Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 1 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
SOURCE
1. DC VOLTAGE1 100 µV to 10mV 100 ppm to 5 ppm Using DC Ref. Std.,
Fluke 7004N, MFC 4808,
MFC Fluke 5720A,
Null Detector,
Ref. Divider, 80F15
10 mV to 10 V 5 ppm to 2 ppm
10 V to 1000V 2 ppm to 5ppm
1 kV to 8.63kV 0.40%
2. AC VOLTAGE1 10 Hz to 1 kHz.
1 mV to 10 mV
260ppm to 70ppm
Using TVC Holt 11,
Holt 12,
MFC Datron 4808,
Nanovoltmeter,
keithley 182, DMM 1281
10 mV to 1 V 80ppm to 25ppm
1V to 100 V 25ppm to 65ppm
40Hz to 1kHz
100 V to 1000 V
30ppm to 75ppm
1kHz to 100kHz
1mV to 10mV
260ppm to 70ppm
10mV to 1V 110ppm to 25ppm
1V to 100 V 25ppm to 240ppm
1kHz to 20 kHz
100V to 1000V
30ppm to 70ppm
100kHz to 1MHz
1mV to 10mV
260ppm to 1050ppm
10mV to 10V
120ppm to 530ppm
3. DC CURRENT1 10 µA to 100µA 250ppm to 40ppm Using MFC Datrn 4808
100 µA to 1 mA 40ppm to 20ppm Fluke 5720A, B1620
1 mA to 100 mA 20ppm Std. Resistor
100 mA to 1A 20ppm to 40ppm Tinsly 5685, 3111
1 A to 20 A 40ppm to 75ppm DMM 1281, 3458, 8508A,
5500,
Current Coil
20 A to 100 A 0.0075% to 0.052%
100 A to 1000 A 0.052% to 0.55%
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 2 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
4. AC CURRENT1 10Hz to 1 kHz
10 µA to 1 mA
325ppm to 65 ppm
Using AC Current shunt,
Holt HCS-1,
MFC Datron 4808,
Fluke 5520A,B1620,
Standard resistor Tin 5685A
AC Measurement std. Fluke
5790, Nanovoltmter,
Keithley 182,
5500 Curent coil
By Direct/ Substitution
Method
1mA to 10mA
65ppm
10Hz to 10 kHz
10mA to 1A
65ppm to 160ppm
1A to 10A
160ppm to 200ppm
10Hz to 5 kHz
10A to 20A
200ppm to 450ppm
50Hz
20 A to 1000 A
0.3% to 0.54%
5. DC RESISTANCE1 100 µΩ to 100mΩ 35ppm to 20ppm Using Stanard Resistor,
Tinsley 5685A/5685B, 5686,
Fluke 742A,
Guildline
9330/9334/6520/65206
By Comparison/ Direct
Method
100 mΩ to 1Ω 20 ppm to 2ppm
1Ω to 1kΩ 2ppm to 5ppm
1kΩ to 10kΩ 5ppm to 2ppm
10kΩ to 100kΩ 2ppm to 5ppm
100kΩ to 10MΩ 5ppm
10MΩ to 100MΩ 5ppm to 12ppm
100MΩ to 1GΩ 12ppm to 300ppm
1GΏ to 10GΏ 300ppm to 680ppm
10 GΏ to 1 TΏ 680ppm to 1300ppm
6. AC RESISTANCE1 1kHz
1 Ω to 10 kΩ
65 ppm to 60 ppm
Using Std. Res. 5685A,
HP 16074A
10kHz to 1 MHz
100Ω to 1 kΩ
0.16%
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 3 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
7. CAPACITANCE1 1kHz
