Two Mechanisms of Resistive Switching in Peroveskite Oxide...

transcript

Kuijuan Jin

Institute of Physics Chinese Academy of Sciences Beijing 100190

Two Mechanisms of Resistive Switching in Peroveskite Oxide Thin Films

Collaborators

Prof. Can wang Zhongtang Xu Dr. Lin Gu Dr. Chen Ge Ruiqiang Zhao Dr. Haizhong Guo Yuling Jin Prof. Meng He, Prof. Guozhen Yang

Institute of Physics Chinese Academy of Sciences

School of Microelectronics

Fudan University

Anquan Jiang

Yonggang Zhao

Department of Physics

Tsinghua University

Outline

Background

Ferroelectric Polarization Controlled Resistive Switching and Switchable Diode Effect in BFO films

Growth of BFO epitaxial thin films Evidence for ferroelectric resistive switching Switchable diode effect and selfconsistent calculation

Evidence for a crucial role played by the oxygen vacancies

in LaMnO3 resistive switching memories

Resistive switching & Classification

Unipolar switching (VSET>VRESET)

Bipolar switching (VSET~ -VRESET)

R. Waser et al, Adv. Mater. 21, 2632(2009)

Ferroelectric resistive

switching

Switching modes: Switching mechanisms:

Non-Ferroelectric

resistive switching

Ferroelectric resistive switching

Ferroelectric resistive switching ≠ Resistive switching in ferroelectrics

Nonferroelectric resistive switching (TiO2, CuO, SrTiO3, Pr0.7Ca0.3MnO3, etc) Related to redox reaction, migrating of ions and vacancies, etc

Formation of conductive filaments

Polarization switching Ferroelectric resistive switching Ferroelectric tunneling effect (super thin films or FTJs) Switchable diode effect (thin films & bulks)

{ Bipolar

Switchable diode effect in BiFeO3 crystal

SCIENCE 324, 63(2009)

The forward direction of the diode is determined by the ferroelectric polarization, and it can be reproducibly switched by large external electric fields.

BFO crystal

BFO crystal bulk with Ag electrodes

Our results

observed in epitaxial BiFeO3 thin films

Epitaxial growth of BFO/SRO/STO by Laser-MBE

20 30 40 50 60 70

0 90 180 270 360 STO

φ (degree)

XRD and HRTEM characterization of BFO thin film

-6 -3 0 3 6

ent (µA

Voltage(V)

STOSROBFO

-4 -2 0 2 4

ent (µA

)Voltage(V)

Current-voltage hysteresis loops

Bipolar resistive switching Switchable diode effect

25 cycles

-6 -3 0 3 6-2.0-1.5-1.0-0.50.00.51.01.52.0

ent (µA

Voltage(V)

Current hysteresis & Ferroelectricity

-30 -20 -10 0 10 20 30-80

-5 0 5

6 V 8 12 15 18 22 26 30

Voltage (V)

Drive Voltage

Ferroelectric loops measured at 50 kHz with various voltages 6–30 V

IV curves measured with various sweeping voltage

Appl. Phys. Lett. 98, 192901 (2011)

Direct evidence for ferroelectric resistive switching

-20 -10 0 10 20

-60-40-20

0204060

-20 -10 0 10 200.00.20.40.60.81.01.21.4

Voltage of the applied pulse (V)

J read

Adv. Mater. 23, 1277 (2011)

Piezoelectric phase image of original preferred polarization patterns (downward) switched upward through PFM tip scanning of the film surface at –8 V within a square area of 3 × 3 μ m 2 . After that, the polarization in the center 1 × 1 μ m 2 area is scanned downward at + 8 V. c). The diode current mapping at –3 V.

Toward a ferroelectric resistive memory

100 101 102 103 104 105 106 10710-2

Polarized at-10 V/1 µs+10 V/1 µs

time (s)

Reading at -2.0 V

One month

Non-destructive readout nonvolatile RAM This device has a memory that lasts for months, a sufficiently high on current and on/off ratio to permit ordinary sense amplifiers to measure “1” or “0”, and is fully compatible with complementary metal-oxide semiconductor processing.

