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Lund University - Department for Electrical and Information Technology 2008/09 Advances in the mixed signal IC design group Mattias Andersson Mixed-Signal IC Design Department for Electrical and Information Technology Lund University 1
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Page 1: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

2008/09 Advances in themixed signal IC design group

Mattias Andersson

Mixed-Signal IC Design Department for Electrical and Information Technology

Lund University

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Page 2: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

Mixed Signal IC Design Researchers

• Associate Professor, Pietro Andreani• Assistant Professor, Martin Anderson (SoS-DSCs, nov 2008)• Post-Doc, Ping Lu (VR-ADPLL, april 2009)• Ph.D Student, Dejan Radjen (VR-UPD, feb. 2009)• Ph.D Student, Mattias Andersson (SoS-DSCs, feb. 2009)

• Adjunct Professor, Lars Sundström• Adjunct Professor, Sven Mattisson• Professor Emeritus, Jiren Yuan

CAD support: Stefan MolundLinux support: Erik Jonsson

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Page 3: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

Publications Summary 2008/2009

• Journal Papers: 6 (4 JSSC, 1 TMTT, 1 TCAS-II)• International Conference Papers: 3 (2 ISSCC, 1 NORCHIP)• Ph.D Thesis: 1• National Conference Papers / Presentations: >3

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Page 4: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

Class-C Harmonic CMOS VCOs, With a General Result on Phase Noise

Andrea Mazzanti and Pietro AndreaniIEEE Journal of Solid-State Circuits

Vol. 43, No. 12, pp. 2716-2729, Dec. 2008

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Page 5: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

Class-C thanks to tail capacitance Ctail

• Class C Larger amplitude, same noise for same Ibias

• Ctail from foe to friend

• MOS must not leave saturation Shift of MOS DC gate voltage

• 6M (Cu) 0.13µm CMOS (no thick metal layers)

• 2.0nH inductor, A-MOS varactors, tank-Q≈16-17

Ctail= 2·C2

Ibias

VDD

Ctank

L

Vbias

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Page 6: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

State-of-the-art phase-noise performance

fosc=4.90GHz

fosc=5.52GHz

-130dBc/Hz

• 4.90 GHz < fc< 5.65 GHz

• Vdd= 1V, Idd=1.4 mA

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Page 7: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

General result on phase noise

• Harmonic oscillators Phase noise generated by active devices in

oscillator core largely independent of the active device dimensions

Instead, determined by resonator losses

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Page 8: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

DT Modeling and Reductionof Clock Jitter Sensitivity

in CT Delta-Sigma Modulators

Martin Anderson and Lars Sundström

IEEE Transactions on Circuits and Systems II: Express Briefs, Vol. 56, No. 7, pp. 530-534, 2009

IEEE Journal of Solid-State Circuitsvol. 44, no. 2, pp. 473-483, 2009

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Page 9: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

Clock Phase-Noise Sensitivity Intro

DAC

H(s)vd[n]

clk

va(t)

vc(t)

clk

∫f0

Sd(f)

fclk

f

Sclk(f)

Close-in PN Input signal

Wideband PN Quantization noise

Shaped q-noise

Close in noise

Wideband noise

Desired signal

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Page 10: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

DT Clock Phase-Noise Modeling Method

Pulse-Width Noise (PWN) models the modulation between quantization

noise and wideband PN

Pulse-Position Noise (PPN) models the modulation with strong signals and

close in PN

Faster simulations witharbitrary input signals andarbitrary clock PN spectra

CT ∆Σmodulator

vc vd

Noisy clock

DT ∆Σmodulator

vd

Ideal clock

PPNmodel

Signal gen

PWN model

vc

PWN

PPN

vd PN

PNvd

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Page 11: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

1 10 100

-140

-120

-100

-80

-60

-40

PPN

PWN

DT sim.OFDM input signal

QN

Frequency [MHz]

Typical DT simulation output

spectra

DT Clock Phase-Noise Modeling Method

CT ∆Σmodulator

vc vd

Noisy clock

DT ∆Σmodulator

vd

Ideal clock

PPNmodel

Signal gen

PWN model

vc

PWN

PPN

vd PN

PNvd

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Page 12: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

DT Modeling Summary and Conclusions

• In-band noise a function of– phase-noise spectra– input signals– quantization noise spectrum (NTF)

• DT modeling method enables fast and accurate PN simulations• Verified with simulations and measurements• Conclusion

– PWN limits the performance in many practical situations.