1 pF to 100 pF
50 ppm to 5 ppm
Using Fused Silica Capacitor,
A&H 1100,
Std. Cap. GR 1409,
4T Cap. Std. 1417,
HP 16380
By Direct/ Comparison
Method
100 pF to 1nF 5 ppm to 60 ppm
1nF to 1 µF
60ppm to 150 ppm
100 Hz
1 µF to 100 mF
0.3% to 0.45%
100 kHz to 1MHz
10 pF to 1 µF
0.16%
8. INDUCTANCE1 1kHz
100 µH to 100 mH
0.23% to 0.012 %
Using Std. Self inductor
by Comparison Method 100 mH to 10 H
0.012 % to 0.032%
9. POWER FACTOR1 50 Hz
0.2 PF to 1 PF
0.025 deg
Using Power Energy
Calibrator Rotek 8000
By Direct Method
10. PHASE ANGLE
1 50 Hz
+/- 180 deg
0.025deg
Using Power Energy
Calibrator Rotek 8000
By Direct Method
11. AC POWER
1
1 Phase
50Hz
60 V to 240 V
Using Power Energy
Calibrator Rotek 8000-3P
By Direct Method @ UPF 100 mA to 50 A 0.05% to 0.06%
@ 0.8 pf (1.2W to 12 kW) 0.05% to 0.1%
@ 0.5 pf 0.06% to 0.11%
@ 0.2 pf
0.09% to 0.18%
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 4 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
12. AC POWER1
(Active) 3 PH
@ UPF
@ 0.8 pf
@ 0.5 pf
@ 0.2 pf
50Hz
60 V to 240 V
Using Power Energy
Calibrator Rotek 8000-3P
By Direct Method
100 mA to 50 A 0.09% to 0.10%
(3.6 W to 36 kW) 0.09% to 0.19%
0.10% to 0.18%
0.15% to 0.20%
13. AC POWER 1
(Reactive)
3 PH
50Hz
@ Sin Ø=0.2 60 V to 240 V 0.09% to 0.12% Using Power Energy
Calibrator Rotek 8000-3P
By Direct Method
@ SinØ=0.979 0.8 pf 100 mA to 50 A 0.15% to 0.20%
(3.6 VAR to 35.244 kVAR)
14. AC ENERGY ACTIVE1
1PH
UPF
50 Hz
60 V to 240 V
0.052% to 0.06%
Using P/E Calibrator, Rotek
8000-3P
By Direct Method 0.8 pf 100 mA to 50 A 0.062% to 0.10%
0.5 pf (0.6 W to 12 kW) 0.073% to 0.12%
0.2 pf
0.11% to 0.2%
15. AC ENERGY ACTIVE1
3 PH
50 Hz
UPF 60 V to 240 V 0.09% to 0.10% Using P/E Calibrator, Rotek
8000-3P
By Direct Method 0.8 pf 100 mA to 50 A 0.09% to 0.10%
0.5 pf (3.6 W to 36 kW) 0.10% to0.18%
0.2 pf
0.20% to 0.21%
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 5 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
16. AC ENERGY
REACTIVE1
3 Phase 50 Hz 60 V to 240 V
Using P/E Calibrator, Rotek
8000-3P sinØ= 0.200 100mA to 50A 0.09% to 0.12 %
sinØ= 0.979
3.6 VAR to 35.27 kVAR 0.18% to 0.21%
17. OSCILLOSCOPE3
(i) Amplitude DC 3 mV to 220V 1% to 0.04% Using Wavetek 9500
By Direct Method (Vertical axis Deflection
factor)
(1Mohm) (3mV to 220V)
DC 3mV to 5.5V 1% to 0.06%
(50 ohm)
(3mV to 5.5V)
1kHz
Square Wave