Adv. Mater. 23, 1277 (2011) Appl. Phys. Lett. 98, 192901 (2011)

-2 -1 0 1 2-6

-2 -1 0 1 2 -2 -1 0 1 2

Polarized downat -8 V

Polarized upat 8 V

Virgin state

Voltage (V)

Numerical calculation for the MFM structures

0 100 200 300

X (nm)

0 100 200 3001010

X (nm)

Doping

Non Polarization for Pt/BFO/Pt

Schematic Structures Band Diagram

Charge Density I-V

-2 -1 0 1 2-400

Voltage (V)

0 100 200 300

X (nm)

Right Polarization for Pt/BFO/Pt

Charge Density I-V

-2 -1 0 1 2-400

Voltage (V)0 100 200 300

X (nm)

Doping

0 100 200 300

EFEner

X (nm)

0 100 200 3001010

X (nm)

Doping

Left Polarization for Pt/BFO/Pt

Charge Density I-V

-2 -1 0 1 2-400

Voltage (V)

0 100 200 300

X (nm)

0 100 200 300

X (nm)

0 100 200 30010-10

X (nm)

Doping

SRO PtBFO

0 100 200 30010-10

X (nm)

Doping

Calculated results for SrRuO3/BiFeO3/Pt

-2 -1 0 1 2-8

Experimental Data Theoretical Results

Voltage (V)

-2 -1 0 1 2-8

Experimental Data Theoretical Results

Voltage (V)

Appl. Phys. Lett., 99 (2011) 063509 Theoretical proof for ferroelectric resistive switching

Interface barrier playing an important role in the Switchable diode effect

J. Appl. Phys. 111, 054104 (2012)

Doping density effect

Thickness of the film Thickness of the film

Thickness effect

J. Appl. Phys. 111, 054104 (2012)

Conclusions

Switchable diode effect & ferroelectric resistive switching were observed in the epitaxial BFO thin films.

Direct evidence for the ferroelectric resistive switching. Our theoretical results verify that the ferroelectric

polarization can modulate the interface barrier and dominate the switchable diode effect.

Open a way to novel ferro-resistive memory

Outline

Background

Ferroelectric Polarization Controlled Resistive Switching and Switchable Diode Effect in BFO films

Growth of BTO epitaxial thin films Evidence for ferroelectric resistive switching Switchable diode effect and selfconsistent calculation

Evidence for a crucial role played by the oxygen vacancies

in LaMnO3 resistive switching memories

Thickness：~100nm

substrate： SrTiO3:Nb (0.8 wt%) (SNTO)

SXRD patterns for LaMnO3 thin films

SXRD for films fabricated under the various oxygen pressures 10, 5×10-2, and 5×10-4 Pa are 3.892, 3.973, and 4.014 Å, respectively.

c-axis lattice constant of the LMO films becomes larger, owing to the increase of the oxygen vacancies

high-resolution Synchrotron X-ray diffractometry by the BL14B1 beam line of Shanghai Synchrotron Radiation Facility (SSRF).

An aberration-corrected annular-bright-field scanning transmission electron micrographs of the LMO/SNTO interfaces along the [001] axis corresponding to oxygen pressures of 10 Pa, 5×10-2 Pa, and 5×10-4 Pa,

Films fabricated in lower oxygen pressure are with more oxygen vacancies

LaMnO3 resistive switching memories

Small 8, 1279–1284 (2012)

Typical I-V curves for Pt/LMO/SNTO devices under various oxygen pressure

The ROFF/RON ratios are indicated by numbers.

LaMnO3 resistive switching memories

Pulse measurements of the Pt/LMO/SNTO devices with fabrication oxygen pressure of 5×10-4 Pa. The pulse condition for HRS is +5 V with a pulse width of 1 ms and for LRS is −5 V with a pulse width of 1 ms. The resistance was readout at 0.1 µA.

None obvious decay was observed within 10000 cycles

( ) ( ( ) ( ) )s

x q p x n x Ndxψ

= − − +∂

( )( ) 1 ( )nJ xn x U xt q x

∂∂= −

∂ ∂( )( ) 1 ( )pJ xp x U x

t q x∂∂

= − −∂ ∂

( )( ) ( ) nn n

xJ x qu n xx

φ∂= −

∂( )

( ) ( ) pp p

xJ x qu p x

xφ∂

= −∂

( ) ( ) ( )n pJ x J x J x= +

( ) exp( ( ( ) ( )))i nqn x n x x

kTψ φ= −

( ) exp( ( ( ) ( )))i pqp x n x x

kTφ ψ= −

(2) (3) (4) (5) (6)

(7) (8)

Theoretical modelling

different states for Pt/LMO/SNTO at the Pt/LMO Schottky interface. When negative voltage applied on the TE, the oxygen vacancies will accumulate at the Pt/LMO interface, making the doping density at the Pt/LMO increase, while the oxygen vacancies will migrate away from the Pt/LMO interface, giving rise to the decrease of doping density under the forward bias.

