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DRAFT - NOT FOR PUBLICATION 14 July 2004 – ITRS Summer Conference
2004 ITRS Public ConferencePIDS ITWG
Emerging Research Devices
San Francisco, CAJuly 14, 2004
Jim Hutchby - SRC
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George Bourianoff Intel/SRC Joe Brewer U. Florida Toshiro Hiramoto Tokyo U. Jim HutchbySRC Mike Forshaw UC London Tsu-Jae King UC Berkeley Rainer Waser RWTH A In Yoo Samsung John Carruthers OGI Lothar RischInfineon Ming-Jinn Tsai ERSO/ITRI Wei-Tsun Shiau UMC Peter Zeitzoff ISMT
Makoto Yoshimi SOITEC Kristin De Meyer IMEC Tak Ning IBM Philip Wong IBM Luan Tran Micron Victor Zhirnov SRC/NCSU Simon Deleonibus LETI Thomas Skotnicki ST Me Yuegang Zhang Intel Kentaro Shibahara Hiroshima U. Byong Gook Park Seoul N. U. Fred Boeuf ST Me Dan Hammerstrom OGI
ITRS PIDS Emerging Research Devices Working Group
DRAFT - NOT FOR PUBLICATION 14 July 2004 – ITRS Summer Conference
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Charles Black IBM John Carruthers OGI Alex Demkov Freescale Mike Forshaw UCL Gerhard Klimeck Purdue Mike GarnerIntel Bruno Ghysiene SOITEC Jeff Grossman LLNL David Muller Cornell Dan Herr SRC Susan Holl Intel
Jim HutchbySRC Lalita Manchanda SRC/Agere Rafael Reif MIT Sadasivan Shankar Intel Shinichi Takagi U. Tokyo Eric Vogle NIST Kang Wang UCLA Rainer Waser Aachen U. In Yoo Samsung Victor Zhirnov SRC/NCSU
ITRS PIDS Emerging Research Materials Working Group
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Mike Forshaw UCL John Carruthers OGI George Bourianoff Intel/SRC Tobias Noll Aachen U.
Victor Zhirnov SRC/NCSU Dan Hammerstrom OGI Vwani Roychowdery UCLA
ITRS PIDS Emerging Research Architectures Working
Group
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Emerging Research DevicesIntroduction and Scope
Cast a broad net to introduce readers to new material, device and architecture concepts for information processing ---
Concept
Identify
Include
Stimulate
-- not hardened solutions
-- not endorse
-- and quantify
-- and assess/critique
Prioritize -- and define research needs(new)
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Requirements & Motivations for Information Processing Beyond CMOS
Fundamental Requirements Energy restorative functional process (e.g. gain) Compatible with CMOS At or above room temperature operation
Compelling Motivations Functionally scaleable > 100x beyond CMOS limit High information processing rate and throughput Minimum energy per functional operation Minimum, scaleable cost per function
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Emerging Research DevicesIntroduction and Scope
2004/2005
Broadened Scope Compared to 2003 Chapter ---
New quantitative performance metrics
In-depth critical assessment --- key application driven questions/issues
--- potential versus to-date performance
Knowledge requirements roadmap --- requirements-driven research needs (new)
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Non-classical CMOS
Emerging Research DevicesOrganization & Component Tasks (2003)
Emerging Research Devices
ResearchLogic and Memory
Devices
Functional Organization
(Architectures)
Transfer to PIDS/FEP in
2005
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Scope of Emerging Research Devices2003
back-gate
channel
isolation
buried oxide
channel
top-gate
Well doping
channelDepletion layer
isolation
halo
Bulk CMOS Double-Gate CMOS
Quantum cellular automataMolecular devices
Nanotubes
Emerging Information Processing Concepts
New Memory and LogicTechnologies
New ArchitectureTechnologies
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Device Transport-enhanced Devices
Ultra-thin Body Source/Drain Engineered Devices
Concept Strained Si, Ge, SiGe, SiCGe or still other semiconductor; on bulk or SOI
Fully depleted SOI with body thinner than 10 nm
Ultra-thin channel and localized ultra-thin BOX
Schottky source/drain
Non-overlapped SD extensions on bulk, SOI, or DG devices
Application/Driver
HP CMOS
HP, LOP, and LSTP CMOS
HP, LOP, and LSTP CMOS
HP CMOS
HP, LOP, and LSTP CMOS
Strained Si, Ge, SiGe
isolation
buried oxide
Silicon Substrate
BOX
Bulk wafer BOX (<20nm)
S D Ground Plane
FD Si film
Gate
Schottky barrierisolation
Silicon
silicideGate
nFET
pFET
Bias
Non-overlapped region
S D
Single Gate Non-classical CMOS
Transfer to PIDS/FEP in 2005
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Device Multiple Gate FET
N-Gate (N>2) FET
Double-gate FET
Concept Tied gates (number of channels >2)
Tied gates, side-wall conduction
Tied gates planar conduction
Independently switched gates, planar conduction
Vertical conduction
Application/Driver HP, LOP, and LSTP CMOS
HP, LOP, and LSTP CMOS
HP, LOP, and LSTP CMOS
