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The top documents tagged [sample distance]
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sample distance
afm vs sem
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Tonnage Uncertainty Assessment of Vein Type Deposits
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Col Loch
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Raul F. Garcia-Sanchez, Prabhakar Misra Department of Physics and Astronomy Howard University June 15, 2014 1.
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CXI Sébastien BOUTET
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CXI Reference Laser System Preliminary Design Review WBS 1.3.3 Sébastien Boutet – CXI Instrument Scientist.
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Xiaoyu Che. Atomic force microscopy(AFM) is one of the foremost tools for imaging, measuring and manipulating matter at the nanoscale A type of scanning.
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03. Preparasi Bahan Galian
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PREPARASI minerals. Mining in the world economic stage, particularly where the work sampling, and calculation preparasi quality or mineral content is.
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Trinity Charging Experiment Gregg Harry, MIT On behalf of Dennis Ugolini, Trinity LIGO-G060462-00-R.
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Atomic Force Microscopy & Chemical Force Microscopy
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Dylan D. Wood and Ravhi S. Kumar* Department of Physics and Astronomy, Vanderbilt University, Nashville, TN 37235 *HiPSEC and Department of Physics and.
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Methods and T ehni ques in Surface Science
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