97 A2 "99 'EN 55020:1994 A1 .' EN 55002219 A1:19+ gCISPR I M. 1 A1.97 . A2:98 A12:99 + A13 9 .. A14 :9 A2VINTEN 55016:2000 CISPR 201996. A1 :99 CISPR 22:19934 AI:19954CISPR 15:2000 A21NG6

EN 55022:1996. Al :2000CtSPRI 22:1997 + Al :2000

9N 55024:19.i A1 i2001 N 55103-1(1997) EN 55103-241997)C..PR24:1997 4At :2001

EN61000-3-2:1995+A1:1 86- EN 61000-3-3:15 * Ai :2001 EC M094N(196l.A2I198 +A14:2000 EC 61000X33:194 A1 :2001 EN 60645(1997)IEC61000-3-2:1995+A1:1997. EN 61000-,-i1 00A21•S MC 61000.3-11 .100EN 61000-3-2 2000IEC 61000-3-2 200 (Mod) +Al :2001E-60670-2.1:1996 EN 61131 -2:19944 A4Xi %6 4 EN4 326-1 :1997 Ai :9 . A2,:01EC60870-2-1 :195 A12:00 EC 61326:1997 + A1 .'g *AA2 00

IEC 611312: 1992EN 61547:1995 M A1:2000 IEN O6l0-3:199 - Ali 2= 1,50 11451-1(1996)IEC 61547 :15 + Al :2000 1EC 61500-3:1996ISO 11451-2(1995) w 11451-"1995) ISO 11451-4(195Sj

EN 300 385-2 1997EN 300 386:2000EN 300 388:2001

Claw 2. May 2002 1"aU 6fogh. Nwnko Grmup EMC Co-ordor

2(3)



11696 Sorrento Valley Road, Suite F, San Diego, CA 92121'emko USA, Inc. F - Phone (858) 793-9911 Fan (858) 793-9914



ý C\j Nemk


Aut No.: ELA 137(Page 3 of 3)

BASIC STANDARDSEX61000-4-Z19954Al So EN 4 : EN6100I A1:18 EIEC 610004-2:190+~AI.8 IEC 610004-11964A1:98 IEC 610004-4:199

8EOS A9 01.&'1964 (IEC801.4I940)

:1IM4A IEGN 600-ZE1999 EN61000-4-8:1093IEC 0 10004-5:1995 IEC 6100044-&J96 lEC800044:1993

EN 81004-11:194 EN 604-1±196 1ECG 100G414(1l99§)-.lEC 61000.4-11:1994 1EC 61000.4-12:1W9 EN61000-4-14(99)

IS067(M I ISO 7637-2(1990) ISO7u7-3199)

Oslo, 2. May 2002 KJQl wosg. Narno Group EUC Co-crftalew

3(3)



APPENDIX BBUSINESSSESVEN

RM-1000 EMC Test Procedure

Document 04509050Rev. - Page B-1

25402-011-VIA-HARA-00212-001CGr"zroI Atomi1-- UA PA

REVISIONS -.-.- --- - - ~

RM-1000lf EMC Test Report freacd~tl

REV DESCRIPTION DATE APPROVED

Document classificationchange

SHEET 29 30 31 32 33 34135136 37 38 39 40 41 42 43144 45146 47148 49 50151 52 5ý3154155156

-REV_ __

SHEET 1 "5 6 7 ,8 911112131415161718192021 22 23 2425262728

REV

+SORRENTO ELECTRONICS0

W.ONG 12-11-02 SENSITIVýEE 0EMC TEST PROCEDURE,

M '-fay RM-1000,WG MMc NO. DMwMN NM.~

,A "A 58307 9)45090152rl RELEASE 2-; '

D40A MiaR _ _ _ 1 OF 25_ I ~ ~DRAWING LEVEL q ,

SE-MOM 3/97



CONTENTS

1 PURPOSE AN D SCOPE ......................................................................................................................... 4

2 REFEREN CE DO CUM ENTS ......................................................................................................... 4

3 EQ UIPM ENT TO BE TESTED 5.............................................................................................................. 5

4 ELECTROMAGNETIC EMISSIONS AND SUSCEPTIBILITY REQUIREMENTS ...................... 5

5 EQ UIPM ENT REQ UIRED ...................................................................................................................... 5