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Page 13: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

SC-feedback reduces clock jitter sensitivity

CT ∆Σ modulator with SI RZ feedback CT ∆Σ modulator with SCR feedback

- High sensitivity to PW variations+ Small peak current

+ Low sensitivity to PW variations- Large peak current

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Page 14: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

SC-feedback with variable series resistor

Reset Constant current

Switched capacitor Reduced sensitivity to PW variations

Variable resistance Reduced peak current

Exponential discharge

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Page 15: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

PN Measurements – PN Amplitude Sweep

Sensitivity to systematic (single tone) phase-noise

IBN

[dB

FS]

30 dB IBN improvement

PW jitter, (σpw / Ts) [%]

@ fo / fs = 0.3

Total measured IBN

SI DAC PWN simulation

Total simulated IBN

SI DAC PWN simulation

PN tone amplitude sweep

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Page 16: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

Summary and Conclusions

• The SCSR feedback DAC concept is proposed– Reduced sensitivity to wideband phase-noise– Reduced peak feedback current

• ADC circuit fabricated– A 5-mW, 312-MHz, 2nd-order CT ∆Σ modulator with SCSR

feedback, 66dB SNR.– 30dB reduction of sensitivity to wideband clock PN measured

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Page 17: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

Work in Progress – Ping Lu (postdoc)

REF

PFD/TDCΣ

a

b

Tuning Bank

Controller

∑Δ Modulator

/N

Loop Filter

DCO

New Time-to-Digital Converter design

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Page 18: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

Work in Progress – Dejan Radjen (Ph.D student)

• Ultra low power 3rd order, 3 bits CT ∆Σ - ADC with modified feedback pulses

• Sampling frequency = 5MHz, Bandwidth = 125 kHz, SNDR = 74 dB, Power consumption = 100 μW

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Page 19: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

Work in Progress – Mattias Andersson (Ph.D student)

• CT ∆Σ ADC for LTE (short term goals)– 3rd order, fs=288MHz, BW=9MHz

• Protection• New clocking scheme• Multibit DACs and DEM

• Tapeout planned Q1 2010

DAC

H(s)vd[n]

va(t)

vc(t)

clk

clk

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Page 20: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

Journal Publications 2008/2009

S. Mattisson, H. Hagberg, P. Andreani, Sensitivity degradation in a tri-band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43, No. 2, pp. 486-489, 2008. A. Mazzanti, E. Sacchi, P. Andreani, F. Svelto, Analysis and design of a double-quadrature CMOS VCO for subharmonic mixing at Ka-band, IEEE Transactions on Microwave Theory and Techniques, Vol. 56, No. 2, pp. 355-363, 2008. L. Lu, Z. Tang, P. Andreani, A. Mazzanti, A. Hajimiri, Comments on "Comments on "A General Theory of Phase Noise in Electrical Oscillators””, IEEE Journal of Solid-State Circuits, Vol. 43, No. 9, pp. 2170-2170, 2008. A. Mazzanti, P. Andreani, Class-C Harmonic CMOS VCOs, With a General Result on Phase Noise, IEEE Journal of Solid-State Circuits, Vol. 43, No. 12, pp. 2716-2729, 2008. M. Anderson, L. Sundström, Design and Measurement of a CT Delta-Sigma ADC with Switched-Capacitor Switched-Resistor Feedback, IEEE Journal of Solid State Circuits, Vol. 44, No. 2, pp. 473-483, 2009. M. Anderson, L. Sundström, DT Modeling of Clock Phase Noise Effects in LP CT Delta-Sigma ADCs with RZ Feedback, IEEE Transactions on Circuits and Systems II: Express Briefs, Vol. 56, No. 7, pp. 530-534, 2009.

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Page 21: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

Conference Publications 2008/2009

P. Lu, H. Sjöland, A 5.4GHz 90-nm CMOS digitally controlled LC oscillator with 21% tuning range, 1.1MHz resolution, and 180dB FOM, Norchip, Tallinnn, 2008. J. Citakovic, P. F. Høvesten, G. Rocca, A. van Halteren, P. Rombach, L. J. Stenberg, P. Andreani, E. Bruun, A compact CMOS MEMS microphone with 66dB SNR, 2009 IEEE International Solid-State Circuits Conference (ISSCC), Digest of TechnicalPapers, San Francisco, Vol. 52, pp. 350-351, 2009. A. Mazzanti, P. Andreani, A 1.4mW 4.90-to-5.65GHz Class-C CMOS VCO with an Average FoM of 194.5dBc/Hz, 2008 IEEE International Solid-State Circuits Conference (ISSCC), Digest of Technical Papers, S. Francisco, CA, pp. 474-475, 629, Feb. 4-6, 2008.

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Page 22: Advances in mixicSensitivity degradation in a tri -band GSM BiCMOS direct-conversion receiver caused by transient substrate heating. IEEE Journal of Solid-State Circuits, Vol. 43,

Lund University - Department for Electrical and Information Technology

SCANDINAVIAN EXCELLENCEDEFINED IN LUND


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