(6mV to 210 V) 0.55% to 0.07%
(1 Mohm) (6mV to 60V)
(6mV to 5.5V) 0.55% to 0.07%
(50 ohm)
(6mV to 5V)
(ii) Time base 450ps to 55sec 3 ppm
(Horizontal axis deflection
factor)
(iii) Bandwidth Upto 100MHz 2.50%
100MHz to 1GHz 2.5% to 5%
1GHz to 8GHz
5% to 11%
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 6 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
18. TEMPERATURE
SIMULATION1
(INDICATOR/
RECORDER/
CONTROLLER)
THERMOCOUPLE
K Type -200 ºC to 120ºC
120 ºC to 1350ºC
0.08 ºC to 0.06ºC
0.06 ºC to 0.11ºC
Using Multi function
calibrator
Datron 4808
By Electrical Simulation
Method
J Type -200ºC
-200 ºC to 760ºC
0.08ºC
0.06ºC
E Type -250ºC
-250 ºC to 1000ºC
0.11ºC
0.06ºC
T Type -250ºC
-250 ºC to 150ºC
-150 ºC to 400ºC
0.13ºC
0.07ºC
0.06ºC
N Type -200ºC
-200 ºC to 1300ºC
0.1ºC
0.07ºC
R Type 0 ºC
0 ºC to 1750ºC
0.15ºC
0.15 ºC to 0.10ºC
S Type 0ºC
0 ºC to 1750ºC
0.15ºC
0.13 ºC to 0.11ºC
B Type 600ºC
600 ºC to 1800ºC
0.14ºC
0.12 ºC to 0.10ºC
C Type 0ºC
150 ºC to 650ºC
650 ºC to 1800ºC
1800 ºC to 2300ºC
0.3ºC
0.26ºC
0.31 ºC to 0.5ºC
0.9ºC
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 7 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
L Type -200 ºC to -100ºC
-100 ºC to 800ºC
800 ºC to 900ºC
0.37ºC
0.26ºC
0.17ºC
U Type -200 ºC to 0ºC
0 ºC to 600ºC
0.56ºC
0.27ºC
RTD – Pt 385, 100 ohm -199ºC
-199 ºC to -80ºC
-80 ºC to 100ºC
100 ºC to 300ºC
300 ºC to 400ºC
400 ºC to 630ºC
630 ºC to 800ºC
0.001ºC
0.003ºC
0.005 ºC to 0.007ºC
0.012ºC
0.014ºC
0.019ºC
0.043ºC
Using Precision resistance
Make : Time electronics 1067
19. FREQUENCY1 1 Hz to 100 kHz 0.065ppm to 0.008ppm Using HP5071A, Agilent
33220A, Agilent E8257D
by Direct Method
100 kHz to 1 GHz 0.008ppm to 0.0002ppm
1 GHz to 26.5 GHz 0.00004ppm to 0.00006ppm
26.5 GHz to 40 GHz
0.00007ppm
20. RF POWER1 100kHz to 10 MHz
13 dBm to -20 dBm
2.2 % to 4.0 %
Using Agilent 33220A,
Agilent E8257D, CPM 20
with sensor 6912, Measuring
receiver with sensors 504 &
526 by Direct Method
(20mW to 10µW)
13 dBm to -30 dBm 4.0 % to 5.0 %
(20mW to 1µW)
10MHz to 18 GHz
-30 dBm to -90 dBm
4.2 % to 5.5 %
(1 µW to 1 pW)
21. RF ATTENUATION1 10 MHz to 18 GHz
1 dB to 60 dB
0.06 dB to 0.32 dB
Using 8300 step attenuator
Signal source E8257D
By Direct Method
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 8 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