5.1 V ENDOR-SUPPLIED EQUIPMENT .................................................................................................... 5

5.2 SORRENTO ELECTRONICS SUPPLIED EQUIPMENT ......................................................................... 5

6 DESCRIPTION OF EQUIPMENT TO BE TESTED ........................................................................ 6

7 EM C QU ALIFICATION ......................................................................................................................... 6

7.1 W IRING CONNECTIONS ..................................................................................................................... 67.2 C ALIBRATION ................................................................................................................................... 7

7.2.1 Area RM -1000 (Type I) Calibration ................................................................................... 77.2.2 Process RM -1000 (Type II) Calibration ............................................................................ 7

8 TEST SET UP .......................................................................................................................................... 8

9 POW ER U P AN D TEST CO ND ITIO N ............................................................................................ 109.1 AREA RM- 1000 (TYPE I) POWER UP AND TEST CONDITION ..................................................... 10

9.2 PROCESS RM- 1000 (TYPE II) POWER UP AND TEST CONDITION ............................................... 11

10 ACCEPTAN CE CRITERIA .................................................................................................................. 12

10.1 EM ISSIONS TEST ............................................................................................................................. 1210.2 SUSCEPTIBILITY TEST .................................................................................................................... 1210.3 ABBREVIATED FUNCTIONAL TEST .............................................................................................. 1210.4 POST FUNCTIONAL TEST ................................................................................................................ 13

10.4.1 Area RM -1000 System ...................................................................................................... 1310.4.2 Process RM -1000 System .................................................................................................. 1310.4.3 RM -1000 Functional Tests ............................................................................................... 13

11 TE ST RE PORT ...................................................................................................................................... 14

FIGURES

FIGU RE 1 TEST POINTS AN D ADJU STM ENTS .............................................................................. 16

TABLES

TABLE 1 RM -1000 EM C TEST STANDA RD S .................................................................................... 17

TABLE 2 TESTIN G NOTES ....................................................................................................................... 18

TABLE 3 DEVIATION RECORD SHEET ............................................................................................. 19

TABLE 4 TEST EQ UIPM ENT ................................................................................................................... 20

TABLE 5 TEST ARTICLE .......................................................................................................................... 21

04509015Rev. - Page 2



APPENDICES

APPENDIX A MISCELLANEOUS INFORMATION ........................................................................... 15

APPENDIX B PRE EMC FUNCTIONAL TEST ................................................................................... 22

APPENDIX C ABBREVIATED EMC FUNCTIONAL TEST .............................................................. 23

APPENDIX D POST EMC FUNCTIONAL TEST ................................................................................ 24

APPENDIX E CHECKLIST FOR SUSCEPTIBILITY TESTS .............................................................. 25

04509015Rev. - Page 3



1. PURPOSE AND SCOPEThis Test Procedure (TP) defines the steps necessary to test the Electromagnetic Compatibility(EMC) of the Sorrento Electronics (SE) RM-1000 Radiation Monitor. The EMC test consists ofElectromagnetic Interference and Radio Frequency Interference (EMI/RFI) Emissions andSusceptibility. The TP establishes and the test fulfills the requirements for the SE RM-1 000 EMCtests per the Electric Power Research Institute (EPRI) EMI testing guidelines. The TP includes theSE procedure and references to the Vendor Test Plan to qualify the RM-1 000 radiation monitoringprocessor modules, and associated equipment, as well as to provide a place for recording such datafor future traceability.

2. REFERENCE DOCUMENTSThe EMC standards to which the system will be tested are listed below and are summarized in Table1 EPRI RM-1000 EMC TEST STANDARDS. Note that these are international standards and UnitedStates military standards referenced by the EPRI TR-1 02323-R2, 2000 Guidelines forElectromagnetic Interference Testing in Power Plants.