LOP and LSTP CMOS
HP, LOP, and LSTP CMOS
Source Drain
Gate
Source Drain
Gate
Source Drain
Gate
STI
n+
Si-substrate
SOURCE
GATE
DRAIN
n+
STI
n+
Si-substrate
SOURCE
GATE
DRAIN
n+
Multiple Gate Non-classical CMOS
Transfer to PIDS/FEP in 2005
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Present Day Baseline Technologies
Phase Change Memory*
Floating Body DRAM
Nano-floating Gate
Memory**
Single/Few Electron Memories*
*
Insulator Resistance Change Memory**
Molecular Memories**
Storage Mechanism
Device Types
DRAM NOR Flash
OUM 1TDRAM eDRAM
Engineered tunnel barrier or nanocrystal
SET MIM oxides
Bi-stable switch Molecular NEMS
Availability 2004 2004 ~2006 ~2006 ~2006 >2007 ~2010 >2010
Cell Elements
1T1C 1T 1T1R 1T 1T 1T 1T1R 1T1R
Emerging Research Memory Devices
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Memory Device Technologies
Performance [A]
Architecture compatible
[B]*
Stability and reliability
[C]
CMOS compatible
[D]**
Operate temp
[E]***
Energy efficiency
[F]
Sensitivity parameter)
[G]
Scalability [H]
Floating Body DRAM
2.3/2.3 3.0/3.0 2.0/2.7 3.0/3.0 3.0/3.0 2.0/3.0 2.3/2.9 2.8/2.7
Phase Change Memory
2.6/2.9 2.2/3.0 2.3/2.2 2.2/3.0 3.0/3.0 1.8/2.7 2.1/2.1 2.7/2.2
Nano-floating Gate Memory
3.0/2.2 2.9/3.0 2.0/2.7 3.0/3.0 3.0/3.0 2.1/2.8 1.6/2.0 2.4/2.0
Insulator Resistance Change Memory
2.4/2.1 2.7/2.7 2.2/2.4 2.1/2.8 3.0/2.9 2.8/2.0 2.1/2.0 2.7/2.4
Molecular Memory
1.6/1.2 1.8/2.0 1.8/1.4 1.9/2.1 2.8/2.3 2.3/1.9 2.1/1.7 2.6/2.2
Single/Few Electron Memory
1.1/1.3 1.9/1.3 1.1/1.0 2.4/1.9 1.3/1.3 2.4/1.2 1.3/1.0 2.6/1.4
Technology Performance and Risk EvaluationEmerging Research Memory Devices
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Emerging Research Memory Devices
Present Day Baseline Technologies
Phase Change Memory*
Floating Body DRAM
Nano-floating Gate
Memory**
Single/Few Electron Memories*
*
Insulator Resistance Change Memory**
Molecular Memories**
Storage Mechanism
Device Types
DRAM NOR Flash
OUM 1TDRAM eDRAM
Engineered tunnel barrier or nanocrystal
SET MIM oxides
Bi-stable switch Molecular NEMS
Availability 2004 2004 ~2006 ~2006 ~2006 >2007 ~2010 >2010
Cell Elements
1T1C 1T 1T1R 1T 1T 1T 1T1R 1T1R
Move to PIDS/FEP in
2005
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Emerging Research Logic Devices
Device
FET RSFQ3-5 1D structures
Resonant Tunneling Devices
SET6 Molecular QCA7 Spin transistor
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Scaling Limit of Charge Based SwitchAn Example of Critical Assessment
Observations
Transistor critical dimension limited to ~ 1 nm (In the 2003 ITRS physical gate length = 7 nm for 2018)
Power density, not critical dimension, limits gate density to ~ 1 x 109 gates/cm2
For the ITRS density and switching time, CMOS is approaching the maximum power efficiency
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Logic Device Technologies
Performance [A]
Architecture compatible
[B]*
Stability and
reliability [C]
CMOS compatible
[D]**
Operate temp
[E]***
Energy efficiency
[F]
Sensitivity parameter)
[G]
Scalability [H]
1D Structures 2.3/2.2 2.2/2.9 1.9/1.2 2.3/2.4 2.9/2.9 2.6/2.1 2.6/2.1 2.3/1.6
RSFQ Devices
2.7/3.0 1.9/2.7 2.2/2.8 1.6/2.2 1.1/2.7 1.6/2.3 1.9/2.8 1.0/2.1
Resonant Tunneling Devices
2.6/2.0 2.1/2.2 2.0/1.4 2.3/2.2 2.2/2.4 2.4/2.1 1.4/1.4 2.0/2.0
Molecular Devices
1.7/1.3 1.8/1.4 1.6/1.4 2.0/1.6 2.3/2.4 2.6/1.3 2.0/1.4 2.6/1.3
Spin Transistor
2.2/1.7 1.7/1.6 1.7/1.7 1.9/1.4 1.6/2.0 2.3/2.1 1.4/1.7 2.0/1.4
SETs 1.1/1.2 1.7/1.2 1.3/1.1 2.1/1.4 1.2/1.8 2.6/2.0 1.0/1.0 2.1/1.7
QCA Devices 1.4/1.3 1.2/1.1 1.7/1.8 1.4/1.6 1.2/1.4 2.4/1.7 1.6/1.1 2.0/1.4
Technology Performance and Risk EvaluationEmerging Research Logic Devices
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Emerging Research DevicesOrganization & Component Tasks (2004/2005)
Emerging Research Devices
EmergingLogic and Memory
Devices
EmergingArchitectures
EmergingMaterials
Add to ERD in 2004
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Scope of Emerging Research Devices2005
Quantum cellular automataMolecular devices
Nanotubes
Emerging Information Processing Concepts
New Memory and LogicTechnologies
New ArchitectureTechnologies
New Materials
Model Knowledge
DRAFT - NOT FOR PUBLICATION 14 July 2004 – ITRS Summer Conference
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Emerging Research DevicesSummary
ERD transferring new potential solutions to PIDS/FEP
Non-Classical CMOS
Phase Change and Floating Body DRAM
Creating a new section on Emerging Research Materials
Enhancing technology evaluation and guiding activities
Quantitative critique of emerging technologies
New roadmap of scientific and technology information required to advance emerging information processing technologies