22. DC VOLTAGE2 1 mV to 10 mV 650ppm to 75 ppm Using MFC dat 4808
By Direct Method 10 mV to 1000 V
75 ppm to 10 ppm
23. AC VOLTAGE2 50 Hz to 10 kHz
1 mV to 10 mV 0.66% to 0.075% Using MFC Dat 4808
By Direct Method 10 mV to 100 mV 0.075% to 0.02%
100 mV to 100 V 0.02% to 0.01%
100 V to 700 V
0.01% to 0.027%
10 kHz to 100 kHz
1 mV to 10 mV 0.66% to 0.12%
10 mV to 100 mV 0.10% to 0.05%
100 mV to 100 V
0.05% to 0.02%
10 kHz to 20 kHz
100 V to 700 V
0.02% to 0.03%
24. DC CURRENT2 100 µA to 100 mA 320ppm to 60 ppm Using MFC Dat 4808, Trans
cond. Amp., Fluke 9100,
Fluke coil 5500 By Direct
Method
100 mA to 2A 60 ppm to 200 ppm
2A to 20A 200 ppm to 970 ppm
20A to 100A 970 ppm to 0.44%
100A to 1000A
0.44% to 0.31%
25. AC CURRENT2 50 Hz to 1 kHz Using MFC Dat 4808, Trans.
Cond. Amp., Fluke 5220A,
Fluke coil 5500 By Direct
Method
10mA to 100 mA 0.09% to 0.027%
100 mA to 2A
0.031% to 0.051%
50Hz
2A to 20 A 0.051% to 0.29%
20A to 100 A 0.29% to 0.5%
100 A to 1000 A
0.5% to 0.45%
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 9 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
26. DC RESISTANCE2 1 mΩ to 100 mΩ 310ppm Using MFC Dat4808,
Standard Resistor, Tin 5685,
Vai 9409, OSAW, Welwyn,
Alma
100 mΩ to 100 kΩ 310ppm to 130 ppm
100 kΩ to 100 MΩ 130 ppm to 540 ppm
100 MΩ to 1 TΩ 540 ppm to 0.94%
27. AC RESISTANCE
2 1 kHz
1 Ω to 10 kΩ 210ppm to 480 ppm Using RL Standard HP 16074
series1
By Direct Method
28. CAPACITANCE2 1 kHz
1 pF to 1 µF
0.07% to 0.1 % Using Std. Capacitor
HP 16380,
GR 1417 100Hz
1 µF to 100µF
0.12% to 0.32%
29. INDUCTANCE2 1 kHz
100 µH to 10 H 0.37% to 0.12% Using Standard Inductor
GR 1482
By Direct Method
30. TEMPERATURE
SIMULATION2
(INDICATOR/
RECORDER/
CONTROLLER)
THERMOCOUPLE
K Type
-200 ºC to 120ºC
120 ºC to 1350ºC
0.21 ºC to 0.11ºC
0.11ºC to0.23ºC
Using Multi function
calibrator Fluke 5500A
By Electrical Simulation
Method J Type -200ºC to 150ºC
150 ºC to 1200ºC
0.16 ºC to 0.06ºC
0.06 ºC to 0.13ºC
E Type -250 ºC to 350ºC
350 ºC to 1000ºC
0.36 ºC to 0.06ºC
0.06 ºC to 0.1ºC
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 10 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
T Type -250 ºC to 0 ºC
0 ºC to 400ºC
0.48 ºC to 0.06ºC
0.08ºC
Using Multi function
calibrator Fluke 5500A
By Electrical Simulation
Method N Type -200 ºC to 25ºC
25 ºC to 1300ºC
0.32 ºC to 0.11ºC
0.11 ºC to 0.16ºC
S Type 0 ºC to 1400ºC
1400 ºC to 1750ºC
0.6 to 0.3ºC
0.3 to 0.42ºC
B Type 600 ºC to 800ºC
800 ºC to 1800ºC
0.52ºC to 0.31ºC
0.4ºC to 0.51ºC
RTD – Pt 385, 100 ohm -199 ºC to -80ºC
-80 ºC to 0ºC
0 ºC to 100ºC
100 ºC to 300ºC
300 ºC to 400ºC
400 ºC to 630ºC
630 ºC to 800ºC
0.036 ºC to 0.041ºC
0.041 ºC to 0.045ºC
0.045 ºC to 0.063ºC
0.063 ºC to 0.074ºC
0.074 ºC to 0.079ºC
0.079 ºC to 0.09ºC
0.09 ºC to 0.1ºC
Using Multi function
calibrator
Precision DRB time
electronics
31. FREQUENCY2 1Hz to 100kHz
0.9 ppm to 0.07 ppm Using Agilent 33220A,
SMR20
Agilent 53149A
by Direct Method
100kHz to 20 GHz
0.07 ppm to 0.02 ppm
32. RF POWER2 100kHz to10 MHz
13 dBm to -20 dB m
2.5 % to 4.0 %
Using Agilent 33220A,
SMR 20, Agilent 53149A with
sensors 8482A, 8487A &
8487D
by Direct Method
(20mW to 10µW)
50MHz to 18GHz
13 dBm to -60 dB m
4.0 % to 5.5 %
(20mW to 1nW)
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 11 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
33. RF ATTENUATION2 50 MHz to 2.7GHz
1 dB to 50dB
0.12 dB to 0.20 dB
Using Step Attenuator (DPSP)