TEST PARAMETER STANDARDS

LF Conducted RF Immunity MIL-STD-461ECS-101

HF Conducted RF Immunity lEN 1000-4-6

LF Radiated RF Immunity MIL-STD-461 ERS-101

HF Radiated RE Immunity EN 61000-4-3 (1995)(IEC 1000-4-3)EN 61000-4-5 (1995)

Surge Immunity (IEC 1000-4-5)

Electrical Fast Transient/Burst Immunity EN 61000-4-4 (1995)(lEN 1000-4-4)

Electrostatic Discharge Immunity EN 61000-4-2 (1995)__________________________________ (IEC 1000-4-2)

MIL-STD-461 ELF Conducted RF Emissions CE-S -1

CE-101

HF Conducted RF Emissions MIL-STD-461 ECE-102MIL-STD-461 E

LF Radiated RF Emissions RE-i 0RE-1 01EN 55022,

HF Radiated RF Emissions Ca AClass A

EN 61000-4-8 (1994)Magnetic Field Immunity IEC 1000-4-8)

Voltage Dips, Short Interruptions & Voltage EN 61000-4-11 (1994)Variations Immunity (IEC 1000-4-11)

•1-•1 I L"• I k I • {'• •"t

VU0IIUoor-.

SENSITIVEISSUED BY NUMBER TITLE

EPRI TR-102323-Rev. 2, Nov. 2000 Guidelines for Electromagnetic InterferenceTesting of Power Plant Equipment

RM-1000 Module Acceptance Test Procedure

Connection Diagram, EMC Test, RM-1 000,

04509015Rev. - Page 4



r, , 3. EQUIPMENT TO BE TESTED

The equipment to be tested consist of the following:

BUSINESS ISENSITIVE NTY ITEM

4. ELECTROMAGNETIC EMISSIONS AND SUSCEPTIBILITYREQUIREMENTS

The Equipment Under Test (EUT) shall be subjected to the conducted and radiated susceptibilitystandards listed in Section 2 of this Test Procedure. These requirements are summarized in Table 1.

5. EQUIPMENT REQUIREDThe accuracy of all test equipment will be at least ten times better than the tolerance of the requiredmeasurement. Ensure that calibration due date exceeds duration of the test or alternate equipment isreadily available. (Use equivalent or better equipment).

5.1 Vendor-Supplied Equipment(Equipment to be supplied by the testing service)

Note: All Vendor test e6quip*menhtshall conform to MIL-STD-45662,and shall be traceable to.NlST*.-.C

The testing laboratory shall provide all equipment necessary to perform the tests described, exceptthose items listed in Section 5.2 to be supplied by Sorrento Electronics.

IBUSINESS

SENSITIVE

5.2 Sorrento Electronics Supplied Equipment

BUSINESSSENSITIVE est articles consisting of the following:

K'.).

04509015Rev. - Page 5


RM-1000 EMC Test Report (redact)iBUSIESS Test Equipment Rack containing the above items, interconnecting wires/detector cables and

SENSITIVEi associated components.

6. DESCRIPTION OF EQUIPMENT TO BE TESTED

This section describes the EMC tests to be performed. The tests are to be performed in the followingsequence:

1. Wiring connections.2. Calibration.3. Test set-up.4. Pretest Conditions5. Power up and test condition.6. Test.

Authorized changes to this procedure will be appended to this procedure as testing notes (Table 2)with a marked copy of the procedure. Notes shall be numbered and referenced to the section andstep. Notes may contain procedure changes, useful information and explanations, and shall besigned and dated at the end of each note by the cognizant engineer and QA representative. TestingNotes shall be filed in Appendix A of this procedure.

Deviations, including procedure changes, shall be noted on the Deviation Record Sheet (Table 3)and discrepancies shall be noted on a Non-Conformance Material Report (NMR). Deviation RecordSheets shall be filed in Appendix A of this procedure.

Record the test equipment used for the following test on Table 4, Test Equipment.

Record the articles tested in the following sections on Table 5, Test Articles.

Initial each step as it is completed.

The completed EMC Test Reports shall be retained in the SE Document Center.

7. EMC QUALIFICATION

7.1 Wiring ConnectionsWiring, interconnecting cables, conduit and connections are described in the followingdocuments/drawings:

IBUSINES',S

SENSITIVEThe primary power applied to the test sample will be •

The EUT assemblies shall be grounded to the ground plane via a bond strap.

04509015Rev. - Page 6



7.2 Calibration

7.2.1 Area RM-1000 (Type I) Calibration

BUSINESSSENSITIVE

Calibrate the Area RM-1000 as follows:

Power Supply Voltage Checks

Voltages are measured at test points located on connector P302 on the Output board. Refer toFigure 1 for test point locations.

