Rev 5/02

Luna Technologies Luna Technologies 20032003

Rev 3/03

Luna Technologies, providers of Optical Luna Technologies, providers of Optical Vector Analysis, allowing you to do Vector Analysis, allowing you to do things never before available in opticsthings never before available in optics

XMT RX

Source

H()

Rev 3/03

About LunaAbout Luna• Founded - Summer 2000

• Focused on measurement instrumentation for fiber-optic components and subsystems

• World headquarters in

Blacksburg, VA

• Sales offices in Atlanta, Los Angeles, Canada, China, and Tokyo

• Completed “B” round of funding led by Columbia Capital - March 2003

Rev 3/03

Before the Luna OVA…nothing couldBefore the Luna OVA…nothing could• Use a measured linear transfer function to determine all

characteristics…future-proof

• Measure and display all-parameters simultaneously at a 4 hertz update rate

• Align optical devices to optimize all device parameters in seconds

• Cost-effectively manufacture tunable devices

• Measure devices with large dispersion

• Peer inside the device to determine the source of degraded specifications

Rev 3/03

Luna Technologies Products & ServicesLuna Technologies Products & Services

Optical Vector Analyzer (OVA) • All parameter test solution• Industry leading combination of speed and accuracy• CT - Component Test (30m)• ST - System Test (80m)• LP – Loss and PMD Analyzer

OFDR • Peer into the heart of your subsystems with 20 micron accuracy• Measure up to 200 ns of delay and 80 m of DUT length• 80 dB sensitivity

Optical Testing Services • Outsource your measurement needs to the experts at Luna, it’s . . . • Fast• Easy• Economical

Software Analysis Tool Set• Desktop Analysis Software• Coming Soon … Filter Characterization and Eye Diagram Analysis Software

Redefining the Economics of Optical TestRedefining the Economics of Optical Test

Rev 3/03

Luna’s Optical Vector Analyzers…Luna’s Optical Vector Analyzers…

• Test with one sweep across C and L bands:– IL, RL, GD, CD, PDL, DGD, Optical Phase, Time Domain

• Combine the power of an all-parameter analyzer with the functionality of an OTDR

• Decrease testing cycles by a factor of 20

• Reduce capital equipment cost

• Pay back period in months

The best choice for measurement and characterization of components and sub modules.

Rev 3/03

Fiber Optic Test Fiber Optic Test Product of the YearProduct of the Year

“Luna Technologies’ OVA is clearly the most innovative product in the optical test arena…scoring top points for speed of testing, ease of testing, price-to-performance ratio, resolution and accuracy, and scalability…it enables end-users to achieve lower development time and offers cost savings”

Award Recipient: Luna Technologies

Technology Award, 2002Technology Award, 2002

Rev 3/03

Luna’s Optical Vector Analyzers…Luna’s Optical Vector Analyzers…

“We would not have made it through these tough times without the OVA.”

OFS Fitel

“…the best thing to happen to optical measurements since I’ve been in the business.”

Lucent Bell Labs

“It would not be feasible to make our device without the speed of the OVA”

Accumux Technologies

Rev 3/03

H(t)

DUT

Bits go in Bits come out

DUT affects both the amplitude and phase of the transmitted data.

Single mode system example:Single mode system example:

Rev 3/03

Optical Vector AnalysisOptical Vector Analysis

HA B

C D

DUT is completely characterized by four independent complex functions. From H(), calculate IL, PDL, GD, CD, PMD, etc.

Rev 3/03

The Result is…The Result is…

– Breakthrough measurement speeds– Dramatically reduced costs– Rapidly determine the source of degraded

specifications– Completely characterize a device under

test – Maximized yields by tracking every stage

of the development process– Bin components to match design

performance

Rev 3/03

OVA Product HighlightsOVA Product Highlights• All Parameter Analysis - Obtain all

parameters in a single scan

• Exclusive Linear Transfer Function Measurement - The most complete measurement of your component available

• Industry Leading Accuracy - Fully specified measurements in < 15 seconds for 2.5 nm scan with high dynamic range and extreme accuracy

• Breakthrough Measurement Speeds - View all parameters in “Real Time” @ > 4 Hz update rate for 2.5 nm scan

Rev 3/03

Measure all parameters…Measure all parameters…

In less than 0.25 secondsIn less than 0.25 seconds

Rev 3/03

OVA Product HighlightsOVA Product Highlights• All Parameter Analysis - Obtain all

parameters in a single scan

• Exclusive Linear Transfer Function Measurement - The most complete measurement of your component available

• Industry Leading Accuracy - Fully specified measurements in < 15 seconds for 2.5 nm scan with high dynamic range and extreme accuracy

• Breakthrough Measurement Speeds - View all parameters in “Real Time” @ > 4 Hz update rate for 2.5 nm scan

Rev 3/03

Model data transmission with easeModel data transmission with ease

Measured H() Data

Simulated 10Gb/sNRZ Signal Spectrum

Rev 3/03

Tangible future benefits…2Tangible future benefits…2ndnd Order PMD Order PMD

100

80

60

40

20

0

-20

seco

nd O

rder

PM

D (

ps*p

s)

1548.31548.21548.11548.01547.91547.8

wavelength (nm)

-40

-30

-20

-10

0

Omega_Parallel Omega_Perpendicular

Rev 3/03

OVA Product HighlightsOVA Product Highlights• All Parameter Analysis - Obtain all

parameters in a single scan

• Exclusive Linear Transfer Function Measurement - The most complete measurement of your component available

• Industry Leading Accuracy - Fully specified measurements in < 15 seconds for 2.5 nm scan with high dynamic range and extreme accuracy

• Breakthrough Measurement Speeds - View all parameters in “Real Time” @ > 4 Hz update rate for 2.5 nm scan

Rev 3/03

Measurement Example - FBGMeasurement Example - FBG

Rev 3/03

OVA Product HighlightsOVA Product Highlights• All Parameter Analysis - Obtain all

parameters in a single scan

• Exclusive Linear Transfer Function Measurement - The most complete measurement of your component available

• Industry Leading Accuracy - Fully specified measurements in < 15 seconds for 2.5 nm scan with high dynamic range and extreme accuracy

• Breakthrough Measurement Speeds - View all parameters in “Real Time” @ > 4 Hz update rate for 2.5 nm scan

Rev 3/03

OVA Product HighlightsOVA Product Highlights

• Time Domain Filtering - “Look inside” devices with femtosecond resolution

• Desktop Analysis Software - Analyze stored data (No retesting!) at later time and location

• Test Long Devices - Test components up to 80 meters long

• Minimal Setup time - Full calibration takes ~ 1 minute for C + L bands