SMR 20 by Direct Method
MEASURE
34. DC VOLTAGE1 10µV to 100uV 0.25% to 250 ppm Using DC Ref. Std.
Fluke 7000N, Ref. Divider,
Fluke 752,MFC Datron 4808,
Fluke Det HV 80F15,34401A
By Direct/Comparison
Method
100 µV to 1 mV 250 ppm to 25 ppm
1 mV to 10 mV 25 ppm to 5 ppm
10 mV to 100 mV 5 ppm to 3 ppm
100 mV to 1000 V 3 ppm to 2 ppm
1 kV to 8.63 kV
0.4%
35. AC VOLTAGE1 10 Hz to 1 kHz
1mV to 10 mV
550ppm to 91ppm
Using TVC Holt 11
10mV to 1V 80ppm to 25ppm
1V to 100 V
25ppm
Using AC Voltage meas.,
Standard Fluke 5790A, MFC
Datron 4808, Keithley
Nanovoltmeter 182
By Substitution/ Indirect
Method
40 Hz to 1 kHz
100V to 1000 V
25ppm to 65ppm
1 kHz to 100 kHz
1mV to 10mV
560ppm to 150ppm
10mV to 1V 80ppm to 25ppm
1V to 100 V
20ppm to 25ppm
1kHz to 20 kHz
100V to 1000V
25ppm to 65ppm
100 kHz to 1 MHz
1mV to 10mV
560 ppm to 0.54%
10mV to 100mV 150ppm to 0.15%
100mV to 10V 260ppm to 60 ppm
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 12 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
50 Hz
1 kV to 10kV
1.30%
Using Voltage Divider, Tek
P6015, F80k40
10 kV to 25kV 3.4%
36. DC CURRENT
1 100nA to 10µA 80ppm to 15ppm Using Std. Resistor, Tinsley
5686,3111, L&N, Fluke 742,
MFC Dat 4808, Fluke
5720,5520A,
Ballantin1620A,34401A
by Direct/ Indirect Method
10 µA to 100 µA 15 ppm to 10 ppm
100 µA to 100 mA 10 ppm
100 mA to 1A 10 ppm to 12 ppm
1 A to 10 A 12 ppm to 22 ppm
10 A to 100 A 22 ppm to 80 ppm
37. AC CURRENT1 10 Hz to 1 kHz
10µA to 1mA
240 ppm to 35 ppm
Using AC Current shunt Holt
HCS- 1, Std. Res. 5685B,
AC Meas. Std. Fluke 5790A,
MFC Dat 4808, Fluke 5220A,
Keithley 182
By Indirect/ Substitution
Method
1mA to 10 mA
35ppm to 95 ppm
10Hz to 10 kHz
10 mA to 1 A
35ppm to 90ppm
1 A to 10 A
90ppm to 130ppm
10Hz to 5 kHz
10A to 20A
130ppm to 420ppm
38. DC RESISTANCE1 10 µΩ to 100mΩ 30ppm to 12ppm DCC Bridge, Guidline 6622A,
Std Resistor Tinsley, 5686A,
L&N Fluke 742 Series, Tera
Ohmmeter Guildline 6520
By Direct/ Comparison
Method
100 mΩ to 1 Ω 12ppm to 2ppm
1Ω to 100Ω 2ppm
100Ω to 1MΩ 2ppm to 3ppm
1MΩ to 100 MΩ 3ppm to 7ppm
100MΩ to 1 GΩ 7ppm to 240ppm
1 GΩ to 1 TΩ 240ppm to 1110ppm
39. AC RESISTANCE1 1kHz
1 Ω to 10 kΩ
65 ppm to 60 ppm
Using Std. Res. Tin 5685A &B
RLC Digi bridge
Quad 1693
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 13 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
40. INDUCTANCE1 1kHz
100uH to 100mH
0.23% to 0.012%
Using Std. Self inductor
Tin4190, Std. Inductor GR