A&2 1. Open hinged front panel.

4,0w 2. Verify RM-1000 power suppI is providing +24 VD 5) to module by measurat P302M

Baseline Restorer Adiustment

. 1. Turn high voltage off so there will be no input pulses.

, 2. Connect multimeter (2V range) to P202-3 (+) and P202-4 (-) on counter board.

ka!! 3. Acceptable 'as found' value is

W..-• 4. Adjust BLR ADJUST (R209) on counter board to obtain 0.000 (-0.001 to +0.001) VDC.

ing

BUSINESSSENSITIVE

Analog Output Calibration

/,,IA 1. Connect DMM (20 VDC scale) to P302-1 (+) and P302-2 (-) on Output board.

_f 2. Select ANALOG function.

3. Enter value equal to bottom of range (1.00E1).

_ 4. Adjust ZERO trim pot on Output board to obtain 0.00 VDC (-0.01 to 0.01).

5. Enter value equal to top of range (1.00E6).

6. Adjust SPAN trim pot on Output board to obtain 10.00 VDC (9.99 to 10.01).

7. Repeat Steps 3 through 6 to obtain required tolerance.


9. Adjust RM-4 to obtain 5V output.

_ 10. Press (CLR) to exit ANALOG function.

7.2.2 Process RM-1000 (Type II) Calibration

Calibrate the Process RM-1000 as follows:

Power Supplv Voltage Checks

Voltages are measured at test points located on connector P302 on the Output board. Refer toFigure 1 for test point locations.

04509015Rev. - Page 7



4/.__ 1. Open hinged front panel.

&1i&- 2. Verify RM-1000 power su"oly is Drovidin +24 VDC, (+2r S + odule by measur

BUSINESS]SENSITIVE

Baseline Restorer Adjustment

__ 1. Turn high voltage off so there will be no input pulses.

t,'¢- 2. Connect multimeter (2V range) to P202-3 (+) and P202-4 (-) on counter board.

BUSINESS 4,!_•' 3. Acceptable 'as found'value isSENSITIVEI

L1 4. Adjust BLR ADJUST (R209) on counter board to obtain 0.000 (-0.001 to +0.001) VDC.

ing

I

Analocq Output Calibration

,,.J4 1. Connect DMM (20 VDC scale) to P302-1 (+) and P302-2 (-) on Output board.

1 2. Select ANALOG function.

i 3. Enter value equal to bottom of range (1.OOE1).

4. Adjust ZERO trim pot on Output board to obtain 0.00 VDC (-0.01 to 0.01).


- 6. Adjust SPAN trim pot on Output board to obtain 10.00 VDC (9.99 to 10.01).

7. Repeat Steps 3 through 6 to obtain required tolerance.


9. Adjust RM-4 to obtain 5V output.

10. Press (CLR) to exit ANALOG function.

8. Test Set Up

This section describes the EMC test set up.

- 1. Vendor shall perform receiving inspection of SE equipment and record componentsidentification and serial number.

2. Vendor shall install SE provided equipment.

,,4•w SE verify installation _ _ _

4 3. Connect cables from SE supplied equipment to Vendor support and test equipment.

BUSINESS I j SE verify installationSENSITIVE

eA.,2 ' 4. SE to connect the Area and Process RM-1000 modules to the appropriate remote testpanel and detectors via cable assemblies.

04509015Rev. - Page 8



For each RM-1 000, connect a chart recorder to the following circuits:

S5. Adjust the Area RM-1000 RM4 for 0-5v @ chart recorder Chan. 1.

~ 6. Adjust the Process RM-1000 RM4 for 0-5v @ chart recorder Chan. 3.

Note: Set up the recorder to accommodate 0-5 V dc outputs. The Failure, Trip 1 (alert) and Trip 2(high) circuits are relay contacts and require an appropriate voltage applied. Maintain the chartrecorder on throughout the test at the slowest chart speed. Annotate the chart at the start and end ofeach test step.

z 7. SE to connect the relay circuits to the recorder. Record the channels (it is acceptable toelectrically connect more that one relay to the same recorder channel).BoUSINESSl

SENSITIVE RM-1000 Relay Pin Outs Description Data Recorder Chan. No.

t 8. SE to connect and set up the Area and Process RM-1 000 detectors.

