International Workshop on Plasma Diagnostics and Application, 2-3July 2009, NIE, NTU, Singapore
Alireza TalebiTaher, M.V. Roshan, P. Shutler,
R.S. Rawat, P. Lee, S.V. Springham
Plasma Radiation Sources Laboratory (PRSL)
Natural Science and Education (NSSE)
National Institute of Education (NIE)
Nanyang Technological University (NTU)
International Workshop on Plasma Diagnostics and Application, 2-3July 2009, NIE, NTU, Singapore
Capacitance (C0) 28.8 F (0.6 F 48)
Charging voltage (max) 15 kV
Energy (E0) 3 kJ
Inductance of circuit (L0) 26 nH
Impedance (Z0) 30 m
Anode radius (α) 11.5 mm
Cathode radius (b) 32.0 mm
Repetition rate (max) 16 Hz
Max. current (at 12.5 kV) 410 kA
Operating Gas H2 , D2 , Ne , Ar
NX2 Plasma Focus Device
International Workshop on Plasma Diagnostics and Application, 2-3July 2009, NIE, NTU, Singapore
Breakdown Phase
Axial Acceleration Phase
Radial Phase
Ca
tho
de
Ca
tho
de
Anode
Insulator
High Voltage
Power Supply
(Charger)
Pseudo Spark
Gap Switch
28.8 μF / 15kV
soft x-ray, hard x-ray, ray, high energy
deuteron and electron and
fusion products:
D + D p (3Mev) + T (1Mev) 50%
D + D n (2.5Mev) + He (0.8Mev) 50%
Plasma Focus phases
Motivation and Application
Plasma Focus Imaging by:
Conventional Camera
Shadowgraphy
X-Ray radiography
Fusion Source Imaging by Proton Tracking
Application:
Astronomy
Medical Radiography
International Workshop on Plasma Diagnostics and Application, 2-3July 2009, NIE, NTU, Singapore
International Workshop on Plasma Diagnostics and Application, 2-3July 2009, NIE, NTU, Singapore
Aperture Imaging
Optical Imaging
Pinhole Imaging
Depth of Field
Chromatic Aberration
X-ray, -ray, particles
Little light or particle
bigger pinhole !
Coded Aperture Imaging…
Encoded Image
Decoded Image
International Workshop on Plasma Diagnostics and Application, 2-3July 2009, NIE, NTU, Singapore
Mask FabricationHAVAR alloy
Co, Fe, Cr, Ni, W, Mo, Mn and C
Micro-EDM
Mask pattern
2020 pixels
57 holes with 6.3% open area
International Workshop on Plasma Diagnostics and Application, 2-3July 2009, NIE, NTU, Singapore
Particle
Filter
Proton min.
energy (MeV)
Deuteron min.
energy (MeV)
Kapton (50μm) 1.8 2.3
Kapton (75μm) 2.3 3.0
Kapton (100μm) 2.7 3.6
3 MeV proton
residue energy
depth of proton
in CR-39
3 MeV deuteron
residue energy
depth of deuteron
in CR-39
Kapton
(50μm)2.1 67 1.5 25
Kapton
(75μm)1.6 41 0.05 0
Detector: CR-39 (PM355)
Chemical formula (C12H18O7)
Etching
Etchant chemistry (KOH, NaOH,…)
Molarity
Temperature
Etching Time
International Workshop on Plasma Diagnostics and Application, 2-3July 2009, NIE, NTU, Singapore
Radium-226 (5μCi – 24110 years – 4.87 to 5.6 MeV)
Experimental Setup with source
International Workshop on Plasma Diagnostics and Application, 2-3July 2009, NIE, NTU, Singapore
Experimental Result with source
1 point source 2 point source Rectangular source
International Workshop on Plasma Diagnostics and Application, 2-3July 2009, NIE, NTU, Singapore
Experimental Setup with PF
Camera 35 degree
90 degree0 degree
International Workshop on Plasma Diagnostics and Application, 2-3July 2009, NIE, NTU, Singapore
Experimental Result with PF
0 degree 35 degree90 degree
International Workshop on Plasma Diagnostics and Application, 2-3July 2009, NIE, NTU, Singapore
Coded Aperture Imaging works well for Fusion Source Imaging in Plasma Focus Device.
The Fusion Source in NX2 looks like a cylinder around the pinch.
For Extended source, we need a bigger mask and naturally bigger detector.
By mixing these results with proton and neutron anisotropy, we can reach to a better understanding about plasma fusion behavior in Plasma Focus device.
Conclusion!
International Workshop on Plasma Diagnostics and Application, 2-3July 2009, NIE, NTU, Singapore
Thank you
Q ? and A!