1482,
RLC Bridge Quad 1693 by
Comparison Method
100mH to 10 H 0.012% to 0.032%
41. CAPACITANCE1 1kHz
1pF to 10 pF
16 ppm to 5 ppm
Using Fused Silica Capacitor,
A&H 1100, Std. Capacitor,
GR 1409, Cap. Meas. System
GR 1621, RLC Bridge Quad
1693
by Direct/ Comparison
Method
10 pF to 100 pF
100pF to 1nF
1nF to 1 µF
5 ppm
5ppm to 15ppm
15 ppm to 150 ppm
100Hz
1 µF to 1 mF 0.05% to 0.45%
1mF to 10 mF
0.45% to 0.82%
42. AC POWER ACTIVE1
1phase
0.2 PF to UPF
50 Hz
60V to 240V
10mA to 50A
(0.6W to 12 kW)
1 phase
230ppm to 250 ppm
Using Watt converter
Rotek MSB 001A
By Direct Method
43. AC POWER ACTIVE 1
3 Ph
UPF
0.8 PF
0.5PF
0.2 PF
50Hz
60V to 240V
100mA to 50A
(3.6W to 36 kW)
3 phase
0.2 PF to UPF
0.11% to 0.12%
0.12% to 0.14%
0.13% to 0.21%
0.19% to 0.26%
Using Rotek 8000 &
PM 6000
By Direct Method
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 14 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
44. POWER FACTOR1 50 Hz
0.2pf to 1pf
180 ppm
Using Rotek 8000
45. TIME INTERVAL1 100ms to 10,000 sec 1 ppm Using PM 6665,F6680B
By Direct Method
46. PHASE ANGLE
1 50 Hz
+/- 180 deg
0.06 deg
Using Clark Hess
By Direct Method
47. TEMPERATURE
SIMULATION1
(INDICATOR/
RECORDER/
CONTROLLER)
THERMOCOUPLE
K Type
-200ºC
-200 ºC to 120ºC
120 ºC to 1000ºC
1000 ºC to 1350ºC
0.0166ºC
0.008 ºC to 0.006ºC
0.019ºC
0.027ºC
Using DMM Datron 1281
By Electrical Simulation
Method
J Type -200ºC
-200 ºC to 150ºC
150 ºC to 760ºC
760 ºC to 1200ºC
0.013ºC
0.006 ºC to 0.005 ºC
0.012ºC
0.020ºC
E Type -250ºC
-250 ºC to 350ºC
350 ºC to 650ºC
650 ºC to 1000ºC
0.035 ºC
0.006 ºC to 0.007ºC
0.011 ºC
0.016ºC
T Type -250 ºC
-250 ºC to -150ºC
-150 ºC to 400ºC
0.038 ºC
0.011 ºC
0.004 ºC to 0.007ºC
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 15 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
N Type -200ºC
-200 ºC to -100 ºC
-100 ºC to 410ºC
410 ºC to 1300ºC
0.024ºC
0.011ºC
0.008 ºC to 0.01 ºC
0.023 ºC
Using DMM Datron 1281
By Electrical Simulation
Method
R Type 0ºC
0 ºC to 1750ºC
0.02ºC
0.034 ºC to 0.035ºC
S Type 0ºC
0 ºC to 1750ºC
0.02ºC
0.034 ºC to 0.043ºC
B Type 600 ºC to 1800ºC 0.04ºC
C Type 0ºC to 150ºC
150 ºC to 650ºC
650 ºC to 1800ºC
1800 ºC to 2300ºC
0.3ºC
0.26ºC
0.13 ºC to 0.5ºC
0.9ºC
L Type -200 ºC to -100ºC
-100 ºC to 800ºC
800 ºC to 900ºC
0.37ºC
0.26ºC
0.17ºC
U Type -200 ºC to 0ºC
0 ºC to 600ºC
0.56ºC
0.27ºC
RTD – Pt 385, 100 ohm -199ºC
-199 ºC to -80ºC
-80 ºC to 0ºC
0 ºC to 100ºC
100 ºC to 300ºC
300 ºC to 400ºC