BUSINESS ] Detector Type

SENSITIVE Detector Type

4 9. With the Area RM-1000 connected to the detector and the power on, confirm the outputsignal. The test to be performed by SE personnel.

BUSIEISENS

IBUSIxSENS

BUSI

ISENS

IBUESISEN

4ESSIITIjyE

Display Volts dc @ Recorder Chan. 1

10. Set the high trip (red alarm) to 150% above background. Set the low trip (amber alert) to75 % below background. Record the settings. This test to be performed by SEpersonnel.

ESSis a cm Se;ITIVE11O

, 11. With the Process RM-1000 connected to the detector and the power on, confirm theoutput signal. The test to be performed by SE personnel.

ESSM~ i der Chan. 3

4 12. Set the high trip (red alarm) to 150% above background. Set the low trip (amber alert) to75 % below background. Record the settings. This test to be performed by SEpersonnel.

I Dis lay (cpm) Settina coinINsESSL

04509015Rev. - Page 9



BUSINESSSENSITIVE ° The primary power applied to thes ste dr test is 230 volts ac, 50 +/- 5 Hertz. Record the

voltage prior to starting the test

All electromagnetic interference and susceptibility tests described herein may be witnessed bypersonnel approved by the SE representative.

A detailed log will be kept throughout the entire test period. Sample sheets are shown inAppendix D.

" The EUT shall be monitored during Susceptibility Testing for indications of degradation ormalfunction. This monitoring is normally accomplished through the use of built-in test visualdisplays, aural outputs, and other measurements of signal outputs and interferences. Monitoringof EUT performance through installation of special circuitry in the EUT is permissible; however,these modifications shall not influence test results.

" Measurement equipment shall be as specified in the individual test methods of the Vendor'sprocedure/test plan.

* Electromagnetic susceptibility tests described herein may be performed in any sequenceindicated in Table 1 of this document.

* In the event that test plan deviations are required during the normal qualification test program,they shall be made only on approval of the SE representative and that of the SE QualityAssurance representative and shall be noted in the Test Log with a complete description andjustification for such deviations.

9. Power Up and Test ConditionThis section contains the procedure for setting up the Area and Process RM-1000s. These tests to beperformed by SE personnel.

9.1 AREA RM-1000 (Type I) Power Up and Test ConditionBUSINESS L

_SENSITIVE 1. Apply power to the Area RM-1 000 module.

Z4 2. Verify that a normal activity screen is displayed. Record the current activity

& 3. Verify that the green operate LED is lighted, the yellow trip 1 (alert) is off and the red trip2 (high) is off. Set trip points as specified in Section 8.

6-jj., 4. At the RM-1 000 dis la confirm tri 1 alert is set as in Section 8 and confirm th etrip is set to Record the setpoint value

6 5. Verify that the trip 1 (alert) yellow LED is lighted.

•Sc.- 6. At the RM-1 000 display, confirm tri 2 alarm is set as in Section 8 and confirm that thei0• Record the set point value

cIW 7. Verify that the trip 2 (alarm) red LED is not lighted.

04509015Rev. - Page 10


RM-1000 EMC Test Report (redact)BUSINESS'SENSITIVE , 8. Record the analog output at the chart recorder.

I Displav I Volts dc @ Recorder Chan. 1

BUSINESSSENSITIVEJ 9.2 Process RM-1000 (Type II) Power Up and Test Condition

&2dLJ 1. Apply power to the Process RM-1000 module.

4t-/ 2. Verify that a normal activity screen is. Record the current activity

& 3. Verify that the green operate LED is lighted, the yellow trip 1 (alert) is off and the red trip2 (high) is off. Set trip points as specified in Section 8.

id&f.) 4. At the RM-1000d' I r rt) is set as in Section 8 and c pis set to . Record the set point valuee

I 5. Verify that the trip 1 (alert) yellow LED is lighted.

) 6. At the RM-1 000 display, verify trip 2 (alarm) is set as in Section 8 and confirm that the tripis set to a . Record the set point value

7.

8.

Verify that the trip 2 (alarm) red LED is not lighted.

Record the analog output at the chart recorder.

