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Avalanche Photodiodes - OSI Optoelectronics

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53 400 500 600 700 800 900 1000 1100 50 40 30 20 10 0 Typical Spectral Response Resposivity (A/W) Wavelength (nm) Conditions: Gain=100, Ta=22 °C 0 50 100 150 200 1000 100 10 1 Typical Gain vs. Bias Voltage Gain Reverse Bias Voltage (V) Conditions: 850nm, 500nW, Ta=22 °C Avalanche Photodiodes Ultra High Gain Silicon Photodetectors n FEATURES • High Responsivity • High Bandwidth / Fast Response • Low Noise • Low Bias Voltage • Hermetically Sealed TO-Packages n APPLICATIONS • High Speed Optical Communications • Laser Range Finder • Bar Code Readers • Optical Remote Control • Medical Equipment • High Speed Photometry Silicon Avalanche Photodiodes make use of internal multiplication to achieve gain due to impact ionization. The result is the optimized series of high Responsivity devices, exhibiting excellent sensitivity. OSI Optoelectronics offers several sizes of detectors that are available with flat windows or ball lenses for optical fiber applications. Model Number Active Area Peak Responsivity Wavelength Responsivity (A/W) Dark Current (nA) Capacitance (pF) Rise Time (ns) Operating Bias Voltage Range (V) Temp. Range (˚C) Package Style ¶ Area (mm 2 ) Dimensions (mm) λp nm 850nm, G=100 G=100 1MHz G=100 850 nm G=100 50 Ω G=100 Operating Storage typ. typ. typ. typ. typ. Silicon Avalance Photodiodes APD-300 APD-300L* 0.07 0.3 φ 820 42 1.0 1.5 0.4 130-280 -40 ~ +70 -40 ~ +85 68 / TO-18 Flat Window 69 / TO-18 Ball Lens APD-500 APD-500L* 0.20 0.5 φ 1.8 2.5 0.5 APD-900 0.64 0.9 φ 2.5 7 1.0 70 / TO-5 APD-1500 1.8 1.5φ 7.0 12 2.0 70 / TO-5 APD-3000 7.1 3.0 φ 15 40 5.0 70 / TO-5 ¶ For mechanical drawings please refer to pages 58 thru 69.
Transcript
Page 1: Avalanche Photodiodes - OSI Optoelectronics

53

400 500600700 800900 1000 1100

50

40

30

20

10

0

Typical Spectral Response

Res

po

sivi

ty (A

/W)

Wavelength (nm)

Conditions: Gain=100, Ta=22 °C

0 50 100 150 200

1000

100

10

1

Typical Gain vs. Bias Voltage

Gai

n

Reverse Bias Voltage (V)

Conditions: 850nm, 500nW, Ta=22 °C

Avalanche PhotodiodesUltra High Gain Silicon Photodetectors

nFEATURES •HighResponsivity •HighBandwidth/Fast Response •LowNoise •LowBiasVoltage •HermeticallySealedTO-Packages

nAPPLICATIONS •HighSpeedOptical Communications •LaserRangeFinder •BarCodeReaders •OpticalRemoteControl •MedicalEquipment •HighSpeedPhotometry

Silicon Avalanche Photodiodes make use of internal multiplication

to achieve gain due to impact ionization. The result is the optimized

series of high Responsivity devices, exhibiting excellent sensitivity. OSI

Optoelectronics offers several sizes of detectors that are available with

flatwindowsorballlensesforopticalfiberapplications.

Model N

um

ber Active Area

Peak

Resp

onsi

vit

yW

avele

ngth

Responsivity(A/W)

Dark Current

(nA)

Capacitance(pF)

RiseTime(ns)

Operating Bias Voltage Range

(V)

Temp.Range(˚C)

PackageStyle ¶

Are

a (

mm

2)

Dim

ensi

ons

(mm

)

λpnm

850nm,G=100 G=100 1MHz

G=100

850 nmG=10050 Ω G=100

Opera

ting

Sto

rage

typ. typ. typ. typ. typ.

Silicon Avalance PhotodiodesAPD-300APD-300L* 0.07 0.3 φ

820 42

1.0 1.5 0.4130-2

80

-40 ~

+70

-40 ~

+85

68 / TO-18 FlatWindow

69 / TO-18Ball Lens

APD-500APD-500L* 0.20 0.5 φ 1.8 2.5 0.5

APD-900 0.64 0.9 φ 2.5 7 1.0 70 / TO-5

APD-1500 1.8 1.5φ 7.0 12 2.0 70 / TO-5

APD-3000 7.1 3.0 φ 15 40 5.0 70 / TO-5

¶Formechanicaldrawingspleaserefertopages58thru69.

Page 2: Avalanche Photodiodes - OSI Optoelectronics

For Further AssistancePlease Call One of Our Experienced

Sales and Applications Engineers

310-978-0516

- Or -On the Internet at

www.osioptoelectronics.com

57

1. Parameter Definitions: A = Distance from top of chip to top of glass. a = Photodiode Anode. B = Distance from top of glass to bottom of case. c = Photodiode Cathode (Note: cathode is common to case in metal package products unless otherwise noted).

W = Window Diameter. F.O.V. = Filed of View (see definition below).

2. Dimensions are in inches (1 inch = 25.4 mm).

3. Pin diameters are 0.018 ± 0.002" unless otherwise specified.

4. Tolerances (unless otherwise noted) General: 0.XX ±0.01" 0.XXX ±0.005" Chip Centering: ±0.010" Dimension ‘A’: ±0.015"

5. Windows All ‘UV’ Enhanced products are provided with QUARTZ glass windows, 0.027 ± 0.002" thick. All ‘XUV’ products are provided with removable windows. All ‘DLS’ PSD products are provided with A/R coated glass windows. All ‘FIL’ photoconductive and photovoltaic products are epoxy filled instead of glass windows.

Page 3: Avalanche Photodiodes - OSI Optoelectronics

69

Plastic71 TO-872 TO-873

Special74

ANODE

0.04

0.61

0.08

0.16MAX.

0.012 DIA.0.018 DIA.

CATHODE

0.12 DIA.

0.55 DIA.

0.22

0.28

0.200.05

RED DOTINDICATESCATHODE

LEAD

0.50 MIN.

0.11 NOM.

0.45 MIN.

0.039 DIA.

1.09 DIA.

0.018 DIA.

CATHODE &CASE

ANODE

0.44DIA.

0.08NOM.

0.82 DIA.WINDOW

1.25DIA.

0.75DIA.

0.60DIA.0.40

DIA.

0.55 DIA.

0.17

0.50 MIN.

0.018 DIA.

0.44DIA.

0.60DIA.

0.08NOM.

0.10TYP.

0.40

Q4

Q3

CATHODE &CASE

QUADRANTANODE 1

Q2 6 5 4

1 2 3

APD-900APD-1500APD-3000

CD-1705

OSD100-0AOSD100-5TA

OSD-60-0 QD50-0

TO-575

DLS-2S

A

A

C C

Pin Circle Dia.= 0.200Bottom View

0.360

0.325

0.240

0.0860.180

0.500

0.018

OS-P200

0.3550.345

0.59 MIN(4 PLCS)

OPTICAL

0.3050.295

0.205

0.1530.13

0.050

0.4200.4000.200

0.105

0.080

0.170

0.020

0.100

0.25

Plastic Molded76

CL

0.213 0.213

APD-300APD-500

APD-300LAPD-500L

0.185 0.185

0.059

0.1810.15

0.085

0.10

0.5 min.

0.079(W)

Mechanical SpecificationsAll units in inches. Pinouts are bottom view.


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