400 ºC to 630ºC
630 ºC to 800ºC
0.001ºC
0.005ºC
0.007ºC
0.010ºC
0.017ºC
0.020ºC
0.028ºC
0.036ºC
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 16 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
48. FREQUENCY1 1 Hz to 100 kHz
0.065 ppm to 0.008 ppm Using HP5071A, Fluke
PM6680B, Measuring
Receiver (N5530S), Agilent
53149A by Direct Method 100 kHz to 1 GHz
0.008 ppm to 0.0002 ppm
1 GHz to 26.5 GHz
0.00004 ppm to 0.00006 ppm
26.5 GHz to 40 GHz
0.00007 ppm
49. RF POWER1 100 kHz to 10 MHz
13 dBm to -20 dB m
1.9 % to 2.3 %
Using CPM 20 with sensor
6912 by Direct Method (20mW to 10uW)
10MHz to 18 GHz
13 dBm to -30 dB m
4.0 % to 5.0 %
Using Measuring receiver
with sensor 504 & 526
by Direct Method (20mW to 1µW)
-30dBm to - 90 dBm 4.2 % to 5.5 %
(1 µw to 1 pW)
50. RF ATTENUATION1
10MHz to 18 GHz
1 dB to 60 dB
0.06 dB to 0.42 dB
Using VM7 attenuator &
Signal calibrator, 8852 Freq
Converter Measuring receiver
(N5530S) Signal source
E8257D by Direct Method
51. MODULATION
1
Amplitude Modulation Carrier Frequency: Using Measuring Receiver
(N5530S)
by Direct Method 100 MHz to 1GHz
Modulation Rate
1kHz
Modulation Depth
10% to 90%
1.6 % to 3.2 %
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 17 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
Frequency Modulation Carrier Frequency: Using Measuring Receiver
(N5530S)
By Direct Method 100MHz to 1GHz
Modulation Rate
1kHz
Frequency Deviation :
</=200kHz
2.8%
52. TOTAL HARMONIC
DISTORTION1
(THD)
10 kHz to 150 kHz
@1Vpp 50ohms
5.6 % to 10.5 %
Using Agilent Spectrum
Analyzer (E4440A)
By Indirect Method
53. REFLECTION
COFFICIENT1
10 MHz to 18 GHz
Rho 0.020 to 0.33
Linear Units (L.U)
0.012 to 0.04 L.U
Using Vector Network
Analyzer (ZVK) with cal kit
(VSWR 1.05 to 2.0)
By Direct Method
54. DC VOLTAGE2 1mV to 100 mV 0.44% to 0.01% Using DMM 34401A, HV
Probe 80F15
By Direct Method 100 mV to 10 V 0.01% to 0.005%
10V to 1000 V 0.005% to 0.0065%
1 kV to 10 kV
0.40%
55. AC VOLTAGE2 50 Hz to 10 kHz
100 mV to 700 V
0.12%
Using DMM 34401A, HV
Probe P6015 & Fluke 80K40
By Direct Method
50 Hz
700 V to 10 kV
0.12% to 1.3%
10 kV to 25 kV
3.5%
56. DC CURRENT
2 100 µA to 100 mA 0.45% to 0.08% Using DMM 34401A
By Direct Method
100 mA to 1A
0.08% to 0.12%
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 18 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
57. AC CURRENT2 50 Hz to 1 kHz
1 A to 20A
0.17% to 0.72%
Using DMM 34401A
GDM 8246
By Direct Method