Dislay Volts dc @ Recorder Chan. 3

04509015Rev. - Page 11



10. Acceptance Criteria

10.1 Emissions Test

1. For the conducted emissions test, the broadband electromagnetic emissions on the acpower line shall not exceed the values in Table 1.

10.2 Susceptibility Test

BUSINESSSENSITIVEJ

1. The susceptibility criteria will be that of no sign of degradation of erformance or componentceedance of either the alert or alarm

A Wip set points on the face of the RM -1000 in the normal operationmode. (Exceedance is further discussed in 10.2.3.) The RM - 1000 will be visually monitoredto indicate failure or loss of data during the entire test.

2. Equipment shall not malfunction and shall not have undesired response, degradedperformance or permanent damage when subjected to the susceptibility test. A malfunction isdefined as a loss of safety function. Safety function is defined as the ability to detect anincrease in radiation level. Undesired response is a false indication of excessive radiationlevels.

3. Record any exceedance ckgroundupper and lower limits of the data on the RM-1 000 screen as established in Section 8, steps10 and 12. Evaluate this data to establish 10 volts/meter susceptibility test conformance andto further confirm susceptibility test compliance with the limits established in Section 8.

Test 1Test 2Test 3Test 4Test 5Test 6

Lower Limit fLower Limit 7Lower Limit ,,Lower Limit fLower Limit "Lower Limit .,

Upper Limit i

Upper Limit 7Upper Limit ,Upper Limit 7Upper Limit .Upper Limit 7

4. Failure of fuses or surge limiting protective devices during the Surge Susceptibility test willnot be deemed a failure of the RM-1 000 Radiation Monitor.

5. After each susceptibility test, the Radiation Monitor must successfully pass the abbreviatedfunctional test described in Section 10.3 (file in Appendix C). At the conclusion of all testing,the monitors must successfully pass the complete functional test described in Section 10.4(file in Appendix D).

10.3 Abbreviated Functional Test

After each susceptibility test, confirm below and file data in Appendix C:

1. Low alert and high alarm lights are illuminated per display levels.

2. Display shows normal operation and no loss of pixels or data.

3. Chart recorder is correctly recording data.

04509015Rev. - Page 12



10.4 Post Functional Test

At the conclusion of all testing, perform the following functional tests. File the strip chartrecords and any additional data in Appendix D. This confirms continued acceptable operation

BUSINESSI of the equipment.

SENSITIVE10.4.1 Area RM-1000 System

BUSINESS]SENSITIVE

10.4.2 Process RM-1 000 System

10.4.3 RM-1 000 Functional Tests

Perform functional test per SE procedure 04509001 for each RM-1000 module.

Area RM-1000 module SN CENVG & ol

Process RM-1000 module SN CAiG0.oZ

04509015Rev. - Page 13



11. TEST REPORT

On completion of these tests, a separate report(s) shall be issued. In accordance with theappropriate provisions, the approved Vendor's Test Plan shall be included as an appendix to thereport if applicable.

The testing service providing the test chamber shall prepare a test report with the followinginformation:

1. Test facility location and description of equipment used, including manufacturer,model, serial number, and calibration dates, if applicable.

2. Description of test set up including reference dimensions.

3. Test method and conditions, including key test parameters.

4. Test data including photographs.

5. Results and conclusions.

6. Approval signatures by Test Engineer, Vendor Engineer, and date.

04509015Rev. - Page 14



Appendix A MISCELLANEOUS INFORMATION

04509015Rev. - Page 15



Figure 1 Test Points and Adjustments

04509015Rev. - Page 16

25402-011 -VI A-HARA-00212-001General Ato s HARP

RM-1000 EMC Test Re redact|M CiiWTABLE 1 RM-1000 EMC TEST STANDARDS

TESTPARAMETER STANDARDS FREQUENCY

RANGETEST

LEVEULIMITANTENNA REMARKSDISTANCE I

LF Conducted MIL-STD-461 E 100 Hz to 5 kHz 142 dBgAImmunity CS-101 5 kHz to 50 kHz 142 - 122 dBKA

HF Conducted EN61000-4-6 (1996) 10 kHz to 200 MHz 10 V open ckt. (unmod. rms) NAImmunity (IEC 1000-4-6) 80% AM, 1 kHz