Oxygen – Oxygen vacancy + Negative bias + moving to the interface S2 Forward bias + moving away from interface S3

Small 8, 1279–1284 (2012)

1. The results of X-ray diffraction verify that with the decrease of the oxygen pressures, the c-axis lattice constant of the LMO films becomes larger, owing to the increase of the oxygen vacancies.

2. An ABF STEM with atomic resolution and sensitivity for light elements is used, which clearly shows that the number of oxygen vacancies increases with the decrease of oxygen pressures during fabrication.

3. The resistive switching property becomes more pronounced with more oxygen vacancies contained in LMO films.

4. A numerical model based on the modification of the interface property induced by the migration of oxygen vacancies in these structures is proposed to elucidate the underlying physical origins.

Conclusion

Thank you for your attention!

http://L03.iphy.ac.cn

Acknowledgement: People in L03 group

S1 S2 S3

Concentration (cm-3)

Mobility (cm2/(V.s))

Band Gap (eV)

Conduction band（eV）

9.8×1019

3.5×1019

5×1018

Dielectric constant: 10

Carrier lifetime: 10-9s Electron mass: 3

Hole mass: 5

The experimental (diamonds) and calculated (lines) I-V in the case of RP (a) and LP (b) for the SrRuO3/BiFeO3/Pt structure.

The parameters used in our calculations

Appl. Phys. Lett., 98 (2011) 192901; Appl. Phys. Lett., 99 (2011) 063509

J. Appl. Phys. 111, 054104 (2012)

铁电薄膜介电常数的影响

Ferroelectric Diode

-3000 -2000 -1000 0 1000 2000 3000

20BFO/STO(001)

45 nm 90 180 360

Ferromagnetic property at room temperature

Growth of oxide thin films by Laser Molecular Beam Epitaxy

SRO/STO

40 60 80 100 120

240laser off

SrRuO3 on STO substrateat 2*10-4 Pa, 300 pulses

laser on

RHEED oscillations

Schematic illustration of laser MBE system

Vacuum chamber

RHEED Screen

Substrate heater

RHEED Gun Laser

Multi-target carrousel

Giant resistive switching in FTJs ?

E. Y. Tsymbal, et al, SCIENCE 313, 181(2006)

Mechanisms affecting tunneling in ferroelectric tunnel junctions (FTJs): (a) electrostatic potential at the interface, (b) interface bonding, (c) strain.

“… ferroelectric tunnel junctions, which take advantage of a ferroelectric as the barrier potential…may have a profound effect on the conductance leading to a resistive switching…”

Science, 324 (2009) 63 JAP, 109 (2011) 084108

BiFeO3

BaTiO3

Switchable diode effect in bulk ferroelectrics

Nature Mater., 8 (2009) 485

Adv. Mater., 23 (2011) 1277

Appl. Phys. Lett., 98 (2011) 192901

Phys. Rev. B, 84 (2011) 125305

Switchable diode effect in thin film ferroelectrics

材料体系分类过渡金属氧化物：NiOx,TiOx,Nb2O5,Ta2O5,CuOx,WOx,CoOx…

钙钛矿氧化物：SrTiO3,La1-xCaxMnO3,Pr1-xCaxMnO3…

单极性RS效应双极性RS效应 R. Waser Nat. Mater, 6 833 (2007)

Tunneling electroresistance effect

A combination of PFM and C-AFM techniques on nanometer-thick epitaxial BaTiO3 (4.8 nm) single crystal thin films

Nano Lett.,9, 3539( Aug. 2009)

Giant TER in ultrathin BTO/LSMO films (PFM phase image and C-AFM resistance mapping)

Nature 460, 81(Jul. 2009)

Two Mechanisms of Resistive Switching in Peroveskite Oxide...

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