1mA to 3A
0.77% to 0.25%
58. DC RESISTANCE2 10 Ω to 1 kΩ 0.063% to 0.017% Using DMM 34401A
By Direct Method 1 kΩ to 100 k Ω 0.017%
100 kΩ to 100 M Ω
0.017% to 0.95%
59. TEMPERATURE
SIMULATION2
(INDICATOR/
RECORDER/
CONTROLLER)
THERMOCOUPLE
K Type
-200 ºC to 25ºC
25 ºC to 1350ºC
0.24 ºC to 0.09ºC
0.09 ºC to 0.19ºC
Using DMM Aglient 34401A
By Electrical Simulation
Method
J Type -200 ºC to 25ºC
25 ºC to 1200ºC
0.18 ºC to 0.07ºC
0.07 ºC to 0.13ºC
E Type -250 ºC to 25ºC
25 ºC to 1000ºC
0.4 ºC to 0.06ºC
0.06 ºC to 0.1ºC
T Type -250 ºC to 0ºC
0 ºC to 400ºC
0.55 ºC to 0.08ºC
0.08ºC
N Type -200 ºC to 25ºC
25 ºC to 1300ºC
0.37 ºC to 0.14ºC
0.14 ºC to 0.17ºC
R Type 0 ºC to 1000ºC
1000 ºC to 1750ºC
0.35 ºC to 0.31ºC
0.31 ºC to 0.35ºC
Laboratory Electronics Test & Development Centre, STQC Directorate, 100 Feet Road, Peenya Industrial Area, Bangalore
Accreditation Standard ISO/IEC 17025:2005
Discipline Electro-Technical Calibration
Issue Date 17.09.2012
Certificate Number C-0022
Valid Until 16.09.2014
Last Amended on
-
Page 19 of 19
Quantity Measured/ Instrument
Range / Frequency *Calibration Measurement
Capability ()
Remarks
S Type 0 to 25ºC
25 ºC to 1400ºC
1400 ºC to 1750ºC
0.04 ºC to 0.6ºC
0.6 ºC to 0.33ºC
0.33 ºC to 0.45ºC
Using DMM Aglient 34401A
By Electrical Simulation
Method
B Type 600 ºC to 800ºC
800 ºC to 1800ºC
0.6 ºC to 0.46ºC
0.46 ºC to 0.38ºC
RTD – Pt 385, 100 ohm -199 ºC to -80ºC
-80 ºC to 0ºC
0 ºC to 100ºC
100 ºC to 300ºC
300 ºC to 400ºC
400 ºC to 630ºC
0.014 ºC to 0.026ºC
0.026 ºC to 0.036ºC
0.036 ºC to 0.047ºC
0.047 ºC to 0.064ºC
0.064 ºC to 0.076ºC
0.076 ºC to 0.11ºC
0.11 ºC to 0.14ºC
60. FREQUENCY2 1Hz to 100kHz 0.9ppm to 0.07ppm Using Fluke PM 6680B
Aglilent 53149A
By Direct Method
100kHz to 20 GHz
0.07 ppm to 0.02 ppm
61. RF POWER2 100 kHz to 10 MHz
13 dBm to -20 dB m
2.5 % to 4.0%
Using Agilent 53149A with
sensors 8482A, 8487A &
8487D
By Direct Method
(20mW to 10uW)
50 MHz to 18 GHz
13 dBm to -60 dB m
4.0 % to 5.5 %
(20mW to 1nW)
62. RF ATTENUATION2 50MHz to 2.7 GHz
1 dB to 50 dB
0.12 dB to 0.30 dB
Using Agilent 53149A with
8487D Signal generator
SMR-20 by Direct Method
* Measurement Capability is expressed as an uncertainty () at a confidence probability of 95%
1 Only in Permanent Laboratory
2 Only for Site Calibration
3 The laboratory is also capable for site calibration however, the uncertainty at site depends on the prevailing actual
environmental conditions and master equipment used.