LF Radiated MIL-STD-461 E 30 Hz to 60 Hz 180 dBpTImmunity RS-101 60 Hz to 100 kHz 180 - 116 dBpT

HF Radiated EN 61000-4-3 (1998) 30 MHz to 10 GHz 10 V/meter, 80% AM, 3 metersImmunity (IEC 1000-4-3) 1 kHz

Surge EN 61000-4-5 (1995) NA + 2 kV common mode; NAImmunity (IEC 1000-4-5) + 1 kV differential mode

EFT/Burst EN 61000-4-4 (1995) NA Power leads: + 2kV NAImmunity (IEC 1000-4-4) Data/control leads: + I kV

Electrostatic Discharge EN 61000-4-2 (1995) NA Contact discharge: + 4 kV NAImmunity (IEC 1000-4-2) Air discharge: + 8 kV

MIL-STD-461 E 100 Hz to 1 kHz 110 dB.iALF Conducted Emissions CE-101 NA

1 kHz to 10 kHz 110 - 90 dBgIA

MIL-STD-461 E 10 kHz to 100 kHz 90 - 60 dBpAHF Conducted Emissions CE-102 NAE-02100 kHz to 10 MHz 60 - 40dBlIA

MIL-STD-461 E 30 Hz to 60 Hz 160 dBpTLF Radiated Emissions RE117cmRE-101 60 Hz to 100 kHz 160 - 96 dBpT

30 MHz to 230 MHz 40 dBgV/meterHF Radiated Emissions EN 55022, Class A 10 meters

230 MHz to 1 GHz 47 dB13V/meterMagnetic Field EN 61000-4-8 (1994) 50 Hz 30 A (RMS) /meter NA

Immunity (IEC 1000-4-8) 5H3A(M /tNVoltage Dips, Short EN 61000-4-11 (1994) 70% for 10 ms,

Interruptions & Voltage (IEC 1000-4-11 ) NA 40% for 100 ms, NAVariations Immunity 0 V for 5 sec

04509015Rev. - Page 17



Table 2 TESTING NOTES

Note No. Section No. Notes

4 1 ]+

4 +

4 +

4 ±

-4 4-

I- 4

4 -1

4 4

I 4

4 4

4 4

4 4

I' 4

F 4

I 4

I. *

Recorded By Date

04509015Rev.- Page 18



Table 3 DEVIATION RECORD SHEET

Step No. NMR No. Deviation

4 +

4 4-

4 4

4 4

I- 4

t I

Recorded By Date

04509015Rev. - Page 19


RM-1000 EMC Test Report (redact)BUSINESSSENSITVEI

Table 4 TEST EQUIPMENT

Description Manufacturer Model I S/N Calibration DateS/ .... Dat ,-..

Recorded By Date IX--13le 2-

04509015Rev. - Page 20


RM-1000 EMC Test Report (redact)BUSINESSSENSITIVEI

Table 5 TEST ARTICLE

Component Manufacturer Manufacturer SE Part Serial No.

Date of Test Start Z4--/ C,.7-

Test Operator's Signature Date 12-,/4 7

QA Signature C. h '4 .-- Date 1 2. 1 3/C.0

04509015Rev. - Page 21


RM-1000 EMC Test Report (redact)BUSINESSSENSITIVE

Appendix B PRE EMC FUNCTIONAL TEST

04509015Rev. - Page 22



BUSINESSSENSITIVE1 Appendix C ABBREVIATED EMC FUNCTIONAL TEST

04509015Rev. - Page 23



Appendix D POST EMC FUNCTIONAL TEST

See " -re \0 '+t

04509015Rev. - Page 24



Appendix E CHECKLIST FOR SUSCEPTIBILITY TESTS

NOTE: All units must pass (except surge may fail protection devices)

BUSINESSSENSITIVE1

1. Cc

2. Al,

Initial When Verified

/.. J,,.J

3. Alarm outputs maintained and cannot change state

IBUSINESS 14. Activity level cannot vary more than statistical

SENSITIVE

5. Memory maintained cannot be lost (avoid discussionof perturbation of data base)

6. Display may flash, go dark, or reset, as long asabove are not affected. Manual reset may be

Arequired.

04509015Rev. - Page 25

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